JPS6262271U - - Google Patents

Info

Publication number
JPS6262271U
JPS6262271U JP10474385U JP10474385U JPS6262271U JP S6262271 U JPS6262271 U JP S6262271U JP 10474385 U JP10474385 U JP 10474385U JP 10474385 U JP10474385 U JP 10474385U JP S6262271 U JPS6262271 U JP S6262271U
Authority
JP
Japan
Prior art keywords
fine pattern
insulator
pattern conductor
conductor circuit
auxiliary board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10474385U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10474385U priority Critical patent/JPS6262271U/ja
Publication of JPS6262271U publication Critical patent/JPS6262271U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例に係る試験装置を被
接続微細パターン導体回路基板に接続した状態を
示す側面図、第2図は第1図のA―A線断面図、
第3図は第1図に示す試験装置の補助基板に設け
られた導体と被接続微細パターン導体回路との接
続部を示した拡大図である。 1,2:絶縁体、3,4,5,6:印刷配線、
7:被接続微細パターン導体回路基板、8:補助
基板、9,10:測定用電極、11:フラツトパ
ツケージ集積回路、12:導体。
FIG. 1 is a side view showing a state in which a test device according to an embodiment of the present invention is connected to a connected fine pattern conductor circuit board, FIG. 2 is a cross-sectional view taken along the line AA in FIG.
FIG. 3 is an enlarged view showing the connection portion between the conductor provided on the auxiliary board of the test device shown in FIG. 1 and the connected fine pattern conductor circuit. 1, 2: Insulator, 3, 4, 5, 6: Printed wiring,
7: Connected fine pattern conductor circuit board, 8: Auxiliary board, 9, 10: Measuring electrodes, 11: Flat package integrated circuit, 12: Conductor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 外部の測定器等と接続可能な電極を設けた微細
パターン導体回路の試験を行うための補助基板と
、該補助基板に設けられた弾力性を有しかつ縦方
向に多数の導体を配して成る絶縁体とを備え、前
記絶縁体を前記微細パターン導体回路に接触させ
ることにより接続を行うことを特徴とする微細パ
ターン導体回路の試験装置。
An auxiliary board for testing fine pattern conductor circuits equipped with electrodes that can be connected to external measuring instruments, etc., and a large number of elastic conductors arranged vertically on the auxiliary board. What is claimed is: 1. A testing device for a fine pattern conductor circuit, comprising: an insulator consisting of an insulator, and connection is made by bringing the insulator into contact with the fine pattern conductor circuit.
JP10474385U 1985-07-09 1985-07-09 Pending JPS6262271U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10474385U JPS6262271U (en) 1985-07-09 1985-07-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10474385U JPS6262271U (en) 1985-07-09 1985-07-09

Publications (1)

Publication Number Publication Date
JPS6262271U true JPS6262271U (en) 1987-04-17

Family

ID=30978524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10474385U Pending JPS6262271U (en) 1985-07-09 1985-07-09

Country Status (1)

Country Link
JP (1) JPS6262271U (en)

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