JPS61112277U - - Google Patents
Info
- Publication number
- JPS61112277U JPS61112277U JP19957584U JP19957584U JPS61112277U JP S61112277 U JPS61112277 U JP S61112277U JP 19957584 U JP19957584 U JP 19957584U JP 19957584 U JP19957584 U JP 19957584U JP S61112277 U JPS61112277 U JP S61112277U
- Authority
- JP
- Japan
- Prior art keywords
- plunger
- tube
- electrical circuits
- tip
- urges
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims 1
- 239000000523 sample Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の一実施例を示す部分断面図、
第２図は第１図の平面図、第３図は従来例を示す
第１図相当図である。
１……チユーブ、１ａ……縮径抜け止め部、２
……プランジヤ、２ａ……ばね受け、３……先端
部、３ａ……尖端、４……コイルスプリング。
FIG. 1 is a partial sectional view showing an embodiment of the present invention;
FIG. 2 is a plan view of FIG. 1, and FIG. 3 is a diagram corresponding to FIG. 1 showing a conventional example. 1...Tube, 1a...Diameter reduction retaining part, 2
...Plunger, 2a...Spring receiver, 3...Tip, 3a...Point, 4...Coil spring.
Claims (1)
部内に抜け止めされた状態で軸方向に摺動自在に
挿入されたプランジヤと、このプランジヤの先端
に設けられ錐状をなす尖端が電気回路の検査点に
接触する先端部と、前記チユーブ内に配置されプ
ランジヤを外方に常時押圧付勢して所要の接触圧
を付与するスプリングとを備え、前記先端部の尖
端を、プランジヤの軸心から径方向に所要量偏位
させたことを特徴とする回路基板の電気回路検査
用コンタクトプローブ。 A conductive tube, a plunger inserted into the end of the tube so as to be slidable in the axial direction, and a conical point provided at the tip of the plunger are used as inspection points for electrical circuits. a spring disposed within the tube that constantly presses and urges the plunger outward to apply a required contact pressure; A contact probe for inspecting electrical circuits of circuit boards, characterized by being deflected by a required amount.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19957584U JPS61112277U (en) | 1984-12-27 | 1984-12-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19957584U JPS61112277U (en) | 1984-12-27 | 1984-12-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61112277U true JPS61112277U (en) | 1986-07-16 |
Family
ID=30759625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19957584U Pending JPS61112277U (en) | 1984-12-27 | 1984-12-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61112277U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011058908A (en) * | 2009-09-09 | 2011-03-24 | Hioki Ee Corp | Method and device for probing of contact probe |
-
1984
- 1984-12-27 JP JP19957584U patent/JPS61112277U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011058908A (en) * | 2009-09-09 | 2011-03-24 | Hioki Ee Corp | Method and device for probing of contact probe |
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