JPH03104867U - - Google Patents

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Publication number
JPH03104867U
JPH03104867U JP1187090U JP1187090U JPH03104867U JP H03104867 U JPH03104867 U JP H03104867U JP 1187090 U JP1187090 U JP 1187090U JP 1187090 U JP1187090 U JP 1187090U JP H03104867 U JPH03104867 U JP H03104867U
Authority
JP
Japan
Prior art keywords
board
tester head
tested
tester
tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1187090U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1187090U priority Critical patent/JPH03104867U/ja
Publication of JPH03104867U publication Critical patent/JPH03104867U/ja
Pending legal-status Critical Current

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Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案によるテスターヘツドを示す断
面図、第2図a乃至cは本考案によるテスターヘ
ツドの製造過程を示す断面図、第3図は従来例に
よるテスターヘツドの断面図、第4図は他の従来
例によるテスターヘツドの断面図である。 1……被検査基板、5……テスターヘツド基板
、8……コンタクト用パツド、B……検査ポイン
ト。
FIG. 1 is a cross-sectional view showing a tester head according to the present invention, FIGS. 2 a to c are cross-sectional views showing the manufacturing process of the tester head according to the present invention, FIG. 3 is a cross-sectional view of a conventional tester head, and FIG. 1 is a sectional view of another conventional tester head. 1... Board to be inspected, 5... Tester head board, 8... Contact pad, B... Inspection point.

Claims (1)

【実用新案登録請求の範囲】 被検査基板の検査ポイントに接触して、上記被
検査基板の回路検査を行なうテスターヘツドにお
いて、 テスターヘツド基板の、上記検査ポイントに対
応する位置に幅の狭い突出したコンタクト用パツ
トを形成することを特徴とするテスターヘツド。
[Scope of Claim for Utility Model Registration] In a tester head that tests the circuits of the board to be tested by contacting the test points of the board to be tested, a narrow protrusion is provided on the tester head board at a position corresponding to the test point. A tester head characterized by forming a contact patch.
JP1187090U 1990-02-07 1990-02-07 Pending JPH03104867U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1187090U JPH03104867U (en) 1990-02-07 1990-02-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1187090U JPH03104867U (en) 1990-02-07 1990-02-07

Publications (1)

Publication Number Publication Date
JPH03104867U true JPH03104867U (en) 1991-10-30

Family

ID=31515380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1187090U Pending JPH03104867U (en) 1990-02-07 1990-02-07

Country Status (1)

Country Link
JP (1) JPH03104867U (en)

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