JPS6194781U

JPS6194781U -

Info

Publication number: JPS6194781U
Application number: JP17984084U
Authority: JP
Priority date: 1984-11-27
Filing date: 1984-11-27
Publication date: 1986-06-18
Also published as: JPH0438299Y2

Description

[Brief explanation of the drawing]

第１図は本考案の一実施例を示す要部平面図、
第２図はプローブユニツトの構成を示す部分縦断
面図、第３図は検査装置の全体構成を示す概略斜
視図、第４図は第２図の底面図、第５図は接続装
置を下面側から見た部分拡大図、第６図は第５図
の−線断面図、第７図ないし第１０図は本考
案の他の異なる実施例をそれぞれ示す説明図であ
る。１…プロブユニツト、３…上支持板、４…下支
持板、５…上部支持ボード、６…下部支持ボード
、７…ユニツト支柱、１１…コンタクトプローブ
、１２，３２，４２…接続装置、１３…コード、
１４，３４…保持板、１５…プローブ接触部、１
６，３６…はんだ付け部、１７，３７…導電片、
３５…通孔、３８…端子チツプ、３８ａ…凹部。 FIG. 1 is a plan view of essential parts showing an embodiment of the present invention;
Figure 2 is a partial vertical sectional view showing the configuration of the probe unit, Figure 3 is a schematic perspective view showing the overall configuration of the inspection device, Figure 4 is a bottom view of Figure 2, and Figure 5 shows the connection device on the bottom side. FIG. 6 is a cross-sectional view taken along the line -- in FIG. 5, and FIGS. 7 to 10 are explanatory views showing other different embodiments of the present invention. DESCRIPTION OF SYMBOLS 1...Probe unit, 3...Upper support plate, 4...Lower support plate, 5...Upper support board, 6...Lower support board, 7...Unit support column, 11...Contact probe, 12, 32, 42...Connection device, 13...Cord ,
14, 34... Holding plate, 15... Probe contact portion, 1
6, 36... Soldering part, 17, 37... Conductive piece,
35... Through hole, 38... Terminal chip, 38a... Recessed portion.

Claims

[Claims for Utility Model Registration] (1) A large number of pin-shaped contact probes, a support device for supporting the contact probes, a device for moving this support device toward a circuit board to be inspected, and each contact probe base. and a connecting means for connecting the end to a cord connected to a measurement/testing device, and conduction measurement/testing is performed by bringing the tip of each contact probe into contact with a test point on the circuit board by moving the support device relative to the circuit board. In the inspection device, the connecting means includes a holding plate having a probe contact portion located behind the support device and electrically connected to the rear end of the contact probe at a position corresponding to each contact probe; It is characterized by comprising a soldering part provided on the holding plate to which the coat is soldered, and a conductive piece arranged on the holding plate and interconnecting the probe contact part and the corresponding soldering part. Inspection equipment for circuit boards, etc. (2) The inspection device for circuit boards, etc. according to claim 1, wherein the probe contact portion is a conductive through hole into which the rear end of the contact probe is press-fitted or pressed. (3) The inspection device for circuit boards, etc. according to claim 1, wherein the probe contact portion is a terminal chip that is disposed through the holding plate and whose tip contacts the rear end of the contact probe.