JPS61178482U - - Google Patents
Info
- Publication number
- JPS61178482U JPS61178482U JP6112885U JP6112885U JPS61178482U JP S61178482 U JPS61178482 U JP S61178482U JP 6112885 U JP6112885 U JP 6112885U JP 6112885 U JP6112885 U JP 6112885U JP S61178482 U JPS61178482 U JP S61178482U
- Authority
- JP
- Japan
- Prior art keywords
- insulating plate
- tester
- connector
- board
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 5
- 229910000679 solder Inorganic materials 0.000 claims 1
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Description
第1図は本考案の実施例に係る側面断面図、第
2図は要部の部分拡大断面図、第3図は他例の要
部の部分拡大断面図、第4図は異方導電性ゴムシ
ートの断面図、第5図は従来の断面図、第6図は
接続端子の断面図である。
27〜交換テストヘツドボード、30〜コンタ
クトプローブ、32〜接続端子、33〜コネクタ
部、37〜コネクタ部、41〜絶縁プレート、4
2〜異方導電性ゴムシート、42a〜ゴムシート
、42b〜導電性線条、49〜スルーホール、5
2〜接続端子。
Fig. 1 is a side sectional view of an embodiment of the present invention, Fig. 2 is a partially enlarged sectional view of the main part, Fig. 3 is a partially enlarged sectional view of the main part of another example, and Fig. 4 is an anisotropic conductive FIG. 5 is a cross-sectional view of a rubber sheet, FIG. 5 is a conventional cross-sectional view, and FIG. 6 is a cross-sectional view of a connecting terminal. 27~Replacement test headboard, 30~Contact probe, 32~Connection terminal, 33~Connector part, 37~Connector part, 41~Insulation plate, 4
2 - Anisotropically conductive rubber sheet, 42a - Rubber sheet, 42b - Conductive filament, 49 - Through hole, 5
2 ~ Connection terminal.
Claims (1)
コンタクトプローブを設けた交換テストヘツドボ
ードを装置本体内に着脱可能に配設するインサー
キツトテスタ用治具あるいはプリント回路基板の
オングリツド状にコンタクトプローブを設けたテ
ストヘツドの下部に、該コンタクトプローブを押
上げるためプリント回路基板の被試験点の位置に
対応して押上げピンを設けた交換ボードを装置本
体内に着脱可能に配設するインサーキツトテスタ
用治具において、上記交換テストヘツドボード及
び交換ボードに、上記コンタクトプローブ及び押
上げピンに接続して接触頭部を若干突出した接続
端子を設けたコネクタ部を配設し、このコネクタ
部に対向し、かつ進退可能にして装置本体側に絶
縁プレートを配設し、該絶縁プレートの上記コネ
クタ部と対向する面に、シート面に対して実質的
に垂直方向に多数本の導電性線条が該シート面の
両面に貫通して配設された異方導電性ゴムシート
を配設し、上記絶縁プレートには上記コネクタ部
の接続端子と対向し、かつ、上記異方導電性ゴム
シートの絶縁プレート密着面と接触してテスタに
接続される接続端子を設けたコネクタ部を配設し
たことを特徴とするインサーキツトテスタ用治具
のコネクタの構造。 (2) 上記絶縁プレートに配設される接続端子は
、絶縁プレートに設けたスルーホールにテスタへ
接続される接続線を挿入するとともに半田を充填
してなるものである実用新案登録請求の範囲第1
項記載のインサーキツトテスタ用治具のコネクタ
の構造。[Scope of Claim for Utility Model Registration] An in-circuit tester jig or printed circuit in which a replacement test headboard with contact probes corresponding to the positions of test points on a printed circuit board is removably installed inside the device body. At the bottom of the test head, which has contact probes installed on-grid on the board, there is a replacement board that can be attached to and removed from the main body of the device, and has push-up pins corresponding to the positions of the test points on the printed circuit board to push up the contact probes. In the jig for the insert circuit tester installed in the above-mentioned replacement test headboard and the replacement board, a connector part is provided with a connecting terminal connected to the above-mentioned contact probe and push-up pin with a slightly protruding contact head. An insulating plate is disposed on the main body side of the device, facing the connector portion and movable back and forth, and a plurality of insulating plates are provided on the surface of the insulating plate facing the connector portion in a direction substantially perpendicular to the sheet surface. An anisotropically conductive rubber sheet is disposed in which conductive wires of the book are disposed through both sides of the sheet surface, and the insulating plate is opposite to the connecting terminal of the connector part and is A structure of a connector for an insert tester jig, characterized in that a connector portion is provided with a connection terminal that is connected to a tester by contacting the contact surface of an insulating plate of a conductive rubber sheet. (2) The connection terminal arranged on the insulating plate is formed by inserting a connecting wire connected to the tester into a through hole provided in the insulating plate and filling it with solder. 1
Structure of the connector for the insert tester jig described in Section 2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985061128U JPH0548141Y2 (en) | 1985-04-25 | 1985-04-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985061128U JPH0548141Y2 (en) | 1985-04-25 | 1985-04-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61178482U true JPS61178482U (en) | 1986-11-07 |
JPH0548141Y2 JPH0548141Y2 (en) | 1993-12-20 |
Family
ID=30589116
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985061128U Expired - Lifetime JPH0548141Y2 (en) | 1985-04-25 | 1985-04-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0548141Y2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4863130B2 (en) | 2009-05-22 | 2012-01-25 | 山一電機株式会社 | Board connector, semiconductor device socket including the same, cable connector, and board-to-board connector |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5737471U (en) * | 1980-08-14 | 1982-02-27 | ||
JPS58114775U (en) * | 1982-01-30 | 1983-08-05 | 日本電子材料株式会社 | probe card |
JPS6064271A (en) * | 1983-09-19 | 1985-04-12 | Usac Electronics Ind Co Ltd | Card tester |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5481912A (en) * | 1977-12-09 | 1979-06-29 | Fujitsu Ltd | Serial printer |
-
1985
- 1985-04-25 JP JP1985061128U patent/JPH0548141Y2/ja not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5737471U (en) * | 1980-08-14 | 1982-02-27 | ||
JPS58114775U (en) * | 1982-01-30 | 1983-08-05 | 日本電子材料株式会社 | probe card |
JPS6064271A (en) * | 1983-09-19 | 1985-04-12 | Usac Electronics Ind Co Ltd | Card tester |
Also Published As
Publication number | Publication date |
---|---|
JPH0548141Y2 (en) | 1993-12-20 |
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