JPH0283477U - - Google Patents

Info

Publication number
JPH0283477U
JPH0283477U JP16410388U JP16410388U JPH0283477U JP H0283477 U JPH0283477 U JP H0283477U JP 16410388 U JP16410388 U JP 16410388U JP 16410388 U JP16410388 U JP 16410388U JP H0283477 U JPH0283477 U JP H0283477U
Authority
JP
Japan
Prior art keywords
pin
circuit board
printed circuit
probe
prober
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16410388U
Other languages
Japanese (ja)
Other versions
JPH0731185Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16410388U priority Critical patent/JPH0731185Y2/en
Publication of JPH0283477U publication Critical patent/JPH0283477U/ja
Application granted granted Critical
Publication of JPH0731185Y2 publication Critical patent/JPH0731185Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本考案の原理説明図、第２図は本考案
による一実施例の説明図で、ａは斜視図、ｂはプ
ローバの側面図、第３図は従来の説明図で、ａは
斜視図、ｂはプローバの斜視図、ｃはプローブピ
ンの当接を示す要部側面を示す。 図に示すように、１は移動機構、２は保持部材
、３は支持台、４はプリント基板、５は電子部品
、６は第１の突出機構、７は多ピンプローバ、８
は１ピンプローバ、９は第２の突出機構、１０は
プローブピン、４Ａはパツドを示す。 Fig. 1 is an explanatory diagram of the principle of the present invention, Fig. 2 is an explanatory diagram of an embodiment according to the present invention, a is a perspective view, b is a side view of the prober, and Fig. 3 is an explanatory diagram of the conventional method. A perspective view, b is a perspective view of the prober, and c is a side view of the main part showing contact of the probe pin. As shown in the figure, 1 is a moving mechanism, 2 is a holding member, 3 is a support stand, 4 is a printed circuit board, 5 is an electronic component, 6 is a first protrusion mechanism, 7 is a multi-pin prober, 8
1 indicates a 1-pin prober, 9 indicates a second protrusion mechanism, 10 indicates a probe pin, and 4A indicates a pad.

Claims (1)

【実用新案登録請求の範囲】 電子部品５が実装されたプリント基板４を垂直
に支持する支持台３と、該プリント基板４の実装
面に配設され、保持部材２をＸ―Ｙ―Ｚ方向に移
動する移動機構１と、該保持部材２によつて保持
されるプローブピン１０とを備え、該プローブピ
ン１０が該プリント基板４の所定パツド４Ａに当
接され、該プローブピン１０を介して該プリント
基板４の電気特性を検出するプロービイング装置
において、 第１の突出機構６によつて突出されるよう前記
プローブピン１０の複数個が配列された多ピンプ
ローバ７と、第２の突出機構９によつて突出され
るよう該プローブピン１０の一つが配列された１
ピンプローバ８とが前記保持部材２に併設されて
成ることを特徴とするプロービイング装置。[Claims for Utility Model Registration] A support stand 3 that vertically supports a printed circuit board 4 on which an electronic component 5 is mounted; The probe pin 10 is brought into contact with a predetermined pad 4A of the printed circuit board 4, and the probe pin 10 is moved through the probe pin 10. The probing device for detecting the electrical characteristics of the printed circuit board 4 includes a multi-pin prober 7 in which a plurality of probe pins 10 are arranged so as to be protruded by a first protrusion mechanism 6, and a second protrusion mechanism 9. one of the probe pins 10 is arranged so as to be protruded by the 1
A probing device characterized in that a pin prober 8 is attached to the holding member 2.
JP16410388U 1988-12-19 1988-12-19 Probing device Expired - Lifetime JPH0731185Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16410388U JPH0731185Y2 (en) 1988-12-19 1988-12-19 Probing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16410388U JPH0731185Y2 (en) 1988-12-19 1988-12-19 Probing device

Publications (2)

Publication Number Publication Date
JPH0283477U true JPH0283477U (en) 1990-06-28
JPH0731185Y2 JPH0731185Y2 (en) 1995-07-19

Family

ID=31449418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16410388U Expired - Lifetime JPH0731185Y2 (en) 1988-12-19 1988-12-19 Probing device

Country Status (1)

Country Link
JP (1) JPH0731185Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011058908A (en) * 2009-09-09 2011-03-24 Hioki Ee Corp Method and device for probing of contact probe
CN115608718A (en) * 2022-11-07 2023-01-17 宁波晶创科技有限公司 Wafer electric cleaning device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011058908A (en) * 2009-09-09 2011-03-24 Hioki Ee Corp Method and device for probing of contact probe
CN115608718A (en) * 2022-11-07 2023-01-17 宁波晶创科技有限公司 Wafer electric cleaning device
CN115608718B (en) * 2022-11-07 2023-11-24 宁波晶创科技有限公司 Electric wafer cleaning device

Also Published As

Publication number Publication date
JPH0731185Y2 (en) 1995-07-19

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