JPS61199681U - - Google Patents
Info
- Publication number
- JPS61199681U JPS61199681U JP8414785U JP8414785U JPS61199681U JP S61199681 U JPS61199681 U JP S61199681U JP 8414785 U JP8414785 U JP 8414785U JP 8414785 U JP8414785 U JP 8414785U JP S61199681 U JPS61199681 U JP S61199681U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- contact portions
- inspection device
- electrical contact
- pressing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims 1
- 239000004593 Epoxy Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図および第２図はこの考案の一実施例を示
す正面図、および平面図、第３図は従来の高周波
ＨＩＣ検査装置を示す外観図である。
図中、１はガラスエポキシ基板、２は接栓、３
は被検査品のＩＣ、８は操作レバー、９は台、１
０は固定板である。なお、図中同一符号は同一、
又は相当部分を示す。
1 and 2 are a front view and a plan view showing an embodiment of this invention, and FIG. 3 is an external view showing a conventional high frequency HIC inspection device. In the figure, 1 is a glass epoxy board, 2 is a plug, and 3
is the IC of the product to be inspected, 8 is the operating lever, 9 is the stand, 1
0 is a fixed plate. In addition, the same symbols in the figures are the same,
or a corresponding portion.
Claims (1)
複数のリード（ピン）を有する電子部品を検査す
る電子部品検査装置において、上記電子部品の各
リードに対応して設けられた複数の電気的接触部
と、これら各接触部に上記各リードを押圧接触さ
せる押圧部材を設けたことを特徴とする電子部品
検査装置。 (2) 複数の電気的接触部は１枚の基板上に形成
されていることを特徴とする実用新案登録請求の
範囲第１項記載の電子部品検査装置。[Scope of Claim for Utility Model Registration] (1) In an electronic component inspection device that inspects an electronic component having a plurality of leads (pins) drawn out in the same direction and in a line shape, An electronic component testing device comprising: a plurality of electrical contact portions; and a pressing member for pressing each lead into contact with each of the contact portions. (2) The electronic component inspection device according to claim 1, wherein the plurality of electrical contact portions are formed on a single substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8414785U JPS61199681U (en) | 1985-06-03 | 1985-06-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8414785U JPS61199681U (en) | 1985-06-03 | 1985-06-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61199681U true JPS61199681U (en) | 1986-12-13 |
Family
ID=30633402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8414785U Pending JPS61199681U (en) | 1985-06-03 | 1985-06-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61199681U (en) |
-
1985
- 1985-06-03 JP JP8414785U patent/JPS61199681U/ja active Pending
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