JPS5889867U - Contactor for IC testing machine - Google Patents

Contactor for IC testing machine

Info

Publication number
JPS5889867U
JPS5889867U JP18549981U JP18549981U JPS5889867U JP S5889867 U JPS5889867 U JP S5889867U JP 18549981 U JP18549981 U JP 18549981U JP 18549981 U JP18549981 U JP 18549981U JP S5889867 U JPS5889867 U JP S5889867U
Authority
JP
Japan
Prior art keywords
contactor
movable contact
testing machine
ics
measuring section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18549981U
Other languages
Japanese (ja)
Inventor
川口　勝三郎
正和 安東
Original Assignee
株式会社アドバンテスト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社アドバンテスト filed Critical 株式会社アドバンテスト
Priority to JP18549981U priority Critical patent/JPS5889867U/en
Publication of JPS5889867U publication Critical patent/JPS5889867U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は従来のＩＣ試験機用接触子を説明するための正
面図、第２図はこの考案の接触子の一実施例を示す斜視
図、第３図はこの考案の接触子の構造の一例を示す断面
図、第４図はこの考案の他の実施例を示す正面図、第５
図は第４図に示す実−流側を用いる接触子の構造を示す
断面図、第６図はこの考案の更に他の実施例を示す平面
図である。 ｌ、ＩＣ１４：端子ピン、７：接触子、８：導電性筒状
体、９：弾性体、１０：可動接触子。Fig. 1 is a front view for explaining a conventional contactor for an IC testing machine, Fig. 2 is a perspective view showing an embodiment of the contactor of this invention, and Fig. 3 is a structure of the contactor of this invention. FIG. 4 is a sectional view showing one example, FIG. 4 is a front view showing another embodiment of this invention, and FIG.
This figure is a sectional view showing the structure of a contactor using the real flow side shown in FIG. 4, and FIG. 6 is a plan view showing still another embodiment of this invention. l, IC14: terminal pin, 7: contact, 8: conductive cylindrical body, 9: elastic body, 10: movable contact.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ＩＣを順次測定部に送給し、その測定部においてＩＣの
端子ピンに接触子を接触させＩＣを動作させ、その良否
を判定するＩＣ試験機用接触子において、上記接触子は
導電性筒状体の中空部に弾性体を装着し、ぞの弾性体に
よって筒状体の端部から外方に向って可動接触子が弾性
的に突出支持させ、その可動接触子にＩＣの端子ピンを
圧接させて、可動接触子を通じてＩＣを動作させるよう
にしたｒｃ試験機用接触子。In a contactor for an IC tester, which sequentially feeds ICs to a measuring section, contacts the terminal pins of the ICs in the measuring section to operate the IC, and determines its acceptability, the contactor has a conductive cylindrical shape. An elastic body is attached to the hollow part of the body, and a movable contact is elastically supported by the elastic body to protrude outward from the end of the cylindrical body, and the terminal pin of the IC is pressed against the movable contact. A contact for an RC testing machine in which an IC is operated through a movable contact.
JP18549981U 1981-12-11 1981-12-11 Contactor for IC testing machine Pending JPS5889867U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18549981U JPS5889867U (en) 1981-12-11 1981-12-11 Contactor for IC testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18549981U JPS5889867U (en) 1981-12-11 1981-12-11 Contactor for IC testing machine

Publications (1)

Publication Number Publication Date
JPS5889867U true JPS5889867U (en) 1983-06-17

Family

ID=29986602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18549981U Pending JPS5889867U (en) 1981-12-11 1981-12-11 Contactor for IC testing machine

Country Status (1)

Country Link
JP (1) JPS5889867U (en)

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