JPS6194781U - - Google Patents
Info
- Publication number
- JPS6194781U JPS6194781U JP17984084U JP17984084U JPS6194781U JP S6194781 U JPS6194781 U JP S6194781U JP 17984084 U JP17984084 U JP 17984084U JP 17984084 U JP17984084 U JP 17984084U JP S6194781 U JPS6194781 U JP S6194781U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- probe
- holding plate
- support device
- rear end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 16
- 238000007689 inspection Methods 0.000 claims description 5
- 238000005476 soldering Methods 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図は本考案の一実施例を示す要部平面図、
第2図はプローブユニツトの構成を示す部分縦断
面図、第3図は検査装置の全体構成を示す概略斜
視図、第4図は第2図の底面図、第5図は接続装
置を下面側から見た部分拡大図、第6図は第5図
の−線断面図、第7図ないし第10図は本考
案の他の異なる実施例をそれぞれ示す説明図であ
る。
1…プロブユニツト、3…上支持板、4…下支
持板、5…上部支持ボード、6…下部支持ボード
、7…ユニツト支柱、11…コンタクトプローブ
、12,32,42…接続装置、13…コード、
14,34…保持板、15…プローブ接触部、1
6,36…はんだ付け部、17,37…導電片、
35…通孔、38…端子チツプ、38a…凹部。
FIG. 1 is a plan view of essential parts showing an embodiment of the present invention;
Figure 2 is a partial vertical sectional view showing the configuration of the probe unit, Figure 3 is a schematic perspective view showing the overall configuration of the inspection device, Figure 4 is a bottom view of Figure 2, and Figure 5 shows the connection device on the bottom side. FIG. 6 is a cross-sectional view taken along the line -- in FIG. 5, and FIGS. 7 to 10 are explanatory views showing other different embodiments of the present invention. DESCRIPTION OF SYMBOLS 1...Probe unit, 3...Upper support plate, 4...Lower support plate, 5...Upper support board, 6...Lower support board, 7...Unit support column, 11...Contact probe, 12, 32, 42...Connection device, 13...Cord ,
14, 34... Holding plate, 15... Probe contact portion, 1
6, 36... Soldering part, 17, 37... Conductive piece,
35... Through hole, 38... Terminal chip, 38a... Recessed portion.
Claims (1)
タクトプローブを支持する支持装置と、この支持
装置を検査すべき回路基板に対向して移動させる
装置と、各コンタクトプローブ基端を、測定検査
器に連なるコードに接続する接続手段とからなり
、前記支持装置の回路基板に対する相対移動によ
り各コンタクトプローブの先端を回路基板の検査
点に接触させて導通状態の測定検査を行なう検査
装置であつて、前記接続手段が、支持装置の背後
に位置し各コンタクトプローブに対応する位置に
接触によりコンタクトプローブの後端と電気的に
接続されるプローブ接触部を有する保持板と、こ
の保持板に設けられ前記コートがはんだ付けされ
るはんだ付け部と、保持板に配置され前記プロー
ブ接触部とこれに対応するはんだ付け部とを相互
に接続する導電片とを備えていることを特徴とす
る回路基板等の検査装置。 (2) プローブ接触部が、コンタクトプローブの
後端部が圧入または圧接される導電性通孔である
実用新案登録請求の範囲第1項記載の回路基板等
の検査装置。 (3) プローブ接触部が、保持板に貫通配置され
先端がコンタクトプローブの後端部に接触する端
子チツプである実用新案登録請求の範囲第1項記
載の回路基板等の検査装置。[Claims for Utility Model Registration] (1) A large number of pin-shaped contact probes, a support device for supporting the contact probes, a device for moving this support device toward a circuit board to be inspected, and each contact probe base. and a connecting means for connecting the end to a cord connected to a measurement/testing device, and conduction measurement/testing is performed by bringing the tip of each contact probe into contact with a test point on the circuit board by moving the support device relative to the circuit board. In the inspection device, the connecting means includes a holding plate having a probe contact portion located behind the support device and electrically connected to the rear end of the contact probe at a position corresponding to each contact probe; It is characterized by comprising a soldering part provided on the holding plate to which the coat is soldered, and a conductive piece arranged on the holding plate and interconnecting the probe contact part and the corresponding soldering part. Inspection equipment for circuit boards, etc. (2) The inspection device for circuit boards, etc. according to claim 1, wherein the probe contact portion is a conductive through hole into which the rear end of the contact probe is press-fitted or pressed. (3) The inspection device for circuit boards, etc. according to claim 1, wherein the probe contact portion is a terminal chip that is disposed through the holding plate and whose tip contacts the rear end of the contact probe.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984179840U JPH0438299Y2 (en) | 1984-11-27 | 1984-11-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984179840U JPH0438299Y2 (en) | 1984-11-27 | 1984-11-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6194781U true JPS6194781U (en) | 1986-06-18 |
JPH0438299Y2 JPH0438299Y2 (en) | 1992-09-08 |
Family
ID=30737405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984179840U Expired JPH0438299Y2 (en) | 1984-11-27 | 1984-11-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0438299Y2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6363777U (en) * | 1986-10-17 | 1988-04-27 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59163968U (en) * | 1983-04-20 | 1984-11-02 | 株式会社フジクラ | Printed circuit board inspection equipment |
-
1984
- 1984-11-27 JP JP1984179840U patent/JPH0438299Y2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59163968U (en) * | 1983-04-20 | 1984-11-02 | 株式会社フジクラ | Printed circuit board inspection equipment |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6363777U (en) * | 1986-10-17 | 1988-04-27 |
Also Published As
Publication number | Publication date |
---|---|
JPH0438299Y2 (en) | 1992-09-08 |
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