JPH034941Y2 - - Google Patents

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Publication number
JPH034941Y2
JPH034941Y2 JP9963383U JP9963383U JPH034941Y2 JP H034941 Y2 JPH034941 Y2 JP H034941Y2 JP 9963383 U JP9963383 U JP 9963383U JP 9963383 U JP9963383 U JP 9963383U JP H034941 Y2 JPH034941 Y2 JP H034941Y2
Authority
JP
Japan
Prior art keywords
test
contact
pins
board
tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9963383U
Other languages
Japanese (ja)
Other versions
JPS607079U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9963383U priority Critical patent/JPS607079U/en
Publication of JPS607079U publication Critical patent/JPS607079U/en
Application granted granted Critical
Publication of JPH034941Y2 publication Critical patent/JPH034941Y2/ja
Granted legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【考案の詳細な説明】 (a) 考案の技術分野 本考案は1台の試験機によつて特定多種のプリ
ント板の特性試験を行うための試験用治具に関す
るものである。
[Detailed Description of the Invention] (a) Technical Field of the Invention The present invention relates to a test jig for testing the characteristics of various specific types of printed circuit boards using one testing machine.

(b) 技術の背景 最近のプリント板は多品種少量化の傾向が著し
く、専用の試験設備を設置することは投資効率面
で問題があり、また段取替えによるオペレータの
時間損失も大きい。このため簡単な切換操作で特
定多種のプリント板の特性試験を行うことができ
る試験用治具の開発が強く要望されている。
(b) Background of the technology Recently, there has been a marked trend toward increasing the variety of printed circuit boards in smaller quantities, and installing dedicated testing equipment poses problems in terms of investment efficiency, and the operator's time loss due to setup changes is large. For this reason, there is a strong demand for the development of a test jig that can perform characteristic tests on a variety of specific types of printed circuit boards with simple switching operations.

(c) 従来技術と問題点 第1図は従来のプリント板試験治具を説明する
ための図であり、同図において1は試験槽、2は
被試験プリント板、3は被試験プリント板に実装
された部品のリード、4は試験用コンタクトピ
ン、6および6′はガイドピン、7は気密パツド、
8は気密シート、9は可動板、10は復元ばね、
11は導線、12はテスター部をそれぞれ示して
いる。
(c) Prior art and problems Figure 1 is a diagram for explaining a conventional printed board testing jig. Leads of the mounted components, 4 is a test contact pin, 6 and 6' are guide pins, 7 is an airtight pad,
8 is an airtight sheet, 9 is a movable plate, 10 is a restoring spring,
Reference numeral 11 indicates a conducting wire, and reference numeral 12 indicates a tester section.

第1図に示す如く試験槽1内の空気を矢印A方
向に排気して減圧すると、被試験プリント板2は
ガイドピン6に沿つて矢印B方向に吸引され、該
被試験プリント板2に実装された部品のリード3
は前記試験槽1に付設されたコンタクトピン4に
接触する。これによつて前記被試験プリント板2
に実装された部品とテスター部12との回路が前
記コンタクトピン4、導線11を介して接続さ
れ、該テスター部12によつて該被試験プリント
板2の回路の良否が判定される。なお可動板9は
前記被試験プリント板2が矢印B方向に吸引され
たとき該被試験プリント板2を支えて歪の発生を
防止しそれに実装された部品のリード3と前記コ
ンタクトピン4の接触を安定させるために設置し
たものであり、また復元ばね10は試験が終了し
た前記被試験プリント板2をすみやかに試験前の
位置へ復帰させるために設けたものである。
As shown in FIG. 1, when the air in the test chamber 1 is evacuated in the direction of arrow A to reduce the pressure, the printed board 2 to be tested is sucked in the direction of arrow B along the guide pins 6, and the printed board 2 to be tested is mounted. lead 3 of the parts
contacts the contact pin 4 attached to the test chamber 1. As a result, the printed board 2 under test
The circuits between the components mounted on the tester section 12 and the tester section 12 are connected through the contact pins 4 and the conductive wires 11, and the tester section 12 determines the quality of the circuit of the printed board 2 under test. Note that the movable plate 9 supports the printed board 2 under test when it is attracted in the direction of arrow B, prevents the generation of distortion, and prevents contact between the leads 3 of the components mounted thereon and the contact pins 4. The restoring spring 10 is provided to quickly return the printed board 2 to be tested after the test to the position before the test.

しかしながら、従来の試験治具によればその構
造から見て明らかなように種類の異なるプリント
板についてそれぞれ専用の試験治具を必要とする
うえ、段取替えのためのオペレータの損失時間は
非常に大きいものであつた。
However, as is clear from the structure of conventional test jigs, a dedicated test jig is required for each type of printed board, and the operator's time lost due to setup changes is extremely large. It was hot.

(d) 考案の目的 本考案は上記従来の欠点に鑑み、簡単な構造と
操作で特定多種類のプリント板の特性試験を効率
よく行い得る試験用治具を提供することを目的と
するものである。
(d) Purpose of the invention In view of the above-mentioned conventional drawbacks, the object of the invention is to provide a test jig that can efficiently perform characteristic tests on a variety of specific types of printed circuit boards with a simple structure and operation. be.

(e) 考案の構成 そしてこの目的は本考案によれば減圧槽内に複
数の試験用コンタクトピンを設け、その減圧動作
により被試験プリント板の電気回路導体を該試験
用コンタクトピンに吸着接触させて当該被試験プ
リント板の特性を試験する治具構成において、前
記試験用コンタクトピン群に着脱自在であつて被
試験プリント板個々の電気回路導体に対応する試
験コンタクトピンのみを挿通し得る孔を有する選
択マスクと、被試験プリント板がセツトされる前
記減圧槽か、またはそれとは別個の減圧槽内にお
いて植立されかつ前記試験用コンタクトピンと電
気的接続された複数の入力ピンと、同じく減圧槽
内において植立されかつ特性試験用のテスター部
と電気的接続された複数の出力ピンを、前記減圧
槽に着脱自在な基板構成を有し、その基板表面に
前記被試験プリント板の電気回路導体と同一配列
パターンの前記入力ピンと接触し得る入力接点お
よび該入力接点に電気的に接続されていて前記各
出力ピンと接触し得る複数の出力接点とを形成し
た個別ボードを付設したことを特徴とするプリン
ト板試験治具を提供することによつて達成され
る。
(e) Structure of the invention According to the invention, the purpose of this invention is to provide a plurality of test contact pins in a decompression tank, and to bring the electrical circuit conductor of the printed board under test into suction contact with the test contact pins by the decompression operation. In the jig configuration for testing the characteristics of the printed circuit board under test, a hole is provided that is detachable from the group of test contact pins and allows only the test contact pins corresponding to the electric circuit conductors of the individual printed circuit boards under test to be inserted. a plurality of input pins installed in the vacuum tank in which the printed circuit board to be tested is set, or in a vacuum tank separate from it and electrically connected to the test contact pins; The circuit board has a structure in which a plurality of output pins, which are planted in the board and electrically connected to the tester part for characteristic testing, can be attached to and detached from the decompression tank, and the electrical circuit conductor of the printed board under test is attached to the surface of the board. A print characterized in that it is attached with an individual board forming an input contact capable of contacting the input pins of the same arrangement pattern and a plurality of output contacts electrically connected to the input contact and capable of contacting each of the output pins. This is accomplished by providing a plate test fixture.

(f) 考案の実施例 以下本考案実施例を図面によつて詳述する。(f) Example of implementation of the idea Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は本考案によるプリント板試験治具の1
例構造を示す図であり、同図において第1図と同
等の部分については同一符号を付しており、また
12は連絡用導線、19は切換部可動板、20は
選択マスク、21は入力接点、22は入力ピン、
23は個別ボード用ガイドピン、24は案内板、
25は気密パッド、26は接続切換槽、27は個
別ボード、28は回路結線用導線、29は出力接
点、30は出力ピン、120は個別ボード27お
よび案内板24等から構成された接続切換部、1
21は仕切板をそれぞれ示している。
Figure 2 shows one of the printed board test jigs according to the present invention.
This is a diagram showing an example structure, in which the same parts as in FIG. Contact, 22 is input pin,
23 is a guide pin for individual boards, 24 is a guide plate,
25 is an airtight pad, 26 is a connection switching tank, 27 is an individual board, 28 is a conductor for circuit connection, 29 is an output contact, 30 is an output pin, 120 is a connection switching unit composed of the individual board 27, guide plate 24, etc. ,1
Reference numeral 21 indicates a partition plate.

第2図に示す如く試験槽1と接続切換槽26と
は同一基板上に仕切板121により区切られて一
体的に設けられている。そして試験槽1では各種
の被試験プリント板が試験できるように、コンタ
クトピン4の配列数を増加するとともにそれら各
ピンに対応するガイド孔を持つ可動板9が使用さ
れ、また被試験プリント板個々に応じたコンタク
トピン選択用の選択マスク20が着脱自在に設け
られている。一方、接続切換槽26には、前記試
験槽1の各コンタクトピン4より導出した連絡用
導線12と接続された入力ピン22と、テスター
部12より導出した各導線11と接続された出力
ピン30と、これら入力ピン群22および出力ピ
ン群30をそれぞれ挿通してガイドする可動板1
9および案内板24と、被試験プリント板個々に
応じて異なる配線パターンを構成すべくその基板
表面の所定位置に該被試験プリント板の電気回路
導体と同一配列パターンの入力接点21および出
力接点29を形成した個別ボード27とが設けら
れている。なお、入力接点群21と出力接点群2
9は前記入力ピン群22および出力ピン群30と
それぞれ選択的にコンタクトし、かつコンタクト
した入力ピンと出力ピンとは回路結線用導線28
により当該個別ボード27上で接続されるように
なつている。
As shown in FIG. 2, the test tank 1 and the connection switching tank 26 are integrally provided on the same board, separated by a partition plate 121. In the test tank 1, in order to test various types of printed circuit boards to be tested, the number of arranged contact pins 4 is increased and a movable plate 9 is used which has guide holes corresponding to each pin. A selection mask 20 for selecting contact pins according to the selection is removably provided. On the other hand, the connection switching tank 26 includes an input pin 22 connected to the communication lead wire 12 led out from each contact pin 4 of the test tank 1, and an output pin 30 connected to each lead wire 11 led out from the tester section 12. and a movable plate 1 that inserts and guides these input pin group 22 and output pin group 30, respectively.
9 and a guide plate 24, and input contacts 21 and output contacts 29 arranged in the same arrangement pattern as the electric circuit conductors of the printed board under test at predetermined positions on the surface of the board to configure different wiring patterns depending on each printed board under test. An individual board 27 is provided. In addition, input contact group 21 and output contact group 2
Reference numeral 9 selectively contacts the input pin group 22 and the output pin group 30, and the contacted input pins and output pins are connected to the circuit connection conductor 28.
The connection is made on the individual board 27.

さて次に上記構成の試験治具の試験操作例につ
いて説明する。まず被試験プリント板2に応じた
選択マスク20と個別ボード27を試験槽1と接
続切換槽26に取付け、次いで当該被試験プリン
ト板2を試験槽1に取付ける。この後、試験槽1
内の空気を矢印A方向に排気して減圧する。これ
により被試験プリント板2はガイドピン6に沿つ
て矢印B方向に吸引され、該被試験プリント板2
に実装された部品のリード3が選択マスク20か
ら露出している当該被試験プリント板2を試験す
るために必要なコンタクトピン4と接触し、結果
として連絡用導線12を介して入力ピン22に到
る回路が構成される。これに引続いて接続切換槽
26内の空気を矢印C方向に排気して減圧する
と、個別ボード27はガイドピン23に沿つて矢
印D方向に吸引されて該個別ボード27上に設け
られた前記入力接点21、ならびに前記出力接点
29が接続切換部120の接続切換槽26に配設
されている入力ピン22ならびに出力ピン30に
接触する。この結果、被試験プリント板2の回路
部品−試験槽1のコンタクトピン4−連絡用導線
12−接続切換槽26の入力ピン22−個別ボー
ド27−出力ピン30−導線11を介して前記テ
スター部12に到る回路が構成され、該テスター
部12によつて前記被試験プリント板2の良否が
判定されることになる。この場合、接続切換部1
20は仕切板121によつて独立しているので、
同種類の被試験プリント板2の試験中は接続切換
槽26内を常時減圧しておけば個別ボード27に
設けた入力接点21ならびに出力接点29と接続
切換槽26の入力ピン22ならびに出力ピン30
との接触状態を常に安定に保つことができる。な
お案内板24、切換部可動板19ならびに復元ば
ね10の説明は前第1図可動板9、復元ばね10
と同等のため省略する。
Next, an example of a test operation using the test jig having the above configuration will be explained. First, the selection mask 20 and individual board 27 corresponding to the printed board 2 to be tested are attached to the test tank 1 and the connection switching tank 26, and then the printed board 2 to be tested is attached to the test tank 1. After this, test tank 1
The air inside is exhausted in the direction of arrow A to reduce the pressure. As a result, the printed board 2 under test is attracted in the direction of arrow B along the guide pin 6, and the printed board 2 under test is
The lead 3 of the component mounted on the board comes into contact with the contact pin 4 necessary for testing the printed circuit board 2 under test exposed from the selection mask 20, and as a result, the lead 3 of the component mounted on the board contacts the input pin 22 via the connecting conductor 12. All circuits are constructed. Subsequently, when the air in the connection switching tank 26 is exhausted in the direction of arrow C to reduce the pressure, the individual board 27 is sucked in the direction of arrow D along the guide pin 23, and the The input contact 21 and the output contact 29 contact the input pin 22 and output pin 30 provided in the connection switching tank 26 of the connection switching section 120. As a result, the circuit components of the printed board 2 under test, the contact pins 4 of the test tank 1, the connecting conductor 12, the input pin 22 of the connection switching tank 26, the individual board 27, the output pin 30, and the conductor 11 are connected to the tester section. 12 circuits are constructed, and the tester section 12 determines the quality of the printed board 2 to be tested. In this case, connection switching section 1
20 are independent by the partition plate 121,
During testing of the same type of printed circuit board 2 under test, if the pressure inside the connection switching tank 26 is constantly reduced, the input contacts 21 and output contacts 29 provided on the individual boards 27 and the input pins 22 and output pins 30 of the connection switching tank 26
A stable contact state can be maintained at all times. The guide plate 24, the switching part movable plate 19, and the restoring spring 10 are explained in the previous figure.
It is omitted because it is equivalent to .

第3図は本考案によるプリント板試験治具の一
部分の変形例を説明するための図であり、この変
形例では選択マスク20に中間ピン40を、コン
タクトピン4にばね41をそれぞれ付設すること
によつて被試験プリント板2に実装された部品の
リード3と接触しないコンタクトピン4′が第2
図に示した如く前記選択マスク20によつて押圧
されることなく自然な状態を保つようにして損傷
を防止している。また前記選択マスク20にかか
る荷重も軽減している。本考案はこのようにプリ
ント板の種類に応じて選択マスク20ならびに個
別ボード27を交換することによつて特定多種の
プリント板を試験することができる。なお、上記
試験槽1と接続切換槽26の減圧槽は仕切板によ
る個別構造に限らず、相互に連通する構造であつ
ても良い。この場合、被試験プリント板と個別ボ
ードとは同時に吸引されることになるのはいうま
でもない。
FIG. 3 is a diagram for explaining a modification of a part of the printed board testing jig according to the present invention. In this modification, an intermediate pin 40 is attached to the selection mask 20, and a spring 41 is attached to the contact pin 4. The contact pin 4' that does not come into contact with the lead 3 of the component mounted on the printed board 2 under test is
As shown in the figure, damage is prevented by maintaining a natural state without being pressed by the selection mask 20. Further, the load applied to the selection mask 20 is also reduced. In this manner, the present invention can test various types of printed circuit boards by exchanging the selection mask 20 and the individual boards 27 according to the type of printed circuit board. Note that the test tank 1 and the reduced pressure tank of the connection switching tank 26 are not limited to separate structures using partition plates, but may have a structure in which they communicate with each other. In this case, it goes without saying that the printed board to be tested and the individual board will be sucked at the same time.

(g) 考案の効果 以上詳細に説明したように本考案のプリント板
試験治具は、試験槽の若干の改造と接続切換部の
追設だけの簡易構成でかつ簡単な操作によつて1
台の試験機で容易に特定多種のプリント板試験を
的確かつ効率的に行い得るといつた効果大なるも
のである。
(g) Effects of the invention As explained in detail above, the printed board test jig of the invention has a simple configuration that requires only slight modification of the test chamber and the addition of a connection switching section, and is easy to operate.
This has a great effect in that it is possible to easily and accurately and efficiently test various types of printed circuit boards using a standard testing machine.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のプリント板試験治具を説明する
ための図、第2図は本考案の一実施例によるプリ
ント板試験治具の構造を示す図、第3図は第2図
示のプリント板試験治具の一部分変形例を説明す
るための図である。 図面において1は試験槽、2は被試験プリント
板、3は被試験プリント板に実装された部品のリ
ード、4はコンタクトピン、6および6′はガイ
ドピン、10は復元ばね、12はテスター部、2
0は選択マスク、23は個別ボード用ガイドピ
ン、24は案内板、26は接続切換槽、27は個
別ボード、120は接続切換部、40は中間ピン
をそれぞれ示す。
Fig. 1 is a diagram for explaining a conventional printed board testing jig, Fig. 2 is a diagram showing the structure of a printed board testing jig according to an embodiment of the present invention, and Fig. 3 is a diagram for explaining the printed board testing jig shown in Fig. 2. FIG. 7 is a diagram for explaining a partial modification of the test jig. In the drawing, 1 is a test tank, 2 is a printed circuit board to be tested, 3 is a lead of a component mounted on the printed board to be tested, 4 is a contact pin, 6 and 6' are guide pins, 10 is a restoring spring, and 12 is a tester section. ,2
0 is a selection mask, 23 is an individual board guide pin, 24 is a guide plate, 26 is a connection switching tank, 27 is an individual board, 120 is a connection switching unit, and 40 is an intermediate pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 減圧槽内に複数の試験用コンタクトピンを設
け、その減圧動作により被試験プリント板の電気
回路導体を該試験用コンタクトピンに吸着接触さ
せて当該被試験プリント板の特性を試験する治具
構成において、前記試験用コンタクトピン群に着
脱自在であつて被試験プリント板個々の電気回路
導体に対応する試験コンタクトピンのみを挿通し
得る孔を有する選択マスクと、被試験プリント板
がセツトされる前記減圧槽かまたはそれとは別個
の減圧槽内において植立されかつ前記試験用コン
タクトピンと電気的接続された複数の入力ピン
と、同じく減圧槽内において植立されかつ特性試
験用のテスター部と電気的接続された複数の出力
ピンと、前記減圧槽に着脱自在な基板構成を有
し、その基板表面に前記被試験プリント板の電気
回路導体と同一配列パターンの前記入力ピンと接
触し得る入力接点および該入力接点に電気的に接
続されていて前記各出力ピンと接触し得る複数の
出力接点とを形成した個別ボードを付設したこと
を特徴とするプリント板試験治具。
In a jig configuration in which a plurality of test contact pins are provided in a decompression tank, and the electric circuit conductor of the printed board under test is brought into suction contact with the test contact pins by the depressurization operation to test the characteristics of the printed board under test. , a selection mask that is detachable from the group of test contact pins and has a hole through which only the test contact pins corresponding to the electric circuit conductors of the individual printed boards under test can be inserted; and the reduced pressure in which the printed boards under test are set. a plurality of input pins that are planted in the tank or a vacuum tank separate from the tank and electrically connected to the test contact pins; and a plurality of input pins that are also planted in the vacuum tank and are electrically connected to the tester section for characteristic testing. a plurality of output pins, and a board configured to be detachably attached to the decompression tank, and an input contact capable of contacting the input pins having the same arrangement pattern as the electric circuit conductor of the printed board under test on the surface of the board, and an input contact at the input contact. 1. A printed board testing jig, characterized in that an individual board is attached thereto, each board having a plurality of output contacts that are electrically connected and can come into contact with each of the output pins.
JP9963383U 1983-06-27 1983-06-27 Printed board test jig Granted JPS607079U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9963383U JPS607079U (en) 1983-06-27 1983-06-27 Printed board test jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9963383U JPS607079U (en) 1983-06-27 1983-06-27 Printed board test jig

Publications (2)

Publication Number Publication Date
JPS607079U JPS607079U (en) 1985-01-18
JPH034941Y2 true JPH034941Y2 (en) 1991-02-07

Family

ID=30236033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9963383U Granted JPS607079U (en) 1983-06-27 1983-06-27 Printed board test jig

Country Status (1)

Country Link
JP (1) JPS607079U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012023180A1 (en) * 2010-08-17 2012-02-23 株式会社アドバンテスト Connecting apparatus, semiconductor wafer testing apparatus provided with same, and connecting method

Also Published As

Publication number Publication date
JPS607079U (en) 1985-01-18

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