JPS6117678U - tester - Google Patents

tester

Info

Publication number
JPS6117678U
JPS6117678U JP10173684U JP10173684U JPS6117678U JP S6117678 U JPS6117678 U JP S6117678U JP 10173684 U JP10173684 U JP 10173684U JP 10173684 U JP10173684 U JP 10173684U JP S6117678 U JPS6117678 U JP S6117678U
Authority
JP
Japan
Prior art keywords
tester
capacitance
probe
connects
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10173684U
Other languages
Japanese (ja)
Inventor
一 田中
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP10173684U priority Critical patent/JPS6117678U/en
Publication of JPS6117678U publication Critical patent/JPS6117678U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案による試験器の一実施例を示す構成図、
第２図は従来の試験器の斜視図を示す。 図において、１はパッケージ、２，３はランド、４，５
はブローブ、６はテスタ、７はキャパシテイナータを示
す。FIG. 1 is a configuration diagram showing an embodiment of a tester according to the present invention;
FIG. 2 shows a perspective view of a conventional tester. In the figure, 1 is a package, 2, 3 are lands, 4, 5
is a probe, 6 is a tester, and 7 is a capacitor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テスタと、該テスタを被測定箇所に接続するブローブと
電気容量を測定するキャパシテイナータとを備えると共
に、該被測定箇所に当接された該ブローブが該キャパシ
ティナータに接続される切替スイッチを設けたことを特
徴とする試験器。The tester includes a tester, a probe that connects the tester to a point to be measured, and a capacitance inverter that measures electric capacitance, and a changeover switch that connects the probe in contact with the point to be measured to the capacitance inverter. A test device characterized by:
JP10173684U 1984-07-05 1984-07-05 tester Pending JPS6117678U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10173684U JPS6117678U (en) 1984-07-05 1984-07-05 tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10173684U JPS6117678U (en) 1984-07-05 1984-07-05 tester

Publications (1)

Publication Number Publication Date
JPS6117678U true JPS6117678U (en) 1986-02-01

Family

ID=30661151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10173684U Pending JPS6117678U (en) 1984-07-05 1984-07-05 tester

Country Status (1)

Country Link
JP (1) JPS6117678U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002014134A (en) * 2000-06-30 2002-01-18 Hioki Ee Corp Device for inspecting circuit board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002014134A (en) * 2000-06-30 2002-01-18 Hioki Ee Corp Device for inspecting circuit board

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