JPS6283979U - - Google Patents
Info
- Publication number
- JPS6283979U JPS6283979U JP17474185U JP17474185U JPS6283979U JP S6283979 U JPS6283979 U JP S6283979U JP 17474185 U JP17474185 U JP 17474185U JP 17474185 U JP17474185 U JP 17474185U JP S6283979 U JPS6283979 U JP S6283979U
- Authority
- JP
- Japan
- Prior art keywords
- connection mechanism
- wiring board
- printed wiring
- main body
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案を説明するための模式図、第２
図は本考案の一実施例を示す模式図である。
図において、１は印刷配線板、２は回路素子（
（ＬＳＩ）、３はプローバー本体、４は試験器、
５は接続機構部を示す。
Figure 1 is a schematic diagram for explaining the present invention, Figure 2 is a schematic diagram for explaining the present invention.
The figure is a schematic diagram showing an embodiment of the present invention. In the figure, 1 is a printed wiring board, 2 is a circuit element (
(LSI), 3 is the prober body, 4 is the tester,
5 indicates a connecting mechanism section.
Claims (1)
端子の状態を試験するプローバー本体３と試験器
４とからなる測定装置において、前記印刷配線板
１にスルーホール１―２を設けるとともに、前記
端子に当接する接触片５―１と前記スルーホール
１―２に挿脱自在なピン５―２とを有する接続機
構部５を備え、前記プローバー本体３と前記接続
機構部５とを一体的に構成したことを特徴とする
測定端子接続機構。 In a measuring device consisting of a prober main body 3 and a tester 4 for testing the state of the terminals of a circuit element 2 mounted on a printed wiring board 1 and in operation, a through hole 1-2 is provided in the printed wiring board 1, and the The prober main body 3 and the connection mechanism part 5 are integrally provided with a connection mechanism part 5 having a contact piece 5-1 that comes into contact with a terminal and a pin 5-2 that can be inserted into and removed from the through hole 1-2. A measurement terminal connection mechanism characterized by comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17474185U JPS6283979U (en) | 1985-11-12 | 1985-11-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17474185U JPS6283979U (en) | 1985-11-12 | 1985-11-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6283979U true JPS6283979U (en) | 1987-05-28 |
Family
ID=31113412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17474185U Pending JPS6283979U (en) | 1985-11-12 | 1985-11-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6283979U (en) |
-
1985
- 1985-11-12 JP JP17474185U patent/JPS6283979U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6283979U (en) | ||
| JPS62108874U (en) | ||
| JPS608882U (en) | Fixture for insert kit tester | |
| JPS6234383U (en) | ||
| JPH0299586U (en) | ||
| JPS6218676U (en) | ||
| JPS60111284U (en) | Printed circuit board measuring device | |
| JPS5827784U (en) | Probe fixing jig | |
| JPS6253368U (en) | ||
| JPS61102042U (en) | ||
| JPS61187478U (en) | ||
| JPS59125837U (en) | Semiconductor inspection equipment | |
| JPS6148380U (en) | ||
| JPS59164245U (en) | IC socket | |
| JPS61163989U (en) | ||
| JPS6280333U (en) | ||
| JPS60109326U (en) | Semiconductor pseudo test equipment | |
| JPH028885U (en) | ||
| JPS6251279U (en) | ||
| JPS59168173U (en) | Probe unit for printed circuit board circuit inspection | |
| JPS60141563U (en) | Conductive coating resistance measuring device | |
| JPS62174283U (en) | ||
| JPS581175U (en) | Terminal mechanism for test points | |
| JPS635479U (en) | ||
| JPS59103288U (en) | resistance measurement circuit |