JPS6184874U - - Google Patents
Info
- Publication number
- JPS6184874U JPS6184874U JP17008284U JP17008284U JPS6184874U JP S6184874 U JPS6184874 U JP S6184874U JP 17008284 U JP17008284 U JP 17008284U JP 17008284 U JP17008284 U JP 17008284U JP S6184874 U JPS6184874 U JP S6184874U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- contact
- pins
- sockets
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案の一実施例を示す構成図、第２
図は従来のＩＣコンタクト治具を示す構成図であ
る。
１…テストボード、２…被試験ＩＣ、３ａ〜３
ｎ…ピン、５…ガイド、６ａ〜６ｎ…スプリング
コンタクトピン。
Fig. 1 is a configuration diagram showing one embodiment of the present invention;
The figure is a configuration diagram showing a conventional IC contact jig. 1...Test board, 2...IC under test, 3a-3
n...Pin, 5...Guide, 6a-6n...Spring contact pin.
Claims (1)
るＩＣコンタクト治具において、テストボードに
ガイドを装着し、該ガイドに大径の受け口を被試
験ＩＣの各ピンに対応させて設け、被試験ＩＣの
ピンの太さに対応した口径のスプリングコンタク
トピンを前記各受け口内に、被試験ＩＣのピンと
端面同士を突き当てて接触させる姿勢に保持して
設けたことを特徴とするＩＣコンタクト治具。 In an IC contact jig that connects the pins of an IC under test to an integrated circuit testing device, a guide is attached to the test board, and large diameter sockets are provided on the guide corresponding to each pin of the IC under test. An IC contact jig characterized in that a spring contact pin having a diameter corresponding to the thickness of the pin is provided in each of the sockets and held in a position such that the pins of the IC to be tested and their end surfaces abut and come into contact with each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17008284U JPS6184874U (en) | 1984-11-09 | 1984-11-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17008284U JPS6184874U (en) | 1984-11-09 | 1984-11-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6184874U true JPS6184874U (en) | 1986-06-04 |
Family
ID=30727789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17008284U Pending JPS6184874U (en) | 1984-11-09 | 1984-11-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6184874U (en) |
-
1984
- 1984-11-09 JP JP17008284U patent/JPS6184874U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6184874U (en) | ||
| JPS6051451U (en) | Three-point bending test jig | |
| JPS6180469U (en) | ||
| JPH0376183U (en) | ||
| JPS5910050U (en) | Ring-shaped elastic body tensile test device | |
| JPS59125837U (en) | Semiconductor inspection equipment | |
| JPS623078U (en) | ||
| JPS60111284U (en) | Printed circuit board measuring device | |
| JPS6440069U (en) | ||
| JPH0332440U (en) | ||
| JPH0297687U (en) | ||
| JPS6348165U (en) | ||
| JPS63115767U (en) | ||
| JPS63109674U (en) | ||
| JPS60159352U (en) | High temperature tensile test jig | |
| JPH01124567U (en) | ||
| JPS62108870U (en) | ||
| JPH0191261U (en) | ||
| JPS6283978U (en) | ||
| JPS61135489U (en) | ||
| JPH0263479U (en) | ||
| JPS6035269U (en) | printed circuit board test fixture | |
| JPS61164039U (en) | ||
| JPS5889867U (en) | Contactor for IC testing machine | |
| JPH0174576U (en) |