JPH07154053A - Wiring board, and method and device for testing the same - Google Patents
Wiring board, and method and device for testing the sameInfo
- Publication number
- JPH07154053A JPH07154053A JP5298353A JP29835393A JPH07154053A JP H07154053 A JPH07154053 A JP H07154053A JP 5298353 A JP5298353 A JP 5298353A JP 29835393 A JP29835393 A JP 29835393A JP H07154053 A JPH07154053 A JP H07154053A
- Authority
- JP
- Japan
- Prior art keywords
- wiring board
- test
- types
- wiring
- fixture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0097—Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards
Landscapes
- Tests Of Electronic Circuits (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、インサーキットテスト
手法による配線基板の試験に利用する。本発明は、一つ
のフィクスチャーで複数種類の配線基板の試験を行うこ
とができる配線基板の試験方法、その装置および配線基
板に関する。BACKGROUND OF THE INVENTION The present invention is used for testing a wiring board by an in-circuit test method. The present invention relates to a method of testing a wiring board, a device therefor, and a wiring board capable of testing a plurality of types of wiring boards with one fixture.
【０００２】[0002]
【従来の技術】従来のインサーキットテスト手法による
試験装置と試験が行われる配線基板との接続は、フィク
スチャーと呼ばれる治具に設けられた剣山状のプローブ
ピンと配線基板に実装された部品のリード端子またはパ
ターン配線上のビアホールとの間で行われていた。一般
には配線基板の機能が異なると品名も異なり、実装され
る部品の形状や部品間の間隔も異なる。また、パターン
配線上のビアホール位置（部品や回路を搭載する位置）
も異なる。従ってフィクスチャーに設けるプローブピン
位置は配線基板の種類毎に異なっていた。2. Description of the Related Art A conventional in-circuit test method is used to connect a tester to a wiring board to be tested by connecting a probe pin provided in a jig called a fixture and a lead of a component mounted on the wiring board. It was done between the terminal or the via hole on the pattern wiring. Generally, when the function of the wiring board is different, the product name is different, and the shapes of the mounted components and the intervals between the components are also different. Also, the via hole position on the pattern wiring (position where parts and circuits are mounted)
Is also different. Therefore, the probe pin positions provided on the fixture were different for each type of wiring board.
【０００３】従来技術として、特開昭６２−６４９６６
号公報または特開昭６２−２０６４６８号公報には、被
試験基板のテスト基準ポイントが試験装置との接続に利
用されると理解できる記載があるが、従来例には、この
テスト基準ポイントが行および列方向に格子状パターン
に配列される旨の思想はなく、この格子状パターンが配
線基板の上で部品や回路を搭載する位置の区分領域に設
定されるとの思想もない。As a prior art, Japanese Patent Laid-Open No. 62-64966
JP-A-62-206468 or JP-A-62-206468 describes that the test reference point of the substrate under test is used for connection with the test apparatus. Also, there is no idea that they are arranged in a grid pattern in the column direction, and there is also no idea that this grid pattern is set on the wiring board in a divided area where components and circuits are mounted.
【０００４】[0004]
【発明が解決しようとする課題】このように、試験を行
う配線基板の種類毎にプローブピン位置が異なる場合に
は、 １．配線基板毎にフィクスチャーを作る必要があり １）製作費用がかかる ２）収納スペースが多く必要 ３）種別の管理が必要 ２．試験時に配線基板の種類毎に対応するフィクスチャ
ーに交換する段取り作業を必要とする などの問題があった。As described above, when the probe pin position is different for each type of wiring board to be tested, 1. It is necessary to make a fixture for each wiring board 1) Manufacturing cost is high 2) Storage space is large 3) Type management is required 2. During the test, there was a problem that setup work was required to replace the fixture with a corresponding one for each type of wiring board.
【０００５】本発明はこのような問題を解決するもの
で、一つのフィクスチャーに複数種の配線基板が対応で
きるようにし、製造コストの低減および管理の容易化を
はかることができる試験方法、その装置および配線基板
を提供することを目的とする。The present invention solves such a problem, and makes it possible for a plurality of types of wiring boards to correspond to one fixture, thereby reducing the manufacturing cost and facilitating the management. An object is to provide a device and a wiring board.
【０００６】[0006]
【課題を解決するための手段】本発明の第一は、被試験
配線基板を装着するフィクスチャーに複数種類の被試験
配線基板について共通に行および列方向の格子状パター
ンに配列されたプローブピンを設けておき、被試験配線
基板にはこの格子状パターンをテスト基準ポイントと
し、かつ、試験装置に接続する回路をこのプローブピン
の位置を通過するように設計することを特徴とする。SUMMARY OF THE INVENTION A first aspect of the present invention is to provide probe pins arranged in a grid pattern in a row and column direction commonly for a plurality of types of wiring boards to be tested in a fixture on which the wiring board to be tested is mounted. Is provided, and the circuit pattern to be tested is designed such that the grid pattern is used as a test reference point and the circuit connected to the test device passes through the position of the probe pin.
【０００７】前記格子状パターンは、複数種類の被試験
配線基板についてそれぞれ搭載される部品およびまたは
回路の共通な区分領域になるように設定することが望ま
しい。It is desirable that the grid pattern is set so as to be a common divisional area for components and / or circuits mounted on a plurality of types of wiring boards under test.
【０００８】本発明の第二は、被試験配線基板に接続す
るための多数のプローブピンが配列されたフィクスチャ
ーと、被試験配線基板の電気的な試験を行う電気回路と
を備えた配線基板の試験装置において、前記プローブピ
ンの配列パターンは、行および列方向の格子状であって
複数種類の被試験配線基板について共通のテスト基準ポ
イントとなる共通のパターンであり、被試験配線基板の
種類に応じて、前記電気回路とこの多数のプローブピン
の一部とが選択的に接続されることを特徴とする。A second aspect of the present invention is a wiring board provided with a fixture in which a large number of probe pins for connecting to the wiring board under test are arranged, and an electric circuit for electrically testing the wiring board under test. In the test device, the arrangement pattern of the probe pins is a common pattern that is a grid pattern in the row and column directions and is a common test reference point for a plurality of types of wiring boards under test. According to the above, the electric circuit and a part of the many probe pins are selectively connected.
【０００９】本発明の第三は、試験装置に装着するため
のテスト基準ポイントが複数種類の配線基板について共
通に行および列方向の格子状パターンに配列され、この
テスト基準ポイントの一部にその試験装置に電気的な接
続を行うための配線が施されたことを特徴とする。前記
格子状パターンは、複数種類の配線基板についてそれぞ
れ搭載される部品およびまたは回路の共通な区分領域に
設定されることが望ましい。In a third aspect of the present invention, test reference points for mounting on a test apparatus are commonly arranged in a grid pattern in the row and column directions for a plurality of types of wiring boards, and some of the test reference points are provided. It is characterized in that wiring is provided for making electrical connection to the test apparatus. It is desirable that the grid pattern is set in a common division area of components and / or circuits mounted on a plurality of types of wiring boards.
【００１０】[0010]
【作用】試験が行われる配線基板上にプローブとの接続
用のテスト基準ポイントを固定的に設け、配置する部品
のリード間を接続してパターン配線を行うときに、ひと
つの接続系列内で必ずテスト基準ポイントを１ヶ所以上
経由させる。この場合テスト基準ポイントと部品実装の
ためのスルーホールが同一位置となっても差支えない。[Operation] When the pattern reference wiring is fixed by providing fixed test reference points for connection to the probe on the wiring board to be tested and connecting the leads of the parts to be placed, it is necessary Pass one or more test reference points. In this case, it does not matter if the test reference point and the through hole for mounting the component are at the same position.
【００１１】これにより、配線基板の種類が異なっても
試験装置との接続がテスト基準ポイントを経由するた
め、実装される部品形状や部品間隔に影響されず一定と
なり、一つのフィクスチャーに複数の配線基板を対応さ
せることが可能となり、フィクスチャーの製作費および
管理工数を低減し、収納スペースを小さくすることがで
きるとともに、段取に要する時間を短縮することができ
る。As a result, even if the type of the wiring board is different, the connection with the test apparatus goes through the test reference point, so that it becomes constant regardless of the shape of the mounted components and the component spacing, and a plurality of fixtures can be attached to one fixture. The wiring board can be made compatible, the fixture manufacturing cost and management man-hours can be reduced, the storage space can be reduced, and the time required for setup can be shortened.
【００１２】[0012]
【実施例】次に、本発明実施例を図面に基づいて説明す
る。図１は本発明実施例における配線基板およびフィク
チャーの構成を示す図である。Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a diagram showing a configuration of a wiring board and a fixture according to an embodiment of the present invention.
【００１３】本発明実施例における配線基板の試験装置
は、被試験配線基板１−１〜１−ｎに接続するための多
数のプローブピン４が配列されたフィクスチャー２と、
被試験配線基板１−１〜１−ｎの電気的な試験を行う電
気回路とを備え、本発明の特徴として、プローブピン４
の配列パターンは、行および列方向の格子状であって複
数種類の被試験配線基板１−１〜１−ｎについて共通の
テスト基準ポイントとなる共通のパターンであり、被試
験配線基板１−１〜１−ｎの種類に応じて、前記電気回
路とこの多数のプローブピン４の一部とが選択的に接続
される。The wiring board testing apparatus according to the embodiment of the present invention includes a fixture 2 in which a large number of probe pins 4 for connecting to the wiring boards under test 1-1 to 1-n are arranged.
An electrical circuit for conducting an electrical test on the wiring board under test 1-1 to 1-n, and as a feature of the present invention, the probe pin 4 is provided.
Is a common pattern that is a grid pattern in the row and column directions and serves as a common test reference point for a plurality of types of wiring boards under test 1-1 to 1-n. The electric circuit and a part of the large number of probe pins 4 are selectively connected according to the types of 1 to 1-n.
【００１４】すなわち、被試験配線基板１−１〜１−ｎ
を装着するフィクスチャー２に、複数種類の被試験配線
基板１−１〜１−ｎについて共通に行および列方向の格
子状パターンに配列されたプローブピン４を設けてお
き、被試験配線基板１−１〜１−ｎにはこの格子状パタ
ーンをテスト基準ポイントとし、かつ、試験装置に接続
する回路をこのプローブピン４の位置を通過するように
設計され、前記格子状パターンは、複数種類の被試験配
線基板についてそれぞれ搭載される部品およびまたは回
路の共通な区分領域になるように設定される。That is, the wiring board under test 1-1 to 1-n
The fixture 2 to be mounted is provided with the probe pins 4 arranged in a grid pattern in the row and column directions commonly for a plurality of types of wiring boards under test 1-1 to 1-n. -1 to 1-n are designed so that this grid pattern is used as a test reference point and a circuit connected to a test device passes through the position of the probe pin 4, and the grid pattern has a plurality of types. The wiring board under test is set so as to be a common division area for the components and / or circuits to be mounted.
【００１５】また、配線基板は、試験装置に装着するた
めのテスト基準ポイントが複数種類の配線基板について
共通に行および列方向の格子状パターンに配列され、こ
のテスト基準ポイントの一部にその試験装置に電気的な
接続を行うための配線が施され、前記格子状パターン
は、複数種類の配線基板についてそれぞれ搭載される部
品およびまたは回路の共通な区分領域に設定される。In the wiring board, test reference points to be mounted on the test apparatus are arranged in a grid pattern in the row and column directions common to a plurality of types of wiring boards, and the test is carried out at some of the test reference points. Wiring for electrically connecting to the device is provided, and the grid pattern is set in a common divisional area of components and / or circuits mounted on a plurality of types of wiring boards.
【００１６】このように配線基板１−１〜１−ｎおよび
フィクスチャー２が構成されることにより、種類の異な
る配線基板が１−１〜１−ｎのいずれであっても、テス
ト基準ポイント３はフィクスチャー２のいずれかのプロ
ーブピン４に対応し、したがって一つのフィクスチャー
２で多種類の配線基板１−１〜１−ｎを試験することが
できる。By configuring the wiring boards 1-1 to 1-n and the fixture 2 as described above, the test reference point 3 is set regardless of which wiring boards of different types are 1-1 to 1-n. Corresponds to one of the probe pins 4 of the fixture 2, and therefore one fixture 2 can test various kinds of wiring boards 1-1 to 1-n.
【００１７】図２は本発明実施例に係わる配線基板のパ
ターン配線の一例を示す図、図３は本発明実施例に係わ
る配線基板回路の一例を示す図である。図２に示す接続
部ＡおよびＢは、図３に示すパターン配線ａおよびｂに
対応するもので、試験時には必ずテスト基準ポイント３
のいずれかを経由して接続されることになる。FIG. 2 is a diagram showing an example of the pattern wiring of the wiring board according to the embodiment of the present invention, and FIG. 3 is a diagram showing an example of the wiring board circuit according to the embodiment of the present invention. Connection portions A and B shown in FIG. 2 correspond to the pattern wirings a and b shown in FIG.
Will be connected via either.
【００１８】[0018]
【発明の効果】以上説明したように本発明によれば、、
複数種の配線基板をひとつのフィクスチャーで試験する
ことが可能となり、 １．被試験配線基板の種類毎のフィクスチャーが不要と
なるために、 １）フィクスチャーの製作費用が安くなる、 ２）収納スペースが狭くなる、 ３）種々の管理が少なくなる、 ２．試験時に配線基板の種類毎に対応するフィクスチャ
ーに交換する必要がなく段取り作業に要する時間を短縮
することができる、などの効果がある。As described above, according to the present invention,
It is possible to test multiple types of wiring boards with a single fixture. Since the fixture for each type of wiring board under test is unnecessary, 1) the manufacturing cost of the fixture is low, 2) the storage space is narrowed, 3) various management is reduced, There is an effect that it is not necessary to replace with a fixture corresponding to each type of wiring board at the time of testing, and the time required for setup work can be shortened.
【図１】本発明実施例における配線基板およびフィクス
チャーの構成を示す図。FIG. 1 is a diagram showing a configuration of a wiring board and a fixture according to an embodiment of the present invention.
【図２】本発明実施例に係わる配線基板のパターン配線
の一例を示す図。FIG. 2 is a diagram showing an example of pattern wiring of a wiring board according to an embodiment of the present invention.
【図３】本発明実施例に係わる配線基板回路の一例を示
す図。FIG. 3 is a diagram showing an example of a wiring board circuit according to an embodiment of the present invention.
１、１−１〜１−ｎ 配線基板 ２ フィクスチャー ３ テスト基準ポイント ４ プローブピン 1, 1-1 to 1-n Wiring board 2 Fixture 3 Test reference point 4 Probe pin
Claims (5)
ーに複数種類の被試験配線基板について共通に行および
列方向の格子状パターンに配列されたプローブピンを設
けておき、被試験配線基板にはこの格子状パターンをテ
スト基準ポイントとし、かつ、試験装置に接続する回路
をこのプローブピンの位置を通過するように設計するこ
とを特徴とする配線基板の試験方法。1. A fixture for mounting a wiring board under test is provided with probe pins arranged in a grid pattern in row and column directions commonly for a plurality of types of wiring board under test, and the wiring board under test is provided with the probe pins. A test method for a wiring board, wherein the grid pattern is used as a test reference point, and a circuit connected to a test device is designed to pass through the position of the probe pin.
験配線基板についてそれぞれ搭載される部品およびまた
は回路の共通な区分領域になるように設定する請求項１
記載の試験方法。2. The grid pattern is set so as to be a common divisional area of components and / or circuits mounted on a plurality of types of wiring boards under test.
Test methods described.
プローブピンが配列されたフィクスチャーと、被試験配
線基板の電気的な試験を行う電気回路とを備えた配線基
板の試験装置において、 前記プローブピンの配列パターンは、行および列方向の
格子状であって複数種類の被試験配線基板について共通
のテスト基準ポイントとなる共通のパターンであり、 被試験配線基板の種類に応じて、前記電気回路とこの多
数のプローブピンの一部とが選択的に接続されることを
特徴とする配線基板の試験装置。3. A wiring board test apparatus comprising: a fixture in which a large number of probe pins for connecting to a wiring board under test are arranged; and an electric circuit for electrically testing the wiring board under test. The probe pin array pattern is a grid pattern in the row and column directions and is a common pattern that serves as a common test reference point for a plurality of types of wiring boards under test. An apparatus for testing a wiring board, characterized in that an electric circuit and a part of the many probe pins are selectively connected.
イントが複数種類の配線基板について共通に行および列
方向の格子状パターンに配列され、このテスト基準ポイ
ントの一部にその試験装置に電気的な接続を行うための
配線が施されたことを特徴とする配線基板。4. The test reference points for mounting on the test apparatus are arranged in a grid pattern in the row and column directions commonly for a plurality of types of wiring boards, and some of the test reference points are electrically connected to the test apparatus. A wiring board having wiring for various connections.
基板についてそれぞれ搭載される部品およびまたは回路
の共通な区分領域に設定された請求項４記載の配線基
板。5. The wiring board according to claim 4, wherein the grid-shaped pattern is set in a common division area of components and / or circuits mounted on a plurality of types of wiring boards.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5298353A JPH07154053A (en) | 1993-11-29 | 1993-11-29 | Wiring board, and method and device for testing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5298353A JPH07154053A (en) | 1993-11-29 | 1993-11-29 | Wiring board, and method and device for testing the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07154053A true JPH07154053A (en) | 1995-06-16 |
Family
ID=17858590
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5298353A Pending JPH07154053A (en) | 1993-11-29 | 1993-11-29 | Wiring board, and method and device for testing the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07154053A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007281101A (en) * | 2006-04-05 | 2007-10-25 | Meidensha Corp | Printed wiring structure of control board |
| WO2019151722A1 (en) * | 2018-01-31 | 2019-08-08 | 삼성전자 주식회사 | Electronic device capable of sensing error occurrence in connector to which electrical components are attached |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS625672B2 (en) * | 1979-12-13 | 1987-02-05 | Tokyo Shibaura Electric Co | |
| JPS6245567A (en) * | 1985-08-26 | 1987-02-27 | Mitsui Toatsu Chem Inc | Continuous production of tolylenediamine |
| JPS62162979A (en) * | 1986-01-11 | 1987-07-18 | Nec Corp | Individual air cylinder type universal fixture |
| JPH0526965A (en) * | 1991-07-23 | 1993-02-05 | Mitsubishi Electric Corp | Circuit board and circuit board tester |
-
1993
- 1993-11-29 JP JP5298353A patent/JPH07154053A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS625672B2 (en) * | 1979-12-13 | 1987-02-05 | Tokyo Shibaura Electric Co | |
| JPS6245567A (en) * | 1985-08-26 | 1987-02-27 | Mitsui Toatsu Chem Inc | Continuous production of tolylenediamine |
| JPS62162979A (en) * | 1986-01-11 | 1987-07-18 | Nec Corp | Individual air cylinder type universal fixture |
| JPH0526965A (en) * | 1991-07-23 | 1993-02-05 | Mitsubishi Electric Corp | Circuit board and circuit board tester |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007281101A (en) * | 2006-04-05 | 2007-10-25 | Meidensha Corp | Printed wiring structure of control board |
| WO2019151722A1 (en) * | 2018-01-31 | 2019-08-08 | 삼성전자 주식회사 | Electronic device capable of sensing error occurrence in connector to which electrical components are attached |
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