JPS62104165U - - Google Patents

Info

Publication number
JPS62104165U
JPS62104165U JP19426685U JP19426685U JPS62104165U JP S62104165 U JPS62104165 U JP S62104165U JP 19426685 U JP19426685 U JP 19426685U JP 19426685 U JP19426685 U JP 19426685U JP S62104165 U JPS62104165 U JP S62104165U
Authority
JP
Japan
Prior art keywords
calibration signal
switch
under test
generating circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19426685U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19426685U priority Critical patent/JPS62104165U/ja
Publication of JPS62104165U publication Critical patent/JPS62104165U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案に係るプローブの実施例を示
す回路図である。第２図は従来のプローブを示す
回路図である。 １１；校正信号発生回路、１２；ハウジング、
１３；プローブ・チツプ、１４；入力抵抗、１５
；コンデンサ、１６；コネクタ、１７；電源部、
ＳＷ１；スイツチ手段を構成する第１のスイツチ
、ＳＷ２；スイツチ手段を構成する第２のスイツ
チ。 FIG. 1 is a circuit diagram showing an embodiment of the probe according to this invention. FIG. 2 is a circuit diagram showing a conventional probe. 11; Calibration signal generation circuit, 12; Housing,
13; Probe chip, 14; Input resistance, 15
;Capacitor, 16;Connector, 17;Power supply part,
SW1: a first switch constituting a switch means, SW2: a second switch constituting a switch means.

Claims (1)

【実用新案登録請求の範囲】 (1) 校正用信号発生回路と、その校正用信号発
生回路からの校正信号または被測定物からの被測
定信号のいずれか一方を選択してオシロスコープ
の入力端に接続されるコネクタに供給するスイツ
チ手段とをハウジング内に設けたことを特徴とす
るプローブ。 (2) 校正用信号発生回路は、その電源部を含め
てハウジング内に設けた実用新案登録請求の範囲
第１項記載のプローブ。 (3) スイツチ手段は、校正用信号発生回路から
の校正信号または被測定物からの被測定信号のい
ずれか一方を選択する第１のスイツチと、その第
１のスイツチと連動し校正用信号発生回路の電源
部をオンオフする第２のスイツチとで構成された
実用新案登録請求の範囲第１項記載のプローブ。[Scope of Claim for Utility Model Registration] (1) A calibration signal generating circuit, and selecting either the calibration signal from the calibration signal generating circuit or the signal under test from the object under test and inputting it to the input terminal of the oscilloscope. A probe characterized in that a switch means for supplying power to a connector to be connected is provided within the housing. (2) The probe according to claim 1, wherein the calibration signal generating circuit, including its power source, is provided in the housing. (3) The switch means includes a first switch that selects either the calibration signal from the calibration signal generation circuit or the signal under test from the device under test, and generates the calibration signal in conjunction with the first switch. The probe according to claim 1, which is a utility model, and comprises a second switch that turns on and off the power supply section of the circuit.
JP19426685U 1985-12-19 1985-12-19 Pending JPS62104165U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19426685U JPS62104165U (en) 1985-12-19 1985-12-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19426685U JPS62104165U (en) 1985-12-19 1985-12-19

Publications (1)

Publication Number Publication Date
JPS62104165U true JPS62104165U (en) 1987-07-02

Family

ID=31151080

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19426685U Pending JPS62104165U (en) 1985-12-19 1985-12-19

Country Status (1)

Country Link
JP (1) JPS62104165U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015118088A (en) * 2013-12-18 2015-06-25 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． Accessory and calibration method thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5890176A (en) * 1981-11-26 1983-05-28 Anritsu Corp Probe

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5890176A (en) * 1981-11-26 1983-05-28 Anritsu Corp Probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015118088A (en) * 2013-12-18 2015-06-25 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． Accessory and calibration method thereof

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