JPH0814610B2 - Circuit board inspection equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION Object of the Invention (Field of Industrial Application) The present invention uses an electronic circuit board assembled by mounting various electronic components on a circuit board as an object to be inspected. The present invention relates to a circuit board inspection device that inspects the function of

(Prior Art) In this type of circuit board inspection device, a member called a test fixture is arranged between the circuit board and the tester, and by connecting the pattern surface of the circuit board and the output terminal of the tester, A functional test of the circuit board is performed.

Here, the conventional test fixture needs to be replaced with the entire test fixture each time the type of the substrate is changed, and it is inevitable to create a unique test fixture for each circuit board.

Further, as shown in FIG. 5, in order to connect the test fixture to the probe base 100 arranged on the circuit board side, the connector base 101 arranged on the tester side, and the probe base 100 and the connector base 101. It is also conceivable that the probe base 100 and the connection exchange base 102 of FIG.

However, in this case, when connecting the connection exchange base 102 and the connector base 101, the auxiliary connector base 103 was used and this wiring was laid out as shown in the figure.

(Problems to be Solved by the Invention) As described above, a test fixture may be prepared for each circuit board and replaced every time the type of board changes.
There is a problem that the cost becomes high and the replacement work is extremely complicated in the case of recent production of small quantities of various products.

Further, in the test fixture shown in FIG. 5, even if some parts can be standardized, the connection exchange base 102
The connection between the connector base 101 and the auxiliary connector base 103 is manual wiring, which does not reduce the burden on the operator.

Further, as a big problem, in the case shown in FIG. 5, the conductive distance of the signal system from the tester to the probe tip of the probe base 100 is as long as about 100 cm, so that the signal from the tester can be accurately transmitted to the circuit board. It was often not transmitted, making it difficult to perform accurate inspections.

Therefore, an object of the present invention is to solve the above-mentioned conventional problems, and even if the type of the circuit board is changed, it can be easily dealt with by exchanging only some of the components. It is an object of the present invention to provide a circuit board inspection device capable of performing an accurate inspection by connecting a tester and a tester at the shortest distance.

[Structure of the Invention] (Means for Solving Problems) According to the present invention, a circuit board is mounted and fixed on a test fixture, and the circuit board and the tester are connected to each other by the test fixture. In a circuit board inspecting device that performs a function test of a circuit board, a probe base that is arranged so as to face the pattern surface of the circuit board and has first probe pins arranged and supported at each matrix position at a predetermined pitch, and each output terminal of the tester. Is disposed between the connector base and the connector base in which the second probe pins are arrayed and supported so that the first probe pins can be brought into contact with the circuit board according to the type of the inspection target. And a connection conversion base having arrayed connection pins for electrically connecting the first and second probe pins, and the probe base. First driving means for varying a facing distance between the connection conversion base and the connection exchange base; second driving means for varying a facing distance between the connection conversion base and the connector base; A sensor for detecting contact between the first probe pin, the connection pin and the second probe pin after driving the second drive means.

Another invention is to mount and fix a circuit board on a test fixture, and connect the circuit board and the tester by this test fixture to perform a function inspection of the circuit board. A probe base that is arranged so as to face the pattern surface and that supports and supports a first probe pin at each position in a matrix at a predetermined pitch, and a connector that supports and supports a second probe pin so that it can contact each output terminal of the tester. The base is disposed between the probe base and the connector base, and the first probe pin is brought into contact with the circuit board according to the type of the inspection target, and the first and second probe pins are electrically connected. And a connection conversion base that supports connection pins arranged in an array, and the connection conversion base is supported by the connection conversion base. A lifter pin that pushes up one probe pin to bring it into contact with the circuit board and does not come into contact with the second probe pin; and a pusher pin that does not push up the first probe pin and does not come into contact with this pin, but comes into contact with the second probe pin. Connector pin, a through pin that pushes up the first probe pin and contacts the second probe pin, and a pair that pushes up the first probe pin via an insulating cap and contacts the second probe pin. And a first probe pin that is electrically connected to the lifter pin and the connector pin and that is pushed up by one of the pair of replacement adapter pins and the other replacement adapter pin. Constructed by electrically connecting to each other using a conductor mounted on the cap Characterized in that was.

(Operation) In the present invention, the connection conversion base is prepared according to the type of the circuit board, and the connection conversion base according to the inspection object is arranged between the probe base and the connector base.

Here, connection pins are arranged and supported on the connection conversion base according to the type of the circuit board to be inspected, and the connection pins support the first probe pins of the probe base and the second pins of the connector base. By connecting the first probe pin to the circuit board and the second probe pin to the tester, the circuit board and the tester can be easily connected.

At this time, when the type of the circuit board is changed, only the connection conversion base needs to be replaced, and the replacement work and the cost are greatly reduced.

Moreover, the tester and the circuit board can be secured by the contact of the first probe pin, the connection pin, and the second probe pin, so that the tester and the circuit board can be connected at the shortest distance, and the accurate inspection is always performed. Can be executed.

Further, in the present invention, the first and second probe pins and the connecting pin can be brought into contact with each other by variably driving the distance between the three bases facing each other. Therefore, at the time of replacement of the connection conversion base, the connection pins are in non-contact with the first and second probe pins, so that the connection conversion base can be easily replaced.

In addition, before performing a functional inspection of the circuit board,
Since mutual contact between the first and second probe pins and the connection pin is detected by the sensor in advance, it is possible to prevent an inaccurate inspection in a poor connection state.

According to another aspect of the present invention, the connector pin, the through pin, and the pair exchange adapter pin are used when it is not possible to simply connect the second probe pins, which are vertically opposed to the first probe pin, to each other. This makes it possible to electrically connect the first and second probe pins that do not face each other vertically.

(Example) Hereinafter, one example to which the present invention is applied will be specifically described with reference to the drawings.

First, an outline of the entire apparatus of the embodiment will be described with reference to FIG.

The apparatus of the present embodiment is roughly classified into a circuit board 1 on which an electronic component, which is an object to be inspected, is mounted, a tester 10 for executing a function test of the circuit board 1, and the circuit board 1 are fixedly installed. In addition, the test fixture 20 is configured to connect the tester 10 and the circuit board 1 through various pins connected to the pattern surface of the circuit board 1.

The tester 10 includes a lifter 11 that supports the test fixture 20 so that the test fixture 20 can move up and down, a locating pin 12 that is an example of a guide member that positions and guides a support base 21 of the test fixture 20, which will be described later, and the support base. The vacuum port 13 for vacuum suction of 21 and the tester 10 on the surface facing the test fixture 20.
Contact probe with spring 14 which is the output terminal of
And is configured.

Next, the test fixture 20 which is a characteristic configuration of the apparatus of this embodiment will be described with reference to FIGS. 1 and 2.

The test fixture 20 includes a probe base 30,
It has a connection conversion base (hereinafter abbreviated as CTB) 40 and a connector base 50, and various connection pins, which will be described later, are arranged on each of the bases 30, 40, 50, and the circuit board 1 and the tester 10
It is designed to connect with. In the case of the present embodiment, the probe base 30 and the connector base 50 are
It can be commonly used regardless of the type of the circuit board 1, and when the type of the circuit board 1 changes, only the CTB 40 needs to be changed to a unique one for the board 1. ing.

First, the mounting structure of each base 30, 40, 50 will be described. As shown in FIG.
A support base 21 serving as a base of 20 is provided, and the connector base 50 is fixed to the support base 21. A support 22 is vertically supported and fixed to the support base 21, and the support 22 is used as a guide for the probe base.
30 and CTB40 are supported so that they can move up and down.

The CTB 40 is supported as follows so that it can be easily replaced according to the type of various circuit boards 1.
That is, it has a movement guide member 23 that is movable along the column 22 and has a groove 23a on the opposite surface, and the groove 23a of the movement guide member 23 has a U-shaped cross-section movement rail. 24 are arranged. The CTB 40 is movably supported along the moving rail 24 in the direction from the front surface to the back surface in FIG.

Further, the probe base with respect to the support base 21.
30, 1st, 2nd to move connector base 50
Air cylinders 25 and 26 are provided.

The first air cylinder 25 fixed to the movement guide member 23 allows the movement guide member 23, that is, the CTB 40, to move in a direction approaching the probe base 30, and the second air cylinder 25 fixed to the support base 21. Support base for the probe base 30 by the air cylinder 26
It is possible to move to the 21st side.

 Next, the probe base 30 will be described.

The probe base 30 is a base that supports the first probe pin 31 that is in contact with the pattern surface of the circuit board 1 opposite to the component mounting surface. In this embodiment, the first
The probe pins 31 are vertically and horizontally arranged at a pitch of, for example, 1/10 inch, and a total of about 20,000 pieces are arranged and supported at each point in a matrix.

As described above, the reason why the first probe pins 31 are subdivided at the respective matrix-shaped positions in the present embodiment is that the probe base 30 can be commonly used for various circuit boards 1. is there.

That is, the minimum terminal pitch of electronic parts is 1/10 inch
Thus, by arranging the first probe pins 31 in the vertical and horizontal directions, the first probe pin 31 of any one of these can be used regardless of the pattern difference of the circuit board 1.
The probe pins 31 can be brought into contact with the pattern surface of the circuit board 1 as needed, and can be used for inspection of various circuit boards 1 without changing the probe base 30.

As shown in detail in FIG. 2, the first probe pin 31 has connection pieces 32 electrically connected to both ends thereof, and a stopper 33 provided above the intermediate portion. The connecting piece 32 has a double spring probe pin structure so as to be urged toward both ends in the axial direction, which is the arrow direction in the figure.

The first probe pin 31 is connected to the probe base 30.
When the stopper 33 is inserted into the insertion hole 30a formed in the above, and the stopper 33 contacts the upper end of the insertion hole 30a, it is supported at a predetermined position by its own weight.

In addition, on the upper surface of the probe base 30, each of the first
A pin guide plate 35 having guide holes 35a corresponding to the arrangement position of the probe pins 31 is attached and guided by a plate guide 36, and is constantly urged upward by a compression coil spring 37. The first probe pin 31 can be accurately brought into contact with the pattern surface of the circuit board 1 by being inserted into the guide hole 35a. Further, guide pins 38 for the circuit board 1 are vertically installed on the pin guide plate 35,
The substrate 1 can be accurately positioned on the pin guide plate 35.

 Next, the connector base 50 will be described.

The connector base 50 contacts the spring contact probe 14 of the tester 10 and the CT
It is a base that has a function as a connector by contacting various pins of B40.
A second probe pin 51 is supported at each position facing the contact probe with spring 14 of FIG. still,
The connecting piece 52 at the upper end of the second probe pin 51 is constantly urged upward by a spring. Further, although not shown, a guide hole which is a guided member to be inserted into the locating pin 12 of the tester 10 is formed in the connector base 50, and accurate positioning with the tester side is performed. It is like this.

Since the connector base 50 is vacuum-sucked to the tester 10 side, as will be described later, it has a structure for preventing air from flowing into the tester 10 side.

Next, using FIG. 2 in the actual operating state, the CT
The configuration of B40 will be described.

In this CTB 40, the probe base 30 and the connector base 50 are commonly used for various boards 1, so that four types of connection pins are arranged and supported according to the pattern of various circuit boards 1.

The four types of connection pins will be described with reference to FIG. 2. The lifter pin 41 has a size such that it contacts the first probe pin 31 on the probe base 30 side and pushes it upward. It is formed so as not to contact the second probe pin 5 on the lower connector base 50 side.

The connector pin 42 has a size that does not contact the first probe pin 31 on the probe base 30 side, and
The second probe pin 51 on the lower connector base 50 side is in contact with and pushed down by the second probe pin 51.

The lifter pin 41 and the connector pin 42 are electrically connected by a connecting wire 43. Therefore, by using the lifter pin 41 and the connector pin 42, it is possible to connect the first and second probe pins 31, 51 which are not vertically opposed to each other.

The through pin 44 means the upper and lower first and second probe pins 3
The dimensions are such that both 1,51 are pushed up and pushed down, and the first and second probe pins 31,51 which are vertically opposed to each other are connected.

The exchange adapter pin 45 is dimensionally similar to the through pin 44 in that the upper and lower first probe pins 31 and 51 are pushed up and pushed down, but an insulating layer having a conductive layer 46a formed on the upper surface is formed at the upper end thereof. The cap 46 is attached.
As a result, the first probe pin 31 is electrically connected to the conductive layer 46a, but the replacement adapter pin 45 and the first probe pin 31 are insulated.

The two exchange adapter pins 45 are used as a pair, and one end of the exchange wiring 47 wound around the middle portion of the one exchange adapter pin 45 is connected to the insulation cap 46 of the other exchange adapter pin 45. It is designed to be used by connecting to the conductive layer 46a.

As a result, by using the pair of exchange adapter pins 45 for the two first probe pins 31, 31 that come into contact with the pattern of the circuit board 1, there is a second reverse
It can be connected to each probe pin 51 of.

 Next, the operation of the inspection device will be described.

First, the circuit board 1 as the object to be inspected is set in this inspection apparatus, and the CTB40 unique to the set circuit board 1 is set.
Is selected, and this is inserted into the movement rail 24 of the movement guide member 23 and mounted. Then, the CTB 40 is moved along the moving rail 24 and is arranged below the pin guide plate 35 on which the circuit board 1 is set.

Next, the first air cylinder 25 is driven to drive the CTB4
The movement guide member 23 holding 0 is moved upward. After that, the second air cylinder 26 is driven, and the probe base 30 and the CTB 40 are integrally moved downward.

By such movement, it is possible to secure the connection state of various pins as shown in FIG.

Here, the probe base 30 in contact with the circuit board 1
The first probe pin 31 above is the one pushed up by the lifter pin 41, the one pushed up by the through pin 44,
There are three types, one pushed up by the exchange adapter pin 45. Since the other first probe pins 31 are not projected beyond the pin guide plate 35, the circuit board 1
Is not connected.

Here, in the present embodiment, the first probe pin 31
Is provided at each position of the matrix with the minimum terminal pitch of the electronic component, and the above-mentioned pins 41, 44, 45 of the CTB 40 specific to the circuit board 1 to be set are used to connect only the first probe pin 31. Is pushed up and used.

As a result, even when many types of circuit boards 1 are used in this inspection device, a CTB40 corresponding to the circuit board 1 is created in advance, and only this CTB40 is replaced according to the board 1. It can be used as an inspection device without any other change. Compared to the conventional one, which requires a large number of parts to be changed according to the circuit board 1, and which uses a large number of members. The versatility is greatly improved and the burden on the inspector can be significantly reduced.

In addition, when the probe base 30 and the connector base 50 are used in common regardless of the type of the circuit board 1 as described above, the first probe pin 31 of the probe base 30 is arranged on the connector base 50 which is in a vertical relationship with the first probe pin 31. 2 probe pins
Simple connection to 51 may be limited in connection with the test function of the tester 10.

Therefore, in this embodiment, the CTB 40 has four types of pins 41, 4
2, 44, 45 are arranged according to various circuit boards 1, and the relationship between the connected first and second probe pins 31, 51 can be changed.

As described above, after the setting of the connection state in the test fixture 20 is completed, the vacuum port of the tester 10 is set.
The second probe pin supported by the connector base 50 is vacuum-sucked by 13, and the support base 21 that is the base of the test fixture 20 is sucked toward the tester 10.
The lower end of 51 is brought into contact with the contact probe with spring 14 of the tester 10.

Here, the tester 10 can energize the circuit board 1 to perform a predetermined function test.

The present invention is not limited to the above embodiment,
Various modifications can be made within the scope of the present invention.

For example, the following members may be added to the apparatus of the above embodiment to ensure the reliability of inspection and the improvement of workability.

That is, as shown in FIG. 4, the following members are connected to the CPU 60 which controls the inspection device.

First, the first sensor 61 detects the connection state between the CTB 40 and the probe base 30 connected by the first air cylinder 25. As the sensor 61, for example, the first probe pin 31 is used. And lifter pin 41
Can be used to detect that the contact resistances of the pins 31 and 41 are below a predetermined value.

The second sensor 62 is connected to the second air cylinder 26.
The connection state of the three bases 30, 40, 50 connected by is detected.

As the second sensor 62, the first sensor
Similar to 61, of the pins supported by the bases 30, 40, 50, for example, the first and second probe pins 31, 51 and the through pin 44 can be used, and the contact resistance between them is predetermined. It can be configured to detect when the value is less than or equal to the value.

The first and second sensors 61 and 62 are not limited to those using the pins supported by the base as described above, and various other sensors such as an optical sensor can be used.

The drive motor 63 automatically conveys the CTB 40 along the moving rail 24, and is driven based on an input from the operation key 64, for example. Also, as shown in FIG.
The second air cylinders 25 and 26 have the same functions as those shown in FIG.

Here, when performing the inspection, when the CTB 40 is set on the moving rail 24 and the operation key 64 is operated, the drive motor 63 is driven by the CPU 60, and the CTB 40 is automatically conveyed to a position facing the substrate 1. Become.

Next, the first air cylinder 25 is driven by the CPU 60 to move the CTB 40 to the probe base 30 side.

After the first sensor 61 confirms the connection state of the pins of the bases 30 and 40, the CPU 60 drives the second air cylinder 26 to move the probe base 30 and the CTB 40 to the connector base 50 side. Will be moved to.

Then, after the second sensor 62 confirms the connection state of the pins of each of the bases 30, 40, 50, the subsequent steps are performed.

In this way, since the connection state is confirmed by the sensor after each base is moved, it is possible to eliminate the inspection under the connection failure, and it is possible to always perform the reliable inspection. Also, by automatically transporting the CTB40, the burden of inspection is greatly reduced.

[Effects of the Invention] As described above, according to the present invention, the probe base and the connector base can be used in common even when the type of the circuit board to be inspected is changed. Since only the connected connection conversion base needs to be exchanged, the versatility is significantly improved as compared with the conventional one, and the inspection cost can be reduced.

Moreover, since the circuit board and the tester are connected by connecting the pins supported by the three types of bases, the connection can be made in the shortest distance, and the inspection signal is improved especially at high frequencies, and accurate inspection is performed. can do.

[Brief description of drawings]

FIG. 1 is a schematic sectional view of a test fixture in a circuit board multifunctional inspection apparatus according to an embodiment of the present invention, and FIG. 2 shows a connection state of various pins in the test fixture in the inspection apparatus of FIG. FIG. 3 is a schematic explanatory view showing dimensionally in an actual operation state, FIG. 3 is a schematic perspective view showing an overall configuration of a circuit board inspection device using the test fixture of FIG. 1, and FIG. 4 is an embodiment device of FIG. FIG. 5 is a block diagram of a control system applied to, and FIG. 5 is a schematic explanatory view showing the structure of a test fixture in a conventional inspection device. 1 ... Circuit board, 10 ... Tester, 20 ... Test fixture, 21 ... Support base, 25 ... First air cylinder, 26 ... Second air cylinder, 30 ... Probe base, 31 ... ... 1st probe pin, 40 ... connection conversion base, 41 ... lifter pin, 42 ... connector pin, 44 ... through pin, 45 ... replacement adapter pin, 50 ... connector base, 51 ... second Probe pins, 61, 62 ... Sensors.

Claims (6)

[Claims] 1. A circuit board inspecting device for inspecting the function of a circuit board by mounting and fixing the circuit board on a test fixture and connecting the circuit board and the tester by the test fixture. A probe base that is arranged so as to face the pattern surface and that supports and supports a first probe pin at each position in a matrix at a predetermined pitch, and a connector that supports and supports a second probe pin so that it can contact each output terminal of the tester. The base is disposed between the probe base and the connector base, and the first probe pin is brought into contact with the circuit board according to the type of the inspection target, and the first and second probe pins are electrically connected. The connection conversion base, which supports the connection pins to be connected electrically, and the facing distance between the probe base and the connection exchange base. A first driving unit that changes; a second driving unit that changes a facing distance between the connection conversion base and the connector base; and a first driving unit that drives the first and second driving units. And a sensor that detects that the probe pin, the connection pin, and the second probe pin are in contact with each other. 2. The connection conversion base is supported by a moving member that is slidable with respect to the probe base and the connector base, and at a position that is opposed to the circuit board with respect to the moving member. The circuit board inspection device according to claim 1, which is supported so as to be slidably movable. 3. A circuit board inspecting device for inspecting the function of a circuit board by mounting and fixing the circuit board on a test fixture and connecting the circuit board and the tester by the test fixture. A probe base that is arranged so as to face the pattern surface and that supports and supports a first probe pin at each position in a matrix at a predetermined pitch, and a connector that supports and supports a second probe pin so that it can contact each output terminal of the tester. The base is disposed between the probe base and the connector base, and the first probe pin is brought into contact with the circuit board according to the type of the inspection target, and the first and second probe pins are electrically connected. And a connection conversion base that supports connection pins arranged in an array, and the connection conversion base is supported by the connection conversion base. A lifter pin that pushes up one probe pin to bring it into contact with the circuit board and does not come into contact with the second probe pin; and a pusher pin that does not push up the first probe pin and does not come into contact with this pin, but comes into contact with the second probe pin. Connector pin, a through pin that pushes up the first probe pin and contacts the second probe pin, and a push pin that pushes up the first probe pin through an insulating cap and contacts the second probe pin A pair of exchange adapter pins, and electrically connecting the lifter pin and the connector pin, and one of the pair of exchange adapter pins and a first probe pin pushed up by the other exchange adapter pin, Constructed by electrically connecting to each other using a conductor mounted on an insulating cap Circuit board inspection device, characterized in that the. 4. The circuit according to claim 3, wherein each base is supported by a support base, and the support base is moved to the tester side to connect the second probe pin and the output terminal of the tester. Substrate inspection device. 5. The circuit according to claim 4, wherein the support base has a guided member that engages with a guide member arranged on the tester side, and is configured to guide the movement of the support base. Substrate inspection device. 6. A first air cylinder for slidingly moving the connection conversion base with respect to the probe base, a second air cylinder for slidingly moving the probe base with respect to a connector base fixed to the support base, and a probe. A sensor having a sensor for detecting contact between the first probe pin of the base and the connecting pin of the connection conversion base, and configured to drive the second air cylinder after the contact is detected by this sensor. The circuit board inspection device according to any one of claims 3 to 5.