JPS61197576U - - Google Patents
Info
- Publication number
- JPS61197576U JPS61197576U JP8246285U JP8246285U JPS61197576U JP S61197576 U JPS61197576 U JP S61197576U JP 8246285 U JP8246285 U JP 8246285U JP 8246285 U JP8246285 U JP 8246285U JP S61197576 U JPS61197576 U JP S61197576U
- Authority
- JP
- Japan
- Prior art keywords
- wire
- wire beam
- guide body
- base end
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003780 insertion Methods 0.000 claims description 3
- 230000037431 insertion Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 6
- 238000005259 measurement Methods 0.000 claims 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Description
第1図は本考案の第1実施例を示す長手方向断
面図、第2図は第1図の―線断面図、第3図
は第1図の―線断面図、第4図は第1図の要
部拡大図、第5図は第4図の底面図、第6図は第
5図の―線断面図、第7図はワイヤガイド本
体、給電コネクタおよび給電プラグの接続状態を
示す詳細部分断面図、第8図は第7図の部拡大
図、第9図は第1図の平面図、第10図は本考案
の第2実施例を示す要部断面図、第11図は本考
案の第3実施例を示す第1図相当図、第12図は
第11図の―線断面図、第13図は第1
1図の底面図、第14図は第13図の―
線断面図、第15図は第11図の平面図、第16
図は第11図の要部拡大図である。
1…取付ボード、2…孔、3…ワイヤビームユ
ニツト、4,34…ワイヤガイド本体、4a,3
4a…基端フランジ、4b,34b…先端フラン
ジ、5…ワイヤビーム、8…ガイド孔、13…挿
通孔、14…抜け止めリング、14a…テーパガ
イド、16…給電コネクタ、17…給電プラグ、
19…本体、20…固定ねじ、21…ガイドピン
、23…導電性チユーブ、24…プランジヤ、2
4b…円錐部、25…鋼球、26…スプリング。
Fig. 1 is a longitudinal sectional view showing the first embodiment of the present invention, Fig. 2 is a sectional view taken along the line - - of Fig. 1, Fig. 3 is a sectional view taken along the line - - of Fig. 1, and Fig. 4 is a sectional view taken along the line - Figure 5 is a bottom view of Figure 4. Figure 6 is a cross-sectional view taken along the line - - in Figure 5. Figure 7 is a detail showing the connection state of the wire guide body, power supply connector, and power supply plug. 8 is an enlarged view of a portion of FIG. 7, FIG. 9 is a plan view of FIG. 1, FIG. 10 is a sectional view of a main part showing a second embodiment of the present invention, and FIG. FIG. 1 is a diagram corresponding to FIG. 1 showing the third embodiment of the invention, FIG. 12 is a sectional view taken along the line -- of FIG.
Figure 1 is the bottom view, Figure 14 is the bottom view of Figure 13.
Line sectional view, Fig. 15 is a plan view of Fig. 11, Fig. 16
The figure is an enlarged view of the main part of FIG. 11. 1... Mounting board, 2... Hole, 3... Wire beam unit, 4, 34... Wire guide body, 4a, 3
4a... base end flange, 4b, 34b... tip flange, 5... wire beam, 8... guide hole, 13... insertion hole, 14... retaining ring, 14a... taper guide, 16... power supply connector, 17... power supply plug,
19... Main body, 20... Fixing screw, 21... Guide pin, 23... Conductive tube, 24... Plunger, 2
4b...Cone part, 25...Steel ball, 26...Spring.
Claims (1)
する取付ボードと、この取付ボードに貫通固定さ
れ絶縁性を有するワイヤガイド本体と、このワイ
ヤガイド本体に装着される多数本のワイヤビーム
とを備え、各ワイヤビームの先端を回路基板の検
基点に接触させて電気的な測定検査を行なうとと
もに、各ワイヤビームのバツクリングにより検査
点との接触圧を得るようにした回路基板等の検査
装置であつて、前記ワイヤガイド本体の基端に、
ワイヤビームの基端が挿通される挿通孔を設ける
とともに、ワイヤビームの基端に抜け止め部を設
けて挿通孔後端壁に当接させることにより、ワイ
ヤビームの先端側への抜け止めを行ない、かつ前
記ワイヤガイド本体の基端部背後に給電コネクタ
を着脱可能に装着し、この給電コネクタに各ワイ
ヤビームに対応して設けた電気的接続金具を、前
記ワイヤビームの抜け止め部に背後から弾圧接触
させてワイヤビームとの電気的接続およびワイヤ
ビーム基端のワイヤガイド本体への固定を行なう
ことを特徴とする回路基板等の検査装置。 2 抜け止め部をワイヤビーム基端に固定した抜
け止めリングとし、このリングの後端にテーパ穴
状のガイドを設け、接続金具は、給電コネクタの
先端面に開口する孔内へ突出するプランジヤとし
、このプランジヤの先端の円錐部を前記テーパ穴
状ガイド内へ圧接したことを特徴とする実用新案
登録請求の範囲第1項記載の回路基板等の検査装
置。 3 プランジヤを先端側へ向かつて弾圧したこと
を特徴とする実用新案登録請求の範囲第2項記載
の回路基板等の検査装置。 4 給電コネクタの本体をワイヤガイド本体にガ
イドピンおよび固定ねじにより装着したことを特
徴とする実用新案登録請求の範囲第1項記載の回
路基板等の検査装置。[Claims for Utility Model Registration] 1. A mounting board that moves relative to the circuit board to be inspected, a wire guide body that is fixed through the mounting board and has an insulating property, and a wire guide body that is attached to the wire guide body and has an insulating property. It is equipped with a large number of wire beams, and the tip of each wire beam is brought into contact with a reference point on the circuit board to perform electrical measurement and inspection, and the contact pressure with the inspection point is obtained by buckling each wire beam. An inspection device for inspecting circuit boards, etc., which includes: a base end of the wire guide body;
In addition to providing an insertion hole through which the base end of the wire beam is inserted, a retaining portion is provided at the base end of the wire beam and abuts against the rear end wall of the insertion hole to prevent the wire beam from coming off toward the distal end side. , and a power supply connector is removably attached behind the base end of the wire guide body, and an electrical connection fitting provided on the power supply connector corresponding to each wire beam is connected to the retaining part of the wire beam from behind. An inspection device for a circuit board, etc., characterized in that it electrically connects to a wire beam and fixes the proximal end of the wire beam to a wire guide body through elastic contact. 2. The retaining part is a retaining ring fixed to the base end of the wire beam, a tapered hole-shaped guide is provided at the rear end of this ring, and the connecting fitting is a plunger that protrudes into the hole opened at the distal end surface of the power supply connector. 2. The apparatus for inspecting circuit boards and the like according to claim 1, wherein a conical portion at the tip of the plunger is pressed into the tapered hole-shaped guide. 3. An inspection device for circuit boards, etc., as set forth in claim 2 of the utility model registration claim, characterized in that the plunger is pressed toward the tip side. 4. An inspection device for circuit boards, etc., according to claim 1, wherein the main body of the power supply connector is attached to the wire guide main body with a guide pin and a fixing screw.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985082462U JPH0515108Y2 (en) | 1985-05-31 | 1985-05-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985082462U JPH0515108Y2 (en) | 1985-05-31 | 1985-05-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61197576U true JPS61197576U (en) | 1986-12-10 |
JPH0515108Y2 JPH0515108Y2 (en) | 1993-04-21 |
Family
ID=30630200
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985082462U Expired - Lifetime JPH0515108Y2 (en) | 1985-05-31 | 1985-05-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0515108Y2 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS587835A (en) * | 1981-06-30 | 1983-01-17 | インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン | Probe assembly |
JPS6011170A (en) * | 1983-06-30 | 1985-01-21 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Buckling pasting test-probe assembly |
-
1985
- 1985-05-31 JP JP1985082462U patent/JPH0515108Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS587835A (en) * | 1981-06-30 | 1983-01-17 | インタ−ナシヨナル・ビジネス・マシ−ンズ・コ−ポレ−シヨン | Probe assembly |
JPS6011170A (en) * | 1983-06-30 | 1985-01-21 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Buckling pasting test-probe assembly |
Also Published As
Publication number | Publication date |
---|---|
JPH0515108Y2 (en) | 1993-04-21 |
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