JPH0342575U - - Google Patents

Info

Publication number
JPH0342575U
JPH0342575U JP10406689U JP10406689U JPH0342575U JP H0342575 U JPH0342575 U JP H0342575U JP 10406689 U JP10406689 U JP 10406689U JP 10406689 U JP10406689 U JP 10406689U JP H0342575 U JPH0342575 U JP H0342575U
Authority
JP
Japan
Prior art keywords
terminal
spring
socket
bracket
sandwiched
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10406689U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10406689U priority Critical patent/JPH0342575U/ja
Publication of JPH0342575U publication Critical patent/JPH0342575U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す斜視図、第2
図は第1図のA−A線断面図、第3図は第1図の
B−B線断面図である。 1……ICテスト用ソケツト、2……表面実装
IC、11……ブラケツト、12……固定端子、
13……可動端子、14……スプリング、15…
…収納部、16……スプリング、17……ピン、
18……支持部、21……IC端子。
Fig. 1 is a perspective view showing one embodiment of the present invention;
The figure is a cross-sectional view taken along the line A--A in FIG. 1, and FIG. 3 is a cross-sectional view taken along the line B--B in FIG. 1... IC test socket, 2... Surface mount IC, 11... Bracket, 12... Fixed terminal,
13...Movable terminal, 14...Spring, 15...
...Storage part, 16...Spring, 17...Pin,
18...Support part, 21...IC terminal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ICの端子に対してスプリングによる圧着機構
を有する第1の端子と、前記第1の端子と電気的
に接続され測定用のプローブを接続できる第2の
端子と、前記ICをスプリングの力ではさみ込む
ことができ且つ前記第1および第2の端子含む絶
縁構造のブラケツトとを有して成ることを特徴と
するICテスト用ソケツト。
a first terminal having a spring-based crimping mechanism for the terminal of the IC; a second terminal electrically connected to the first terminal to which a measurement probe can be connected; and the IC being sandwiched by the force of the spring. 1. A socket for IC testing, comprising: a bracket having an insulating structure, which can be inserted into the socket and includes the first and second terminals.
JP10406689U 1989-09-04 1989-09-04 Pending JPH0342575U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10406689U JPH0342575U (en) 1989-09-04 1989-09-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10406689U JPH0342575U (en) 1989-09-04 1989-09-04

Publications (1)

Publication Number Publication Date
JPH0342575U true JPH0342575U (en) 1991-04-22

Family

ID=31652875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10406689U Pending JPH0342575U (en) 1989-09-04 1989-09-04

Country Status (1)

Country Link
JP (1) JPH0342575U (en)

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