JPS6039974U - Probe for in-circuit tester - Google Patents

Probe for in-circuit tester

Info

Publication number
JPS6039974U
JPS6039974U JP13273883U JP13273883U JPS6039974U JP S6039974 U JPS6039974 U JP S6039974U JP 13273883 U JP13273883 U JP 13273883U JP 13273883 U JP13273883 U JP 13273883U JP S6039974 U JPS6039974 U JP S6039974U
Authority
JP
Japan
Prior art keywords
probe
circuit tester
abstract
tester
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13273883U
Other languages
Japanese (ja)
Inventor
金野　恭久
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP13273883U priority Critical patent/JPS6039974U/en
Publication of JPS6039974U publication Critical patent/JPS6039974U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は、従来のインサーキットテスタ用プローブを説
明するための模式的構成図、第２図は、本考案に係るイ
ンサーキットテスタ用プローブの一実施例を説明するた
めの模式的構成図である。１図において、１はプローブ
、２は先端接触部、３は接続線、４は把握部、５は絶縁
筒をそれぞれ示す。FIG. 1 is a schematic configuration diagram for explaining a conventional in-circuit tester probe, and FIG. 2 is a schematic configuration diagram for explaining an embodiment of an in-circuit tester probe according to the present invention. be. In FIG. 1, 1 is a probe, 2 is a tip contact portion, 3 is a connection line, 4 is a grasping portion, and 5 is an insulating tube.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 多数の部品が搭載されたプリント板の試験を行なうイン
サーキットテスタ用プローブにおいて、該プローブの先
端部外周側面に、筒状の絶縁物を付設ししたことを特徴
とするインサーキットテスタ用プローブ。A probe for an in-circuit tester for testing a printed circuit board on which a large number of parts are mounted, characterized in that a cylindrical insulator is attached to the outer circumferential surface of the tip of the probe.
JP13273883U 1983-08-26 1983-08-26 Probe for in-circuit tester Pending JPS6039974U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13273883U JPS6039974U (en) 1983-08-26 1983-08-26 Probe for in-circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13273883U JPS6039974U (en) 1983-08-26 1983-08-26 Probe for in-circuit tester

Publications (1)

Publication Number Publication Date
JPS6039974U true JPS6039974U (en) 1985-03-20

Family

ID=30299661

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13273883U Pending JPS6039974U (en) 1983-08-26 1983-08-26 Probe for in-circuit tester

Country Status (1)

Country Link
JP (1) JPS6039974U (en)

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