JPS6148380U - - Google Patents

Info

Publication number
JPS6148380U
JPS6148380U JP13475884U JP13475884U JPS6148380U JP S6148380 U JPS6148380 U JP S6148380U JP 13475884 U JP13475884 U JP 13475884U JP 13475884 U JP13475884 U JP 13475884U JP S6148380 U JPS6148380 U JP S6148380U
Authority
JP
Japan
Prior art keywords
lsi
socket
terminal
changeover switch
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13475884U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13475884U priority Critical patent/JPS6148380U/ja
Publication of JPS6148380U publication Critical patent/JPS6148380U/ja
Pending legal-status Critical Current

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Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案による一実施例を示す要部模式
図、第2図は従来装置の要部斜視図、第3図は測
定動作を説明するためのブロツク図である。 7:テストソケツト、8:LSI装着端子、9
:ケーブル、11:切換スイツチ、12:電源供
給端子。
FIG. 1 is a schematic diagram of the main parts showing an embodiment of the present invention, FIG. 2 is a perspective view of the main parts of a conventional device, and FIG. 3 is a block diagram for explaining the measurement operation. 7: Test socket, 8: LSI mounting terminal, 9
: Cable, 11: Selector switch, 12: Power supply terminal.

Claims (1)

【実用新案登録請求の範囲】 (1) LSIのリード端子を装着するソケツトを
設け、該ソケツトの各端子を信号線を介してLS
Iをテストするための駆動回路に接続してLSI
を試験する装置において、LSIのリード端子を
装着するソケツト端子に、少なく共電源供給用端
子を除いて他のソケツト端子に直列に切換スイツ
チを挿入してなることを特徴とするLSIの試験
装置。 (2) 前記切換スイツチは非導通状態に保持され
てLSIの消費電流が測定されることを特徴とす
る請求の範囲第1項記載のLSIの試験装置。
[Claims for Utility Model Registration] (1) A socket is provided for mounting the LSI lead terminal, and each terminal of the socket is connected to the LSI through a signal line.
Connect to the drive circuit for testing the LSI
This LSI testing device is characterized in that a changeover switch is inserted in a socket terminal into which a lead terminal of the LSI is attached, and in series with the other socket terminals except for a common power supply terminal. (2) The LSI testing apparatus according to claim 1, wherein the changeover switch is held in a non-conductive state to measure the current consumption of the LSI.
JP13475884U 1984-09-04 1984-09-04 Pending JPS6148380U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13475884U JPS6148380U (en) 1984-09-04 1984-09-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13475884U JPS6148380U (en) 1984-09-04 1984-09-04

Publications (1)

Publication Number Publication Date
JPS6148380U true JPS6148380U (en) 1986-04-01

Family

ID=30693263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13475884U Pending JPS6148380U (en) 1984-09-04 1984-09-04

Country Status (1)

Country Link
JP (1) JPS6148380U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6384131A (en) * 1986-09-29 1988-04-14 Matsushita Electronics Corp Device for inspecting semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6384131A (en) * 1986-09-29 1988-04-14 Matsushita Electronics Corp Device for inspecting semiconductor device

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