JPS61123976U - - Google Patents

Info

Publication number
JPS61123976U
JPS61123976U JP858785U JP858785U JPS61123976U JP S61123976 U JPS61123976 U JP S61123976U JP 858785 U JP858785 U JP 858785U JP 858785 U JP858785 U JP 858785U JP S61123976 U JPS61123976 U JP S61123976U
Authority
JP
Japan
Prior art keywords
contact
contact pin
socket
spring
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP858785U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP858785U priority Critical patent/JPS61123976U/ja
Publication of JPS61123976U publication Critical patent/JPS61123976U/ja
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案のスプリングコンタクトを構
成するスプリングピンの一部破断正面図、第2図
は従来のスプリングコンタクトの使用の一例を示
す正面図、第3図はスプリングピンの相互接触状
態を示す正面図である。 1……スプリングコンタクト、2……ピン受入
れソケツト、3……コンタクトピン、3a……頭
部、4……スプリング、5……絶縁コート層。
Fig. 1 is a partially cutaway front view of a spring pin constituting the spring contact of the present invention, Fig. 2 is a front view showing an example of the use of a conventional spring contact, and Fig. 3 shows the mutual contact state of the spring pins. FIG. DESCRIPTION OF SYMBOLS 1...Spring contact, 2...Pin receiving socket, 3...Contact pin, 3a...Head, 4...Spring, 5...Insulating coating layer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 絶縁性ベースに支持されて測定器の測定回路に
電気的に接続されるコンタクトピン受入れ用のソ
ケツトと、そのソケツトに頭部を突出させて挿入
したコンタクトピンと、ソケツトに内蔵されてコ
ンタクトピンを前方に付勢するスプリングとで構
成され、上記コンタクトピンを接点として被測定
物に接触させる測定器のスプリングコンタクトに
おいて、上記コンタクトピンの被測定物への接触
面を除く頭部外面に絶縁コート層を施したことを
特徴とするスプリングコンタクト。
A socket for receiving a contact pin supported by an insulating base and electrically connected to the measuring circuit of the measuring instrument, a contact pin inserted into the socket with its head protruding, and a contact pin inserted into the socket with its head protruding from the socket. In the spring contact of the measuring device, which is configured with a spring that biases the contact pin and makes contact with the object to be measured using the contact pin as a contact point, an insulating coating layer is provided on the outer surface of the head excluding the contact surface of the contact pin with the object to be measured. Spring contacts are characterized by:
JP858785U 1985-01-21 1985-01-21 Pending JPS61123976U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP858785U JPS61123976U (en) 1985-01-21 1985-01-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP858785U JPS61123976U (en) 1985-01-21 1985-01-21

Publications (1)

Publication Number Publication Date
JPS61123976U true JPS61123976U (en) 1986-08-04

Family

ID=30488012

Family Applications (1)

Application Number Title Priority Date Filing Date
JP858785U Pending JPS61123976U (en) 1985-01-21 1985-01-21

Country Status (1)

Country Link
JP (1) JPS61123976U (en)

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