JPS613473U - Contact for low resistance measurement - Google Patents
Contact for low resistance measurementInfo
- Publication number
- JPS613473U JPS613473U JP8665984U JP8665984U JPS613473U JP S613473 U JPS613473 U JP S613473U JP 8665984 U JP8665984 U JP 8665984U JP 8665984 U JP8665984 U JP 8665984U JP S613473 U JPS613473 U JP S613473U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- resistance measurement
- low resistance
- housing
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【図面の簡単な説明】
第1図は本考案の一実施例をしめす図で、イはその縦断
面図、口は平面図であり、第2図は従来の接触子を用い
た低抵抗の測定方式を示す概略構成図、第3図はその等
価回路図、第4図は本考案の接触子を用いた低抵抗の測
定方式を示す概略構成図、第5図はその等価回路図、第
6図、第7図および第8図は本考案の他の実施例を示す
縦断面図、第9図はさらに他の実施例を示す平面図であ
る。
21・・・接触子、22・・・接触片、23・・・コン
タクト部、24・・・接続部、25・・・ハウジング、
10・・・電源、12・・・電圧計。[Brief Description of the Drawings] Fig. 1 is a diagram showing an embodiment of the present invention, A is a longitudinal cross-sectional view thereof, and the opening is a plan view. Fig. 2 is a diagram showing an embodiment of the present invention. A schematic configuration diagram showing the measurement method, FIG. 3 is an equivalent circuit diagram, FIG. 4 is a schematic configuration diagram showing a low resistance measurement method using the contact of the present invention, and FIG. 5 is an equivalent circuit diagram. 6, 7 and 8 are longitudinal sectional views showing other embodiments of the present invention, and FIG. 9 is a plan view showing still another embodiment. 21... Contact element, 22... Contact piece, 23... Contact portion, 24... Connection portion, 25... Housing,
10...Power source, 12...Voltmeter.
Claims (1)
る低抵抗測定用の接触子において、一方の端部に被測定
物の端子に圧接されるコンタクト部が形成され、他力め
端部に電源あるいは測定器へのリード線が接続される接
続部が形成された少なくとも1対の接触片と、これらの
各接触片を相互に絶縁L1互いに対をなす接触片の各コ
ンタクト部が前記被測定物の同一の端子に同時に接触す
るように保持するハウジングとによって構成される低抵
抗測定用接触子。A contact for low resistance measurement used in a measuring device that measures the contact resistance of a switch contact, etc., has a contact part that is pressed into contact with the terminal of the object to be measured at one end, and a power supply at the other end. Alternatively, at least one pair of contact pieces each having a connection portion to which a lead wire to a measuring device is connected, and mutually insulating each contact piece L1, each contact portion of the pair of contact pieces is connected to the object to be measured. A low-resistance measurement contact consisting of a housing and a housing that simultaneously contacts the same terminals of the device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8665984U JPS613473U (en) | 1984-06-13 | 1984-06-13 | Contact for low resistance measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8665984U JPS613473U (en) | 1984-06-13 | 1984-06-13 | Contact for low resistance measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS613473U true JPS613473U (en) | 1986-01-10 |
Family
ID=30638172
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8665984U Pending JPS613473U (en) | 1984-06-13 | 1984-06-13 | Contact for low resistance measurement |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS613473U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008111720A (en) * | 2006-10-30 | 2008-05-15 | Nidec-Read Corp | Inspecting probe and inspecting jig |
WO2016072193A1 (en) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | Probe |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5540338B2 (en) * | 1974-01-23 | 1980-10-17 | ||
JPS5741168B2 (en) * | 1977-03-31 | 1982-09-01 | ||
JPS603474B2 (en) * | 1976-04-12 | 1985-01-28 | モンサント・カンパニ− | Cell culture method and reactor |
-
1984
- 1984-06-13 JP JP8665984U patent/JPS613473U/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5540338B2 (en) * | 1974-01-23 | 1980-10-17 | ||
JPS603474B2 (en) * | 1976-04-12 | 1985-01-28 | モンサント・カンパニ− | Cell culture method and reactor |
JPS5741168B2 (en) * | 1977-03-31 | 1982-09-01 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008111720A (en) * | 2006-10-30 | 2008-05-15 | Nidec-Read Corp | Inspecting probe and inspecting jig |
WO2016072193A1 (en) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | Probe |
KR20170061156A (en) * | 2014-11-07 | 2017-06-02 | 가부시키가이샤 무라타 세이사쿠쇼 | Probe |
JPWO2016072193A1 (en) * | 2014-11-07 | 2017-07-20 | 株式会社村田製作所 | probe |
CN107148575A (en) * | 2014-11-07 | 2017-09-08 | 株式会社村田制作所 | Probe |
US10197598B2 (en) | 2014-11-07 | 2019-02-05 | Murata Manufacturing Co., Ltd. | Probe |
CN107148575B (en) * | 2014-11-07 | 2021-03-12 | 株式会社村田制作所 | Probe needle |
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