JPS6180469U - - Google Patents

Info

Publication number
JPS6180469U
JPS6180469U JP16531784U JP16531784U JPS6180469U JP S6180469 U JPS6180469 U JP S6180469U JP 16531784 U JP16531784 U JP 16531784U JP 16531784 U JP16531784 U JP 16531784U JP S6180469 U JPS6180469 U JP S6180469U
Authority
JP
Japan
Prior art keywords
probe
circuit board
bringing
base
guide plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16531784U
Other languages
Japanese (ja)
Other versions
JPH0419503Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1984165317U priority Critical patent/JPH0419503Y2/ja
Publication of JPS6180469U publication Critical patent/JPS6180469U/ja
Application granted granted Critical
Publication of JPH0419503Y2 publication Critical patent/JPH0419503Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図および第２図はこの考案の回路基板検査
装置の実施例を示す断面図、第３図は従来の回路
基板検査装置を示す断面図、第４図は同従来装置
のプローブと、半田フイレツトの接触状態を示す
説明図である。 １１…ケーシング、１２…ラツク、１３…ベー
ス、１４…プローブ、１５…スリーブガイド、１
６…スプリング、１７…ガイド板、１７ａ…ガイ
ド孔、１８…スペーサ、１９…ピン。 1 and 2 are cross-sectional views showing an embodiment of the circuit board testing device of this invention, FIG. 3 is a cross-sectional view showing a conventional circuit board testing device, and FIG. 4 shows the probe and solder of the conventional device. FIG. 3 is an explanatory diagram showing a contact state of fillets. 11...Casing, 12...Rack, 13...Base, 14...Probe, 15...Sleeve guide, 1
6... Spring, 17... Guide plate, 17a... Guide hole, 18... Spacer, 19... Pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] プローブと回路基板とを互に相対的に接近させ
てプローブを半田フイレツトに圧力接触させて導
通検査を行う回路基板検査装置において、プロー
ブを取付けたベースと、このベースと重畳的にガ
イド板とを備え、前記ガイド板は、プローブの直
線方向の移動のみを許容するガイド孔を有し、回
路基板とプローブとが相対的に移動して接触した
場合、プローブの逃げを防止するように構成した
ことを特徴とする回路基板検査装置。 In a circuit board testing device that performs a continuity test by bringing a probe and a circuit board relatively close to each other and bringing the probe into pressure contact with a solder fillet, a base on which the probe is attached and a guide plate superimposed on the base are used. The guide plate has a guide hole that allows the probe to move only in a linear direction, and is configured to prevent the probe from escaping when the circuit board and the probe move relative to each other and come into contact with each other. A circuit board inspection device featuring:
JP1984165317U 1984-10-31 1984-10-31 Expired JPH0419503Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1984165317U JPH0419503Y2 (en) 1984-10-31 1984-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1984165317U JPH0419503Y2 (en) 1984-10-31 1984-10-31

Publications (2)

Publication Number Publication Date
JPS6180469U true JPS6180469U (en) 1986-05-28
JPH0419503Y2 JPH0419503Y2 (en) 1992-05-01

Family

ID=30723170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1984165317U Expired JPH0419503Y2 (en) 1984-10-31 1984-10-31

Country Status (1)

Country Link
JP (1) JPH0419503Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017146120A (en) * 2016-02-15 2017-08-24 富士ゼロックス株式会社 Inspection device and manufacturing method thereof

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101506663B1 (en) * 2013-10-18 2015-03-30 주식회사 에스에프이 Apparatus for supplying fluid

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54124964A (en) * 1978-03-10 1979-09-28 Rockwell International Corp Voltage level shifter
JPS5530368U (en) * 1978-08-19 1980-02-27
JPS56144365U (en) * 1980-03-31 1981-10-30
JPS57101974U (en) * 1980-12-12 1982-06-23
JPS5834063U (en) * 1981-08-31 1983-03-05 株式会社日立製作所 Universal connection jig for insert tester
JPS5882680U (en) * 1981-11-30 1983-06-04 スタンレー電気株式会社 Connection device for board testing
JPS6184568A (en) * 1984-10-02 1986-04-30 Yokowo Mfg Co Ltd In-circuit tester

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52101144A (en) * 1976-02-18 1977-08-24 Nsk Warner Kk Device for latching vehicle saffty belt buckle and method of assembling same
JPS5834063B2 (en) * 1979-05-01 1983-07-23 日本電信電話株式会社 Monitoring method for digital communication equipment

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54124964A (en) * 1978-03-10 1979-09-28 Rockwell International Corp Voltage level shifter
JPS5530368U (en) * 1978-08-19 1980-02-27
JPS56144365U (en) * 1980-03-31 1981-10-30
JPS57101974U (en) * 1980-12-12 1982-06-23
JPS5834063U (en) * 1981-08-31 1983-03-05 株式会社日立製作所 Universal connection jig for insert tester
JPS5882680U (en) * 1981-11-30 1983-06-04 スタンレー電気株式会社 Connection device for board testing
JPS6184568A (en) * 1984-10-02 1986-04-30 Yokowo Mfg Co Ltd In-circuit tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017146120A (en) * 2016-02-15 2017-08-24 富士ゼロックス株式会社 Inspection device and manufacturing method thereof

Also Published As

Publication number Publication date
JPH0419503Y2 (en) 1992-05-01

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