JPH0283477U - - Google Patents
Info
- Publication number
- JPH0283477U JPH0283477U JP16410388U JP16410388U JPH0283477U JP H0283477 U JPH0283477 U JP H0283477U JP 16410388 U JP16410388 U JP 16410388U JP 16410388 U JP16410388 U JP 16410388U JP H0283477 U JPH0283477 U JP H0283477U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- circuit board
- printed circuit
- probe
- prober
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
第1図は本考案の原理説明図、第2図は本考案
による一実施例の説明図で、aは斜視図、bはプ
ローバの側面図、第3図は従来の説明図で、aは
斜視図、bはプローバの斜視図、cはプローブピ
ンの当接を示す要部側面を示す。
図に示すように、1は移動機構、2は保持部材
、3は支持台、4はプリント基板、5は電子部品
、6は第1の突出機構、7は多ピンプローバ、8
は1ピンプローバ、9は第2の突出機構、10は
プローブピン、4Aはパツドを示す。
Fig. 1 is an explanatory diagram of the principle of the present invention, Fig. 2 is an explanatory diagram of an embodiment according to the present invention, a is a perspective view, b is a side view of the prober, and Fig. 3 is an explanatory diagram of the conventional method. A perspective view, b is a perspective view of the prober, and c is a side view of the main part showing contact of the probe pin. As shown in the figure, 1 is a moving mechanism, 2 is a holding member, 3 is a support stand, 4 is a printed circuit board, 5 is an electronic component, 6 is a first protrusion mechanism, 7 is a multi-pin prober, 8
1 indicates a 1-pin prober, 9 indicates a second protrusion mechanism, 10 indicates a probe pin, and 4A indicates a pad.
Claims (1)
に支持する支持台3と、該プリント基板4の実装
面に配設され、保持部材2をX―Y―Z方向に移
動する移動機構1と、該保持部材2によつて保持
されるプローブピン10とを備え、該プローブピ
ン10が該プリント基板4の所定パツド4Aに当
接され、該プローブピン10を介して該プリント
基板4の電気特性を検出するプロービイング装置
において、 第1の突出機構6によつて突出されるよう前記
プローブピン10の複数個が配列された多ピンプ
ローバ7と、第2の突出機構9によつて突出され
るよう該プローブピン10の一つが配列された1
ピンプローバ8とが前記保持部材2に併設されて
成ることを特徴とするプロービイング装置。[Claims for Utility Model Registration] A support stand 3 that vertically supports a printed circuit board 4 on which an electronic component 5 is mounted; The probe pin 10 is brought into contact with a predetermined pad 4A of the printed circuit board 4, and the probe pin 10 is moved through the probe pin 10. The probing device for detecting the electrical characteristics of the printed circuit board 4 includes a multi-pin prober 7 in which a plurality of probe pins 10 are arranged so as to be protruded by a first protrusion mechanism 6, and a second protrusion mechanism 9. one of the probe pins 10 is arranged so as to be protruded by the 1
A probing device characterized in that a pin prober 8 is attached to the holding member 2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16410388U JPH0731185Y2 (en) | 1988-12-19 | 1988-12-19 | Probing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16410388U JPH0731185Y2 (en) | 1988-12-19 | 1988-12-19 | Probing device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0283477U true JPH0283477U (en) | 1990-06-28 |
JPH0731185Y2 JPH0731185Y2 (en) | 1995-07-19 |
Family
ID=31449418
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16410388U Expired - Lifetime JPH0731185Y2 (en) | 1988-12-19 | 1988-12-19 | Probing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0731185Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011058908A (en) * | 2009-09-09 | 2011-03-24 | Hioki Ee Corp | Method and device for probing of contact probe |
CN115608718A (en) * | 2022-11-07 | 2023-01-17 | 宁波晶创科技有限公司 | Wafer electric cleaning device |
-
1988
- 1988-12-19 JP JP16410388U patent/JPH0731185Y2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011058908A (en) * | 2009-09-09 | 2011-03-24 | Hioki Ee Corp | Method and device for probing of contact probe |
CN115608718A (en) * | 2022-11-07 | 2023-01-17 | 宁波晶创科技有限公司 | Wafer electric cleaning device |
CN115608718B (en) * | 2022-11-07 | 2023-11-24 | 宁波晶创科技有限公司 | Electric wafer cleaning device |
Also Published As
Publication number | Publication date |
---|---|
JPH0731185Y2 (en) | 1995-07-19 |
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