JPS58156284U - Socket device for semiconductor device measurement - Google Patents
Socket device for semiconductor device measurementInfo
- Publication number
- JPS58156284U JPS58156284U JP5352082U JP5352082U JPS58156284U JP S58156284 U JPS58156284 U JP S58156284U JP 5352082 U JP5352082 U JP 5352082U JP 5352082 U JP5352082 U JP 5352082U JP S58156284 U JPS58156284 U JP S58156284U
- Authority
- JP
- Japan
- Prior art keywords
- socket
- semiconductor device
- pair
- measurement
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来例の斜視図、第２図はその断面図、第３図
は第１図の構成を改良した斜視図、第４図はその断面図
、第５図はこの考案の実施例を示す斜視図、第６図は要
部の斜視図、第７図は第５図の断面図である。
９・・・・・・第２のソケット、１０ａ、ｌｌａ・・・
・・・コンタクト部、１２． １３−−−−−−コンタ
クト片、１４Ｅ。
１４Ｃ，１４Ｂ、１５Ｅ、１５Ｃ，１５Ｂ・・・・・・
端子、２１・・・・・・第１のソケット、２２Ｅ、２２
Ｃ。
２２Ｂ・・・・・・コンタクト部、２３． ２４””コ
ンタクト片、２５．２６・・・・・・端子。Fig. 1 is a perspective view of the conventional example, Fig. 2 is a sectional view thereof, Fig. 3 is a perspective view of an improved structure of Fig. 1, Fig. 4 is a sectional view thereof, and Fig. 5 is an embodiment of this invention. FIG. 6 is a perspective view of essential parts, and FIG. 7 is a sectional view of FIG. 5. 9...Second socket, 10a, lla...
...Contact part, 12. 13---Contact piece, 14E. 14C, 14B, 15E, 15C, 15B...
Terminal, 21...First socket, 22E, 22
C. 22B...Contact part, 23. 24"" contact piece, 25.26...terminal.
Claims (1)
を有し、前記コンタクト部は前記半導体装置の端子に共
通して接触するコンタクト片から外部に導出された一対
の端子を有してなり、前記一対の端子は一対のコンタク
ト部を有する他のソケットのコンタクト部に挿入自在と
してなる半導体装置測定用ソケット装置。a contact portion into which a terminal of a semiconductor device to be measured is inserted; the contact portion has a pair of terminals led out from a contact piece that commonly contacts the terminal of the semiconductor device; A socket device for measuring semiconductor devices, in which a pair of terminals can be freely inserted into a contact part of another socket having a pair of contact parts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5352082U JPS58156284U (en) | 1982-04-12 | 1982-04-12 | Socket device for semiconductor device measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5352082U JPS58156284U (en) | 1982-04-12 | 1982-04-12 | Socket device for semiconductor device measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58156284U true JPS58156284U (en) | 1983-10-19 |
Family
ID=30064179
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5352082U Pending JPS58156284U (en) | 1982-04-12 | 1982-04-12 | Socket device for semiconductor device measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58156284U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6324171A (en) * | 1986-07-16 | 1988-02-01 | Datsuku Kk | Inspection device for parts operation of integrated circuit |
-
1982
- 1982-04-12 JP JP5352082U patent/JPS58156284U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6324171A (en) * | 1986-07-16 | 1988-02-01 | Datsuku Kk | Inspection device for parts operation of integrated circuit |
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