JPS6284762U - - Google Patents
Info
- Publication number
- JPS6284762U JPS6284762U JP17574385U JP17574385U JPS6284762U JP S6284762 U JPS6284762 U JP S6284762U JP 17574385 U JP17574385 U JP 17574385U JP 17574385 U JP17574385 U JP 17574385U JP S6284762 U JPS6284762 U JP S6284762U
- Authority
- JP
- Japan
- Prior art keywords
- guide block
- lead
- component
- guide
- prober
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003780 insertion Methods 0.000 claims description 2
- 230000037431 insertion Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は本考案のマルチプローバの実施例を示
す断面図、第２図ａは従来例を示す平面図、ｂ，
ｃは接触不良を示で図である。
第１図において、２はプローブピン、５は部品
リード、１０はガイドブロツク、１１はピン挿入
孔である。
FIG. 1 is a sectional view showing an embodiment of the multi-prober of the present invention, FIG. 2 a is a plan view showing a conventional example, b,
Figure c shows poor contact. In FIG. 1, 2 is a probe pin, 5 is a component lead, 10 is a guide block, and 11 is a pin insertion hole.
Claims (1)
位置毎にピン挿入孔１１を開口したガイドブロツ
ク１０を有し、 該ガイドブロツク１０により複数本のプローブ
ピン２と部品リード５を位置決めして同時に接触
する電気特性試験用マルチプローバ。[Claims for Utility Model Registration] A guide block 10 is provided in which a pin insertion hole 11 is opened at each position of each component lead 5 using the unevenness of the board 3 as a guide, and the guide block 10 allows a plurality of probe pins 2 and the component to be inserted. A multi-prober for electrical property testing that positions and contacts the lead 5 at the same time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17574385U JPS6284762U (en) | 1985-11-15 | 1985-11-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17574385U JPS6284762U (en) | 1985-11-15 | 1985-11-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6284762U true JPS6284762U (en) | 1987-05-29 |
Family
ID=31115342
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17574385U Pending JPS6284762U (en) | 1985-11-15 | 1985-11-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6284762U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015117991A (en) * | 2013-12-18 | 2015-06-25 | アキム株式会社 | Probe unit and temperature characteristic measurement instrument using the same |
-
1985
- 1985-11-15 JP JP17574385U patent/JPS6284762U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015117991A (en) * | 2013-12-18 | 2015-06-25 | アキム株式会社 | Probe unit and temperature characteristic measurement instrument using the same |