JPH0193570U - - Google Patents
Info
- Publication number
- JPH0193570U JPH0193570U JP18910887U JP18910887U JPH0193570U JP H0193570 U JPH0193570 U JP H0193570U JP 18910887 U JP18910887 U JP 18910887U JP 18910887 U JP18910887 U JP 18910887U JP H0193570 U JPH0193570 U JP H0193570U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- tip
- lead terminal
- lead terminals
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案の原理説明図、第２図は本考案
による一実施例の説明図で、ａは斜視図、ｂは側
面図、ｃ１，ｃ２は断面図、第３図は本考案の他
の実施例のａは側面図、ｂ１，ｂ２は断面図、第
４図は従来の説明図で、ａは側面図、ｂは斜視図
を示す。
図において、１はプリント基板、２は半導体素
子、３はリード端子、４は部材、５は測定器、６
は接触片、４Ａは先端部、４Ｂは把手部を示す。
Fig. 1 is an explanatory diagram of the principle of the present invention, Fig. 2 is an explanatory diagram of an embodiment according to the present invention, where a is a perspective view, b is a side view, c1 and c2 are cross-sectional views, and Fig. 3 is an explanatory diagram of an embodiment of the present invention. In other embodiments, a is a side view, b1 and b2 are cross-sectional views, and FIG. 4 is a conventional explanatory view, a is a side view, and b is a perspective view. In the figure, 1 is a printed circuit board, 2 is a semiconductor element, 3 is a lead terminal, 4 is a member, 5 is a measuring device, and 6
4A is a contact piece, 4A is a tip, and 4B is a handle.
Claims (1)
６をプリント基板１に実装される半導体素子２の
所定のリード端子３に接触させ、必要に応じて、
該リード端子３から所定の電気信号を測定器５に
入力させるプローブであつて、 前記先端部４Ａを前記リード端子３の隣接間に
挿入し、前記部材４の外周の把手部４Ｂを回動さ
せることで前記該リード端子３のそれぞれに圧接
される２組の接触片６が絶縁部材７を介在するこ
とで対向させるように配設されて成ることを特徴
とするプローブ。[Claims for Utility Model Registration] The contact piece 6 at the tip 4A of the rod-shaped member 4 is brought into contact with a predetermined lead terminal 3 of the semiconductor element 2 mounted on the printed circuit board 1, and if necessary,
The probe inputs a predetermined electrical signal from the lead terminal 3 to the measuring instrument 5, and the tip 4A is inserted between adjacent lead terminals 3, and the handle 4B on the outer periphery of the member 4 is rotated. A probe characterized in that two sets of contact pieces 6 which are pressed into contact with each of the lead terminals 3 are arranged so as to face each other with an insulating member 7 interposed therebetween.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18910887U JPH0533971Y2 (en) | 1987-12-10 | 1987-12-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18910887U JPH0533971Y2 (en) | 1987-12-10 | 1987-12-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0193570U true JPH0193570U (en) | 1989-06-20 |
| JPH0533971Y2 JPH0533971Y2 (en) | 1993-08-27 |
Family
ID=31480163
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18910887U Expired - Lifetime JPH0533971Y2 (en) | 1987-12-10 | 1987-12-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0533971Y2 (en) |
-
1987
- 1987-12-10 JP JP18910887U patent/JPH0533971Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0533971Y2 (en) | 1993-08-27 |
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