JPH0129589Y2 - - Google Patents

Description

[Detailed Description of the Invention] [Technical Field] The present invention relates to a universal contact mechanism for a PKG test fixture.

Today, there is a tendency for printed circuit boards (PKG) to be manufactured in small quantities while producing a wide variety of products, and it is naturally necessary to improve the PKG testing fixtures for such a wide variety of printed circuit boards (PKG). Ru.

The present invention is a PKG test fixture that can handle various types of boards (PKG) by incorporating a lifter board with lifter pins corresponding to the board under test into the PKG test fixture according to the type of board under test. It is provided by.

[Prior art]

A conventional fixture will be explained below based on the drawings.

FIG. 1 is a schematic side view of a conventional fixture.

In the figure, 1 is a plate, and 2 is a contact provided on the plate corresponding to a board to be tested, which will be described later, and the contact 2 is electrically connected to a testing machine (not shown) via a connector.

Reference numeral 3 denotes a board to be tested placed on the contactor 2, and reference numeral 4 designates a presser portion for pressing the board to be tested 3 against the contactor 2.

In a fixture with such a structure, the board under test 3 is pressed against the contactor 2 by the holding part 4, and the tester (not shown) and the board under test 3 are electrically connected via the contactor 2. We are conducting a test.

However, a fixture with such a structure has the following drawbacks.

It is a disadvantage that in order to test multiple circuit boards (PKGs), corresponding individual fixtures must be provided.

This is also a drawback that requires a large amount of capital investment in today's high-mix, low-volume circuit board (PKG) production that is required today.

[Purpose of invention]

Therefore, the purpose of the present invention is to arrange contacts in a matrix, select the contacts to correspond to the type of board to be tested, and bring the contacts into contact with the board to be tested. The aim is to solve the shortcomings of the conventional technology.

[Structure of the idea]

The structure of the fixture is as follows.

Contacts are arranged in a matrix on a matrix board, and a lower part of the matrix board is provided with a connector board that moves up and down and has connector pins arranged in a matrix to match the contacts in the matrix.

Then, a lifter board having lifter pins corresponding to the type of board to be tested is installed on the connector board that moves up and down.

By doing this, the connector pins rising on the connector board push up the contacts via the lifter pins on the lifter board, bringing the contacts into contact with the board under test and establishing an electrical connection with the test machine. This is used to test the board under test.

Then, by manufacturing multiple lifter boards with lifter pins that correspond to the type of board under test, and changing the lifter board incorporated into the fixture as necessary, it is possible to test multiple types of boards under test. can do.

〔Example〕

An embodiment of the present invention will be described below based on the drawings.

FIG. 2 is a schematic side view of a fixture according to an embodiment of the present invention, FIG. 3 is a perspective view thereof, and FIG. 4 is an enlarged side view of a main part.

In the figure, 5 is a matrix board, and 6 is a contactor arranged in a matrix on the matrix board 5.

7 is a connector board located at the bottom of the matrix board 5 and can be moved up and down; 8 is a connector pin arranged on the connector board in a matrix that matches the matrix-shaped contacts 6; and 9 is a lifter board to be described later. This is a guide provided on the connector board 7 to guide the frame.

10 is a post located at the bottom of the connector board 7, 11 is a bush into which the post 10 is inserted and attached to the bottom surface of the connector board 7, and 12 is an air cylinder that moves the connector board 7 up and down.

13 is a frame that can be inserted and removed by being guided by a guide 9 on the connector board 7; 14 is a frame 1;
3 is a lifter board fixed, 15 is a lifter pin provided on the lifter board 14 so as to correspond to the type of board to be tested which will be described later, and 16 is a board to be tested placed on the contactor 6.

The operating state of the fixture in the present invention configured as described above is as follows.

First, as shown in FIGS. 2 and 3, the lifter board 14 having lifter pins 15 corresponding to the type of the board under test 16 is placed on the connector board 7 by the frame 13 guided by the guide 9. It is located.

Next, the air cylinder 12 is operated to raise the connector board 7.

Then, as shown in Fig. 4, the connector board 7
The connector pin 8 that rises together with the lifter board 14 causes the lifter pin 15 that is in contact with the connector pin 8 to rise together with the lifter board 14.

Then, the rising lifter pin 15 comes into contact with the contactor 6 and pushes up the contactor 6, causing the test board 16 to rise.
bring it into contact with.

Here, the contactor 6 in contact with the board under test 16 becomes electrically connected to the connector pin 8 via the lifter pin 15, and electrical connection between the test machine (not shown) and the board under test 16 is established, and the board under test 16 tests are conducted.

[Effect of idea]

As explained in detail about the fixture above, in this invention, the contacts are arranged in a matrix on the matrix board, and the connector board, which has a matrix of connector pins that match the matrix of contacts, can be moved up and down. The structure is such that a lifter board with lifter pins corresponding to the type of board under test is removably placed on the connector board, which is located at the bottom of the matrix board.The following effects can be achieved. can.

Even if the type of board under test changes, by changing the fixture's lifter board to a lifter board with corresponding lifter pins, it is possible to test multiple types of boards (PKG) with one fixture. It is to have.

This eliminates the need for multiple types of fixtures as in the past, so it has the effect of reducing equipment costs for fixtures in the manufacture of circuit boards (PKGs), which will become increasingly diverse and in small quantities. This is also an effect of providing substrates (PKG).

In addition, the fixture contactor of the present invention has a structure in which only the necessary parts come into contact with the board under test, so no extra force is applied to the board under test, which prevents deformation or damage to the board under test. .

It is also beneficial to make the fixture universal with inexpensive lifter boards and lifter pins.

The present invention, which has such effects, can be usefully used in test fixtures for substrates (PKG), which will become more diverse and smaller in quantity in the future, as described above.

[Brief explanation of drawings]

FIG. 1 is a schematic side view of a conventional fixture, FIG. 2 is a schematic side view of a fixture according to an embodiment of the present invention, FIG. 3 is a perspective view thereof, and FIG. 4 is an enlarged side view of the main part. 5... Matrix board, 6... Contact, 7
... Connector board, 8 ... Connector pin, 14
... Lifter board, 15 ... Lifter pin, 1
6... Board to be tested.

Claims (1)

[Scope of utility model registration request] At the contact part of the test fixture that brings the contact into contact with a predetermined contact position on the board under test,
The contacts are arranged in a matrix on a matrix board, and a connector board having connector pins arranged in a matrix to match the contacts in the matrix is attached to the lower part of the matrix board so as to be movable up and down. By removably disposing a lifter board having lifter pins at contact positions corresponding to the type of the board under test on the connector board, the lifter board is pressed by the connector board and the lifter board is moved to the specified position on the matrix board. A contact portion of a test fixture characterized by bringing only the contact into contact with the board under test.