JPS6013480U - Aging test equipment - Google Patents
Aging test equipmentInfo
- Publication number
- JPS6013480U JPS6013480U JP10463683U JP10463683U JPS6013480U JP S6013480 U JPS6013480 U JP S6013480U JP 10463683 U JP10463683 U JP 10463683U JP 10463683 U JP10463683 U JP 10463683U JP S6013480 U JPS6013480 U JP S6013480U
- Authority
- JP
- Japan
- Prior art keywords
- aging test
- test equipment
- sample
- aging
- measurement jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図はエージング試験装置の一例を示す構成図、第２
図は従来の測定治具を示す斜視図、第３図は本考案の一
実施例である測定治具及び電源供給部を示す斜視図、第
４図は第３図の接続構成を示す平面図である。
図中、２１は測定治具、２２は溝、２３．２４は整合回
路基板、２５はフレーム、２６．２７は電源供給部、２
８．２９は電源供給回路、３０゜３１は中継端子、３２
はホットプレート。Figure 1 is a configuration diagram showing an example of aging test equipment, Figure 2
The figure is a perspective view showing a conventional measuring jig, FIG. 3 is a perspective view showing a measuring jig and a power supply section according to an embodiment of the present invention, and FIG. 4 is a plan view showing the connection configuration of FIG. 3. It is. In the figure, 21 is a measurement jig, 22 is a groove, 23.24 is a matching circuit board, 25 is a frame, 26.27 is a power supply unit, 2
8.29 is the power supply circuit, 30°31 is the relay terminal, 32
is a hot plate.
Claims (1)
路を備えた測定治具に電源供給部を接続して該試料に電
源供給すると共に、該測定治具をホットプレート上に配
置してエージングするようにしたことを特徴とするエー
ジング試験装置。A power supply unit is connected to a measurement jig that accommodates a sample and is equipped with a matching circuit for measuring impedance matching with the sample to supply power to the sample, and the measurement jig is placed on a hot plate for aging. An aging test device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10463683U JPS6013480U (en) | 1983-07-06 | 1983-07-06 | Aging test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10463683U JPS6013480U (en) | 1983-07-06 | 1983-07-06 | Aging test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6013480U true JPS6013480U (en) | 1985-01-29 |
Family
ID=30245605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10463683U Pending JPS6013480U (en) | 1983-07-06 | 1983-07-06 | Aging test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6013480U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5143573B2 (en) * | 1972-08-05 | 1976-11-22 | ||
| JPS5311959B2 (en) * | 1973-07-12 | 1978-04-25 |
-
1983
- 1983-07-06 JP JP10463683U patent/JPS6013480U/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5143573B2 (en) * | 1972-08-05 | 1976-11-22 | ||
| JPS5311959B2 (en) * | 1973-07-12 | 1978-04-25 |
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