JPS63182534U - - Google Patents
Info
- Publication number
- JPS63182534U JPS63182534U JP7503787U JP7503787U JPS63182534U JP S63182534 U JPS63182534 U JP S63182534U JP 7503787 U JP7503787 U JP 7503787U JP 7503787 U JP7503787 U JP 7503787U JP S63182534 U JPS63182534 U JP S63182534U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probe card
- contactor
- card
- insulating base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 13
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の第１の実施例のプローブカー
ドの裏面図、第２図は本考案のプローブカードで
、ＩＣソケツトを実装した絶縁基体を外した時の
斜視図、第３図は、本考案のプローブカードで、
回路部品を実装した絶縁基体を取り付けた時の斜
視図、第４図は従来のプローブカードの斜視図で
ある。
１……プローブカード、２……ターミナルピン
、３……プローブ、４……第一接触子、５……第
二接触子、６……絶縁基体、７……ＩＣソケツト
、８……回路部品、９……開孔部。
Figure 1 is a back view of the probe card of the first embodiment of the present invention, Figure 2 is a perspective view of the probe card of the present invention with the insulating base on which the IC socket mounted is removed, and Figure 3 is With the probe card of this invention,
FIG. 4 is a perspective view of a conventional probe card when an insulating base on which circuit components are mounted is attached. 1... Probe card, 2... Terminal pin, 3... Probe, 4... First contact, 5... Second contact, 6... Insulating base, 7... IC socket, 8... Circuit component , 9...opening section.
Claims (1)
ド本体の下端面のプローブを集積回路素子の電極
に接触させるプローブカードにおいて、前記プロ
ーブと一対一に対応し、かつ電気的に導通した接
触子をプローブガード本体に持ち、該接触子と嵌
合する接触子を有する絶縁基体と接続して成るこ
とを特徴とするプローブカード。 In a probe card in which a probe on the lower end surface of a probe card body is brought into contact with an electrode of an integrated circuit element by being supported by a relay member of a prober, a contactor that corresponds one-to-one with the probe and is electrically conductive is attached to a probe guard body. 1. A probe card, characterized in that the probe card is connected to an insulating base body having a contactor that fits into the contactor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7503787U JPS63182534U (en) | 1987-05-18 | 1987-05-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7503787U JPS63182534U (en) | 1987-05-18 | 1987-05-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63182534U true JPS63182534U (en) | 1988-11-24 |
Family
ID=30920814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7503787U Pending JPS63182534U (en) | 1987-05-18 | 1987-05-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63182534U (en) |
-
1987
- 1987-05-18 JP JP7503787U patent/JPS63182534U/ja active Pending