JPS613473U - Contact for low resistance measurement - Google Patents

Contact for low resistance measurement

Info

Publication number
JPS613473U
JPS613473U JP8665984U JP8665984U JPS613473U JP S613473 U JPS613473 U JP S613473U JP 8665984 U JP8665984 U JP 8665984U JP 8665984 U JP8665984 U JP 8665984U JP S613473 U JPS613473 U JP S613473U
Authority
JP
Japan
Prior art keywords
contact
resistance measurement
low resistance
housing
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8665984U
Other languages
Japanese (ja)
Inventor
孝昭 工藤
Original Assignee
昭和ア−ルアンドディ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 昭和ア−ルアンドディ株式会社 filed Critical 昭和ア−ルアンドディ株式会社
Priority to JP8665984U priority Critical patent/JPS613473U/en
Publication of JPS613473U publication Critical patent/JPS613473U/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】 第１図は本考案の一実施例をしめす図で、イはその縦断
面図、口は平面図であり、第２図は従来の接触子を用い
た低抵抗の測定方式を示す概略構成図、第３図はその等
価回路図、第４図は本考案の接触子を用いた低抵抗の測
定方式を示す概略構成図、第５図はその等価回路図、第
６図、第７図および第８図は本考案の他の実施例を示す
縦断面図、第９図はさらに他の実施例を示す平面図であ
る。 ２１・・・接触子、２２・・・接触片、２３・・・コン
タクト部、２４・・・接続部、２５・・・ハウジング、
１０・・・電源、１２・・・電圧計。[Brief Description of the Drawings] Fig. 1 is a diagram showing an embodiment of the present invention, A is a longitudinal cross-sectional view thereof, and the opening is a plan view. Fig. 2 is a diagram showing an embodiment of the present invention. A schematic configuration diagram showing the measurement method, FIG. 3 is an equivalent circuit diagram, FIG. 4 is a schematic configuration diagram showing a low resistance measurement method using the contact of the present invention, and FIG. 5 is an equivalent circuit diagram. 6, 7 and 8 are longitudinal sectional views showing other embodiments of the present invention, and FIG. 9 is a plan view showing still another embodiment. 21... Contact element, 22... Contact piece, 23... Contact portion, 24... Connection portion, 25... Housing,
10...Power source, 12...Voltmeter.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] スイッチ接点の接触抵抗等を測定する測定器に用いられ
る低抵抗測定用の接触子において、一方の端部に被測定
物の端子に圧接されるコンタクト部が形成され、他力め
端部に電源あるいは測定器へのリード線が接続される接
続部が形成された少なくとも１対の接触片と、これらの
各接触片を相互に絶縁Ｌ１互いに対をなす接触片の各コ
ンタクト部が前記被測定物の同一の端子に同時に接触す
るように保持するハウジングとによって構成される低抵
抗測定用接触子。A contact for low resistance measurement used in a measuring device that measures the contact resistance of a switch contact, etc., has a contact part that is pressed into contact with the terminal of the object to be measured at one end, and a power supply at the other end. Alternatively, at least one pair of contact pieces each having a connection portion to which a lead wire to a measuring device is connected, and mutually insulating each contact piece L1, each contact portion of the pair of contact pieces is connected to the object to be measured. A low-resistance measurement contact consisting of a housing and a housing that simultaneously contacts the same terminals of the device.
JP8665984U 1984-06-13 1984-06-13 Contact for low resistance measurement Pending JPS613473U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8665984U JPS613473U (en) 1984-06-13 1984-06-13 Contact for low resistance measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8665984U JPS613473U (en) 1984-06-13 1984-06-13 Contact for low resistance measurement

Publications (1)

Publication Number Publication Date
JPS613473U true JPS613473U (en) 1986-01-10

Family

ID=30638172

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8665984U Pending JPS613473U (en) 1984-06-13 1984-06-13 Contact for low resistance measurement

Country Status (1)

Country Link
JP (1) JPS613473U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008111720A (en) * 2006-10-30 2008-05-15 Nidec-Read Corp Inspecting probe and inspecting jig
WO2016072193A1 (en) * 2014-11-07 2016-05-12 株式会社村田製作所 Probe

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5540338B2 (en) * 1974-01-23 1980-10-17
JPS5741168B2 (en) * 1977-03-31 1982-09-01
JPS603474B2 (en) * 1976-04-12 1985-01-28 モンサント・カンパニ− Cell culture method and reactor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5540338B2 (en) * 1974-01-23 1980-10-17
JPS603474B2 (en) * 1976-04-12 1985-01-28 モンサント・カンパニ− Cell culture method and reactor
JPS5741168B2 (en) * 1977-03-31 1982-09-01

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008111720A (en) * 2006-10-30 2008-05-15 Nidec-Read Corp Inspecting probe and inspecting jig
WO2016072193A1 (en) * 2014-11-07 2016-05-12 株式会社村田製作所 Probe
KR20170061156A (en) * 2014-11-07 2017-06-02 가부시키가이샤 무라타 세이사쿠쇼 Probe
JPWO2016072193A1 (en) * 2014-11-07 2017-07-20 株式会社村田製作所 probe
CN107148575A (en) * 2014-11-07 2017-09-08 株式会社村田制作所 Probe
US10197598B2 (en) 2014-11-07 2019-02-05 Murata Manufacturing Co., Ltd. Probe
CN107148575B (en) * 2014-11-07 2021-03-12 株式会社村田制作所 Probe needle

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