JPS63183561U - - Google Patents
Info
- Publication number
- JPS63183561U JPS63183561U JP7531387U JP7531387U JPS63183561U JP S63183561 U JPS63183561 U JP S63183561U JP 7531387 U JP7531387 U JP 7531387U JP 7531387 U JP7531387 U JP 7531387U JP S63183561 U JPS63183561 U JP S63183561U
- Authority
- JP
- Japan
- Prior art keywords
- contact probe
- inspection point
- contact
- probe
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 9
- 238000007689 inspection Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の一実施例を示すコンタクトプ
ローブの正面図、第２図は使用状態を示す両面回
路基板検査装置の部分概略図、第３図ａ，ｂはピ
ンボードに対するコンタクトでローブのセツト状
態を示す断面図である。
１……コンタクトプローブ、２……接触子、３
……スリーブ、３ａ……係合突条、４……ターミ
ナル、５……リード線、６……押圧子、７……被
検査回路基板、８，９……ピンボード、１０……
コンタクトプローブ、１１……挿通孔。
Fig. 1 is a front view of a contact probe showing an embodiment of the present invention, Fig. 2 is a partial schematic diagram of a double-sided circuit board inspection device showing the state of use, and Figs. FIG. 3 is a sectional view showing a set state. 1...Contact probe, 2...Contact element, 3
... Sleeve, 3a ... Engaging protrusion, 4 ... Terminal, 5 ... Lead wire, 6 ... Pusher, 7 ... Circuit board to be inspected, 8, 9 ... Pin board, 10 ...
Contact probe, 11...insertion hole.
Claims (1)
子を端部に進退自在に弾持して備えるコンタクト
プローブであつて、その外周には上記検査ポイン
トに接触した接触子を囲繞して被検査回路基板に
当接する押圧子を備えたコンタクトプローブ。 A contact probe is equipped with a contact probe that contacts an inspection point of a circuit board to be inspected and is movably supported at an end thereof, and the outer periphery of the probe is provided with a contact probe that contacts an inspection point of a circuit board to be inspected, surrounding the contact probe that has contacted the inspection point. A contact probe equipped with a pusher that comes into contact with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7531387U JPS63183561U (en) | 1987-05-20 | 1987-05-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7531387U JPS63183561U (en) | 1987-05-20 | 1987-05-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63183561U true JPS63183561U (en) | 1988-11-25 |
Family
ID=30921338
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7531387U Pending JPS63183561U (en) | 1987-05-20 | 1987-05-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63183561U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5322476A (en) * | 1976-08-13 | 1978-03-01 | Hitachi Ltd | Measuring jig |
| JPS6117670B2 (en) * | 1978-12-26 | 1986-05-08 | Fujitsu Ltd |
-
1987
- 1987-05-20 JP JP7531387U patent/JPS63183561U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5322476A (en) * | 1976-08-13 | 1978-03-01 | Hitachi Ltd | Measuring jig |
| JPS6117670B2 (en) * | 1978-12-26 | 1986-05-08 | Fujitsu Ltd |
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