JPH0263479U - - Google Patents
Info
- Publication number
- JPH0263479U JPH0263479U JP14263588U JP14263588U JPH0263479U JP H0263479 U JPH0263479 U JP H0263479U JP 14263588 U JP14263588 U JP 14263588U JP 14263588 U JP14263588 U JP 14263588U JP H0263479 U JPH0263479 U JP H0263479U
- Authority
- JP
- Japan
- Prior art keywords
- board
- holding part
- pin
- position corresponding
- measurement point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 2
- 210000005069 ears Anatomy 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図は、本考案による実施例を示す斜視図、
第２図は、本考案の部分縦断面を示す側面図、第
３図は、従来例を示す斜視図である。
１：プレス部、２：第３圧力緩衝部、３：上部
ピンボード、４：第２圧力緩衝部、５：被検査基
板、６：下部保持板、７：第１圧力緩衝部、８：
下部ピンボード、９：上部保持板、１０：検査ピ
ン、１１：基板耳部、１２：基板台。
FIG. 1 is a perspective view showing an embodiment according to the present invention;
FIG. 2 is a side view showing a partial longitudinal section of the present invention, and FIG. 3 is a perspective view showing a conventional example. 1: Press part, 2: Third pressure buffer part, 3: Upper pin board, 4: Second pressure buffer part, 5: Board to be inspected, 6: Lower holding plate, 7: First pressure buffer part, 8:
Lower pin board, 9: Upper holding plate, 10: Inspection pin, 11: Board ear, 12: Board stand.
Claims (1)
設けられた下部保持部と、前記下部保持部の下側
に設けられ、基板の下面の測定点に対応した位置
に検査ピンが突設された下部ピンボードと、基板
の耳部を上側から弾性的に保持するように設けら
れた上部保持部と、前記上部保持部の上側に設け
られ、基板上側の測定点に対応した位置に検査ピ
ンが突設された上部ピンボードとを有することを
特徴とする混成集積回路基板検査接点装置。 A lower holding part is provided to elastically hold the ear part of the board from below, and a test pin is provided below the lower holding part and protrudes at a position corresponding to a measurement point on the bottom surface of the board. a lower pin board, which is provided to elastically hold the ears of the board from above, and an upper holding part provided above the upper holding part, and a test pin board provided at a position corresponding to the measurement point on the upper side of the board. 1. A hybrid integrated circuit board testing contact device, comprising: an upper pin board with protruding pins.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14263588U JPH0263479U (en) | 1988-10-31 | 1988-10-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14263588U JPH0263479U (en) | 1988-10-31 | 1988-10-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0263479U true JPH0263479U (en) | 1990-05-11 |
Family
ID=31408759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14263588U Pending JPH0263479U (en) | 1988-10-31 | 1988-10-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0263479U (en) |
-
1988
- 1988-10-31 JP JP14263588U patent/JPH0263479U/ja active Pending
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