JPH0175883U - - Google Patents

Info

Publication number
JPH0175883U
JPH0175883U JP1987170988U JP17098887U JPH0175883U JP H0175883 U JPH0175883 U JP H0175883U JP 1987170988 U JP1987170988 U JP 1987170988U JP 17098887 U JP17098887 U JP 17098887U JP H0175883 U JPH0175883 U JP H0175883U
Authority
JP
Japan
Prior art keywords
test case
circuit board
motherboard
semiconductor
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987170988U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987170988U priority Critical patent/JPH0175883U/ja
Publication of JPH0175883U publication Critical patent/JPH0175883U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の半導体測定装置のテスト筐
体の側面図、第2図は従来の半導体測定装置の側
面図、第3図は従来のテスト筐体の斜視図である
。 図において、1は半導体測定装置のハンドラ、
2はテスト筐体の回路板、3はテスト筐体のマザ
ーボード、4はテスト筐体のケース、5はケーブ
ルを示す。なお、図中、同一符号は同一、または
相当部分を示す。
FIG. 1 is a side view of a test case of a semiconductor measuring device of this invention, FIG. 2 is a side view of a conventional semiconductor measuring device, and FIG. 3 is a perspective view of a conventional test case. In the figure, 1 is a handler of a semiconductor measuring device;
2 is a circuit board of the test case, 3 is a motherboard of the test case, 4 is a case of the test case, and 5 is a cable. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体測定回路を構成する回路板とマザーボー
トを収納する半導体測定装置のテスト筐体におい
て、前記回路板および前記マザーボートをテスト
筐体に挿脱可能とするとともに、前記回路板の取
換えによつてテストの種類を変更可能としたこと
を特徴とする半導体測定装置のテスト筐体。
In a test case for a semiconductor measurement device that houses a circuit board and a motherboard constituting a semiconductor measurement circuit, the circuit board and the motherboard can be inserted into and removed from the test case, and the circuit board can be replaced. A test case for a semiconductor measuring device, characterized in that the type of test can be changed.
JP1987170988U 1987-11-09 1987-11-09 Pending JPH0175883U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987170988U JPH0175883U (en) 1987-11-09 1987-11-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987170988U JPH0175883U (en) 1987-11-09 1987-11-09

Publications (1)

Publication Number Publication Date
JPH0175883U true JPH0175883U (en) 1989-05-23

Family

ID=31462412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987170988U Pending JPH0175883U (en) 1987-11-09 1987-11-09

Country Status (1)

Country Link
JP (1) JPH0175883U (en)

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