JPS6194782U

JPS6194782U -

Info

Publication number: JPS6194782U
Application number: JP17984184U
Authority: JP
Priority date: 1984-11-27
Filing date: 1984-11-27
Publication date: 1986-06-18
Also published as: JPH045025Y2

Description

[Brief explanation of the drawing]

第１図は本考案の一実施例を示す要部平面図、
第２図はプローブユニツトの構成を示す部分縦断
面図、第３図は検査装置の全体構成を示す概略斜
視図、第４図は第２図の底面図、第５図は第１図
の要部拡大図、第６図は第５図の−線断面図
、第７図は第６図の−線断面図である。１…プローブユニツト、３…上支持板、４…下
支持板、５…上部支持ボード、６…下部支持ボー
ド、７…ユニツト支柱、１１…コンタクトプロー
ブ、１２…接続装置、１３…コード、１４…保持
板、１５…端子、１５ａ…凹溝、１６…フレーム
、１７…薄板。 FIG. 1 is a plan view of essential parts showing an embodiment of the present invention;
Fig. 2 is a partial vertical sectional view showing the configuration of the probe unit, Fig. 3 is a schematic perspective view showing the overall structure of the inspection device, Fig. 4 is a bottom view of Fig. 2, and Fig. 5 is the main part of Fig. 1. 6 is a cross-sectional view taken along the line -- in FIG. 5, and FIG. 7 is a cross-sectional view taken along the line -- in FIG. 6. DESCRIPTION OF SYMBOLS 1... Probe unit, 3... Upper support plate, 4... Lower support plate, 5... Upper support board, 6... Lower support board, 7... Unit support column, 11... Contact probe, 12... Connection device, 13... Cord, 14... Holding plate, 15...terminal, 15a...concave groove, 16...frame, 17...thin plate.

Claims

[Claims for Utility Model Registration] (1) A large number of pin-shaped contact probes, a support device for supporting each contact probe, a device for moving this support device toward a circuit board to be inspected, and each contact probe. a connection means for connecting the base end to a cord connected to a measurement/inspection device, and conduction measurement/inspection is performed by bringing the tip of each contact probe into contact with a test point on the circuit board by moving the support device relative to the circuit board. In the inspection device, the connecting means is arranged vertically through a holding plate disposed behind the supporting device, at a position corresponding to each contact probe of this holding plate, and has a tip at a rear end of each contact probe. a frame disposed at a rear position of the holding plate; a frame attached to the front surface of the frame on the contact probe side, one end of which has a front edge in contact with the rear end of the terminal; An inspection device for circuit boards, etc., comprising a conductive thin plate to which a cord is connected. (2) An inspection device for circuit boards, etc., as set forth in claim 1 of the utility model registration claim, characterized in that the rear end surface of the terminal is provided with a concave groove into which a thin plate is fitted into contact.