JPS6148380U - - Google Patents
Info
- Publication number
- JPS6148380U JPS6148380U JP13475884U JP13475884U JPS6148380U JP S6148380 U JPS6148380 U JP S6148380U JP 13475884 U JP13475884 U JP 13475884U JP 13475884 U JP13475884 U JP 13475884U JP S6148380 U JPS6148380 U JP S6148380U
- Authority
- JP
- Japan
- Prior art keywords
- lsi
- socket
- terminal
- changeover switch
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案による一実施例を示す要部模式
図、第２図は従来装置の要部斜視図、第３図は測
定動作を説明するためのブロツク図である。
７：テストソケツト、８：ＬＳＩ装着端子、９
：ケーブル、１１：切換スイツチ、１２：電源供
給端子。
FIG. 1 is a schematic diagram of the main parts showing an embodiment of the present invention, FIG. 2 is a perspective view of the main parts of a conventional device, and FIG. 3 is a block diagram for explaining the measurement operation. 7: Test socket, 8: LSI mounting terminal, 9
: Cable, 11: Selector switch, 12: Power supply terminal.
Claims (1)
設け、該ソケツトの各端子を信号線を介してＬＳ
Ｉをテストするための駆動回路に接続してＬＳＩ
を試験する装置において、ＬＳＩのリード端子を
装着するソケツト端子に、少なく共電源供給用端
子を除いて他のソケツト端子に直列に切換スイツ
チを挿入してなることを特徴とするＬＳＩの試験
装置。 (2) 前記切換スイツチは非導通状態に保持され
てＬＳＩの消費電流が測定されることを特徴とす
る請求の範囲第１項記載のＬＳＩの試験装置。[Claims for Utility Model Registration] (1) A socket is provided for mounting the LSI lead terminal, and each terminal of the socket is connected to the LSI through a signal line.
Connect to the drive circuit for testing the LSI
This LSI testing device is characterized in that a changeover switch is inserted in a socket terminal into which a lead terminal of the LSI is attached, and in series with the other socket terminals except for a common power supply terminal. (2) The LSI testing apparatus according to claim 1, wherein the changeover switch is held in a non-conductive state to measure the current consumption of the LSI.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13475884U JPS6148380U (en) | 1984-09-04 | 1984-09-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13475884U JPS6148380U (en) | 1984-09-04 | 1984-09-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6148380U true JPS6148380U (en) | 1986-04-01 |
Family
ID=30693263
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13475884U Pending JPS6148380U (en) | 1984-09-04 | 1984-09-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6148380U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6384131A (en) * | 1986-09-29 | 1988-04-14 | Matsushita Electronics Corp | Device for inspecting semiconductor device |
-
1984
- 1984-09-04 JP JP13475884U patent/JPS6148380U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6384131A (en) * | 1986-09-29 | 1988-04-14 | Matsushita Electronics Corp | Device for inspecting semiconductor device |
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