JPS6080353U - Measuring instrument probe - Google Patents
Measuring instrument probeInfo
- Publication number
- JPS6080353U JPS6080353U JP16938083U JP16938083U JPS6080353U JP S6080353 U JPS6080353 U JP S6080353U JP 16938083 U JP16938083 U JP 16938083U JP 16938083 U JP16938083 U JP 16938083U JP S6080353 U JPS6080353 U JP S6080353U
- Authority
- JP
- Japan
- Prior art keywords
- measuring instrument
- instrument probe
- probe
- abstract
- conductive material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
゛第１図は従来のテスタの外観図、第２図は第１図に示
されるテスタ用の探針の要部番一部断面して示す拡大詳
細一部所面図、第３図は本考案による探針の断面図であ
る。
２０・・・・・・探針、？１・・・・・・探針本体、２
２・・・・・・支持体。゛Figure 1 is an external view of a conventional tester, Figure 2 is an enlarged detailed partially cross-sectional view of the main parts of the probe for the tester shown in Figure 1, and Figure 3 is a partial cross-sectional view of the tester probe shown in Figure 1. FIG. 3 is a cross-sectional view of the invented probe. 20... Probe, ? 1... Probe body, 2
2...Support.
Claims (1)
い針状に形成されて成ることを特徴とする計測器用探針
。A measuring instrument probe characterized in that the probe body is made of a hard conductive material and the contact end is formed into a sharp needle shape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16938083U JPS6080353U (en) | 1983-11-02 | 1983-11-02 | Measuring instrument probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16938083U JPS6080353U (en) | 1983-11-02 | 1983-11-02 | Measuring instrument probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6080353U true JPS6080353U (en) | 1985-06-04 |
Family
ID=30370053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16938083U Pending JPS6080353U (en) | 1983-11-02 | 1983-11-02 | Measuring instrument probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6080353U (en) |
-
1983
- 1983-11-02 JP JP16938083U patent/JPS6080353U/en active Pending
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