JPS627086U - - Google Patents
Info
- Publication number
- JPS627086U JPS627086U JP9845885U JP9845885U JPS627086U JP S627086 U JPS627086 U JP S627086U JP 9845885 U JP9845885 U JP 9845885U JP 9845885 U JP9845885 U JP 9845885U JP S627086 U JPS627086 U JP S627086U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- power supply
- pair
- sliding contact
- branch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 1
Description
第１図はこの考案の一実施例を示す接続配置図
、第２図は可動コンタクト装着部の構造を説明す
るための断面図、第３図は従来のＩＣ試験装置の
構造を説明するための接続配置図、第４図はＩＣ
試験装置における直流試験時の回路構造を説明す
るための接続図である。
１：被試験ＩＣ、２：端子、３：可動コンタク
ト、４，５：分岐接片、６，７：摺接導体、８，
１６：コンデンサ、９：駆動ローラ、１１：絶縁
板、１２：直流電源、１３：電流検出抵抗器、１
４：測定器、１５：スイツチ素子、１７：絶縁支
持体。
Fig. 1 is a connection layout diagram showing an embodiment of this invention, Fig. 2 is a cross-sectional view to explain the structure of the movable contact mounting section, and Fig. 3 is a cross-sectional view to explain the structure of a conventional IC testing device. Connection layout diagram, Figure 4 is IC
FIG. 2 is a connection diagram for explaining a circuit structure during a DC test in the test device. 1: IC under test, 2: Terminal, 3: Movable contact, 4, 5: Branch contact piece, 6, 7: Sliding conductor, 8,
16: Capacitor, 9: Drive roller, 11: Insulating plate, 12: DC power supply, 13: Current detection resistor, 1
4: Measuring device, 15: Switch element, 17: Insulating support.
Claims (1)
に駆動される複数の可動コンタクトと、 Ｂ この可動コンタクトの中の電源用コンタクト
の先端側から分岐された少なくとも一対の分岐接
片と、 Ｃ この分岐接片の遊端と摺接する一対の摺接導
体と、 Ｄ 上記摺接導体の間にスイツチ素子を介して接
離されるコンデンサと、 を具備して成るＩＣ試験装置。[Scope of Claim for Utility Model Registration] A. A plurality of movable contacts that are driven so as to be able to come into contact with and separate from each terminal of the IC under test, and B. A power supply contact branched from the tip side of the power supply contact among the movable contacts. At least a pair of branch contact pieces; C. a pair of sliding contact conductors that are in sliding contact with the free ends of the branch contact pieces; and D. a capacitor that is connected and separated between the sliding contact conductors via a switch element. IC test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9845885U JPS627086U (en) | 1985-06-28 | 1985-06-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9845885U JPS627086U (en) | 1985-06-28 | 1985-06-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS627086U true JPS627086U (en) | 1987-01-16 |
Family
ID=30966405
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9845885U Pending JPS627086U (en) | 1985-06-28 | 1985-06-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS627086U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63186241U (en) * | 1987-05-22 | 1988-11-29 | ||
| JPH01142646U (en) * | 1988-03-28 | 1989-09-29 | ||
| WO2019138853A1 (en) * | 2018-01-09 | 2019-07-18 | 株式会社デンソー | Inspection device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS598172B2 (en) * | 1977-05-30 | 1984-02-23 | 日本鉱業株式会社 | Powder transfer method and device |
-
1985
- 1985-06-28 JP JP9845885U patent/JPS627086U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS598172B2 (en) * | 1977-05-30 | 1984-02-23 | 日本鉱業株式会社 | Powder transfer method and device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63186241U (en) * | 1987-05-22 | 1988-11-29 | ||
| JPH0449893Y2 (en) * | 1987-05-22 | 1992-11-25 | ||
| JPH01142646U (en) * | 1988-03-28 | 1989-09-29 | ||
| WO2019138853A1 (en) * | 2018-01-09 | 2019-07-18 | 株式会社デンソー | Inspection device |
| JP2019120620A (en) * | 2018-01-09 | 2019-07-22 | 株式会社Ｓｏｋｅｎ | Test equipment |
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