JPS6438573U - - Google Patents

Info

Publication number
JPS6438573U
JPS6438573U JP13286587U JP13286587U JPS6438573U JP S6438573 U JPS6438573 U JP S6438573U JP 13286587 U JP13286587 U JP 13286587U JP 13286587 U JP13286587 U JP 13286587U JP S6438573 U JPS6438573 U JP S6438573U
Authority
JP
Japan
Prior art keywords
contact
pin board
horizontal
inspected
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13286587U
Other languages
Japanese (ja)
Other versions
JPH0637348Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13286587U priority Critical patent/JPH0637348Y2/en
Publication of JPS6438573U publication Critical patent/JPS6438573U/ja
Application granted granted Critical
Publication of JPH0637348Y2 publication Critical patent/JPH0637348Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す電子部品の検
査装置の側面図、第2図は第1図の要部を左方か
ら見た部分断面正面図、第3図は第2図の−
線拡大部分断面図、第4図は第2図の要部拡大図
で、右半が検査前の状態を、左半が検査中の状態
を示すもの、第5図は第4図の右側面図である。 5……ラツク軸、13……下向きコンタクトピ
ン、14……上ピンボード、15……上基台、1
9……スライドベース、22,23……押え板、
24……スライド支柱、25……取付台、26,
34……コイルスプリング、27……電子部品、
28……保持台、29……下ピンボード、30…
…上向きコンタクトピン、31……横ピンボード
、33……横向きコンタクトピン、36……従動
子、37……カム。
Fig. 1 is a side view of an electronic component inspection device showing an embodiment of the present invention, Fig. 2 is a partial cross-sectional front view of the main parts of Fig. 1 seen from the left, and Fig. 3 is the same as Fig. 2. −
Figure 4 is an enlarged view of the main part of Figure 2, with the right half showing the state before inspection and the left half showing the state during inspection. Figure 5 is the right side of Figure 4. It is a diagram. 5... Rack shaft, 13... Downward contact pin, 14... Upper pin board, 15... Upper base, 1
9...Slide base, 22, 23...Press plate,
24...Slide support, 25...Mounting base, 26,
34...Coil spring, 27...Electronic component,
28...Holding stand, 29...Lower pin board, 30...
...Upward contact pin, 31...Horizontal pin board, 33...Horizontal contact pin, 36...Follower, 37...Cam.

Claims (1)

【実用新案登録請求の範囲】 1 a 基台上に配されたスライドベースと、 b このスライドベース上に上下動可能に取付
けられ、かつばね圧により常時上方に浮遊するよ
うに付勢された取付台と、 c この取付台上に設けられ、被検査部品を着
脱可能に位置決め固定する保持台と、 d 前記スライドベース上に取付けられた下ピ
ンボードと、 e この下ピンボードに上方に向けて多数植設
され、前記取付台の下降により先端が被検査部品
の下面に接触する上向きコンタクトピンと、 f 前記保持台の両側位置にそれぞれ配置され
、取付台を被検査部品に対し遠近方向に変位可能
の一対の横ピンボードと、 g これら各横ピンボードを保持台から離れる
方向に付勢するスプリングと、 h 前記各横ピンボードに多数植設され、各横
ピンボードをスプリングの付勢力に抗し保持台に
接近させることにより、先端が被検査部品の側面
にそれぞれ接触する横向きコンタクトピンと、 i 前記保持台の上方位置に昇降可能に配置さ
れた上ピンボードと、 j この上ピンボードに下方に向けて多数植設
され、上ピンボードの下降により先端が被検査部
品の上面に接触する下向きコンタクトピンと、 k 前記上ピンボードの下降により作動し、前
記各横ピンボードを保持台に接近させる連動機構
と、 を具備することを特徴とする電子部品の検査装置
。 2 スライドベースは、一対の横ピンボードの対
向方向に直交する方向にスライド可能となつてい
ることを特徴とする実用新案登録請求の範囲第1
項記載の電子部品の検査装置。 3 連動機構は、各横ピンボードの外端部にそれ
ぞれ取付けられた従動子と、上ピンボードの両端
部に下方に向かつて突設され上ピンボードの下降
により前記各従動子に接触してそれを内方へ押圧
するカムとを備えていることを特徴とする実用新
案登録請求の範囲第1項または第2項記載の電子
部品の検査装置。
[Claims for Utility Model Registration] 1. A slide base disposed on a base; b. A mounting mounted on the slide base so as to be movable up and down and always urged to float upward by spring pressure. a pedestal; c a holding pedestal provided on the mount to removably position and fix the part to be inspected; d a lower pin board mounted on the slide base; A plurality of upward contact pins are planted, and the tips of the pins come into contact with the lower surface of the component to be inspected when the mount is lowered; a pair of horizontal pinboards; g; springs that bias each of these horizontal pinboards in a direction away from the holding base; horizontal contact pins whose tips come into contact with the side surfaces of the component to be inspected by bringing them close to the holding table; i. an upper pin board that is movably disposed above the holding table; and j. downward contact pins that are planted in large numbers toward the top and whose tips come into contact with the top surface of the part to be inspected when the top pin board is lowered; An electronic component inspection device comprising: an interlocking mechanism; 2. Utility model registration claim 1, characterized in that the slide base is capable of sliding in a direction perpendicular to the direction in which the pair of horizontal pin boards face each other.
Inspection equipment for electronic components as described in Section 1. 3. The interlocking mechanism includes a follower attached to the outer end of each horizontal pin board, and a follower that projects downward from both ends of the upper pin board and comes into contact with each follower when the upper pin board is lowered. An electronic component inspection device according to claim 1 or 2, characterized in that the electronic component inspection device is equipped with a cam that presses the electronic component inward.
JP13286587U 1987-08-31 1987-08-31 Electronic component inspection device Expired - Lifetime JPH0637348Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13286587U JPH0637348Y2 (en) 1987-08-31 1987-08-31 Electronic component inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13286587U JPH0637348Y2 (en) 1987-08-31 1987-08-31 Electronic component inspection device

Publications (2)

Publication Number Publication Date
JPS6438573U true JPS6438573U (en) 1989-03-08
JPH0637348Y2 JPH0637348Y2 (en) 1994-09-28

Family

ID=31390226

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13286587U Expired - Lifetime JPH0637348Y2 (en) 1987-08-31 1987-08-31 Electronic component inspection device

Country Status (1)

Country Link
JP (1) JPH0637348Y2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9188086B2 (en) 2008-01-07 2015-11-17 Mcalister Technologies, Llc Coupled thermochemical reactors and engines, and associated systems and methods
US8318131B2 (en) 2008-01-07 2012-11-27 Mcalister Technologies, Llc Chemical processes and reactors for efficiently producing hydrogen fuels and structural materials, and associated systems and methods
US8441361B2 (en) 2010-02-13 2013-05-14 Mcallister Technologies, Llc Methods and apparatuses for detection of properties of fluid conveyance systems
WO2011100699A2 (en) 2010-02-13 2011-08-18 Mcalister Roy E Reactor vessels with transmissive surfaces for producing hydrogen-based fuels and structural elements, and associated systems and methods
CN103857873A (en) 2011-08-12 2014-06-11 麦卡利斯特技术有限责任公司 Systems and methods for extracting and processing gases from submerged sources
US8911703B2 (en) 2011-08-12 2014-12-16 Mcalister Technologies, Llc Reducing and/or harvesting drag energy from transport vehicles, including for chemical reactors, and associated systems and methods
US9302681B2 (en) 2011-08-12 2016-04-05 Mcalister Technologies, Llc Mobile transport platforms for producing hydrogen and structural materials, and associated systems and methods
US8926719B2 (en) 2013-03-14 2015-01-06 Mcalister Technologies, Llc Method and apparatus for generating hydrogen from metal

Also Published As

Publication number Publication date
JPH0637348Y2 (en) 1994-09-28

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