JPH0245466U - - Google Patents

Info

Publication number
JPH0245466U
JPH0245466U JP12454888U JP12454888U JPH0245466U JP H0245466 U JPH0245466 U JP H0245466U JP 12454888 U JP12454888 U JP 12454888U JP 12454888 U JP12454888 U JP 12454888U JP H0245466 U JPH0245466 U JP H0245466U
Authority
JP
Japan
Prior art keywords
lead
contact probe
insulator
board
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12454888U
Other languages
Japanese (ja)
Other versions
JPH0611462Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12454888U priority Critical patent/JPH0611462Y2/en
Publication of JPH0245466U publication Critical patent/JPH0245466U/ja
Application granted granted Critical
Publication of JPH0611462Y2 publication Critical patent/JPH0611462Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案を適用したインサーキツトテス
ターにおけるコンタクトプローブの電気部品を装
着した半田付け前の基板に対する測定前の配置関
係を示す一部断面図、第2図及び第3図はその測
定時の配置関係を示す一部断面図である。第4図
は従来のインサーキツトテスターにおけるコンタ
クトプローブの電気部品を装着した半田付け前の
基板に対する測定前の配置関係を示す一部断面図
である。 24…基板、26…電気部品、28…リード、
30…リード穴、32…リード端部、36…コン
タクトプローブ、38…プローブ先端部、40…
リード挿入・引抜き自在穴、42…絶縁体。
Fig. 1 is a partial cross-sectional view showing the arrangement of the contact probe in an in-circuit tester to which the present invention is applied before measurement with respect to a board before soldering, on which electrical components are mounted, and Figs. 2 and 3 are during the measurement. FIG. 2 is a partial cross-sectional view showing the arrangement relationship. FIG. 4 is a partial sectional view showing the arrangement of a contact probe in a conventional in-circuit tester before measurement with respect to a board before soldering on which electrical components are mounted. 24... Board, 26... Electrical component, 28... Lead,
30... Lead hole, 32... Lead end, 36... Contact probe, 38... Probe tip, 40...
Lead insertion/extraction hole, 42...Insulator.

Claims (1)

【実用新案登録請求の範囲】 (1) 電気部品を装着した基板のリード穴から突
出するリード端部に対応するリード挿入・引抜き
自在穴を設けた絶縁体を先端部に被覆することを
特徴とする基板検査用コンタクトプローブ。 (2) 前記絶縁体が樹脂性のスリーブであること
を特徴とする第1項記載の基板検査用コンタクト
プローブ。
[Scope of Claim for Utility Model Registration] (1) The tip of the utility model is coated with an insulator with a hole that allows the lead to be inserted and pulled out corresponding to the lead end protruding from the lead hole of the board on which the electrical component is mounted. Contact probe for board inspection. (2) The contact probe for board inspection according to item 1, wherein the insulator is a resin sleeve.
JP12454888U 1988-09-22 1988-09-22 Contact probe for board inspection Expired - Lifetime JPH0611462Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12454888U JPH0611462Y2 (en) 1988-09-22 1988-09-22 Contact probe for board inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12454888U JPH0611462Y2 (en) 1988-09-22 1988-09-22 Contact probe for board inspection

Publications (2)

Publication Number Publication Date
JPH0245466U true JPH0245466U (en) 1990-03-28
JPH0611462Y2 JPH0611462Y2 (en) 1994-03-23

Family

ID=31374379

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12454888U Expired - Lifetime JPH0611462Y2 (en) 1988-09-22 1988-09-22 Contact probe for board inspection

Country Status (1)

Country Link
JP (1) JPH0611462Y2 (en)

Also Published As

Publication number Publication date
JPH0611462Y2 (en) 1994-03-23

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