JPH01124567U - - Google Patents
Info
- Publication number
- JPH01124567U JPH01124567U JP16297087U JP16297087U JPH01124567U JP H01124567 U JPH01124567 U JP H01124567U JP 16297087 U JP16297087 U JP 16297087U JP 16297087 U JP16297087 U JP 16297087U JP H01124567 U JPH01124567 U JP H01124567U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- board
- printed circuit
- contact portion
- test pins
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案のプリント基板の検査用のテス
トピンの斜視図であり、第２図は本考案の断面図
であり、第３図は本考案の使用状態の断面図であ
る。
１……テストピンの接点部、２……らせん状の
溝、３……テストピンの受け部、４……突起、５
……ばね、６……プリント基板、７……外部から
の力。
FIG. 1 is a perspective view of a test pin for inspecting a printed circuit board according to the present invention, FIG. 2 is a cross-sectional view of the present invention, and FIG. 3 is a cross-sectional view of the present invention in use. DESCRIPTION OF SYMBOLS 1...Test pin contact part, 2...Spiral groove, 3...Test pin receiving part, 4...Protrusion, 5
...Spring, 6...Printed circuit board, 7...External force.
Claims (1)
テストピンに関し、先端の尖つたミサイル型をし
た接点部と、それを挿入させて上下運動をさせる
円筒形の受け部と受け部と、接点部と受け部の間
にばねを入れた構造をしているものにおいて、接
点部の側面にらせん状の溝を刻み、かつ受け部の
内側に突起を設け、接点部が基板に押さえられて
下降すると同時に回転するようにして、基板と接
点部の不接触による導通不良を妨げることを特徴
とするプリント基板の検査用のテストピン。 Regarding test pins used to inspect printed circuit boards with components mounted on them, there are two types of test pins: a missile-shaped contact portion with a pointed tip, a cylindrical receiving portion into which it is inserted to move it up and down, and a contact portion and a receiving portion. A device with a structure in which a spring is inserted between the contact parts has a spiral groove cut into the side surface of the contact part, and a protrusion is provided inside the receiving part, so that the contact part is pressed down by the board and rotates at the same time. A test pin for inspecting a printed circuit board, characterized in that it prevents conduction defects due to non-contact between the board and the contact portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16297087U JPH01124567U (en) | 1987-10-23 | 1987-10-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16297087U JPH01124567U (en) | 1987-10-23 | 1987-10-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01124567U true JPH01124567U (en) | 1989-08-24 |
Family
ID=31447276
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16297087U Pending JPH01124567U (en) | 1987-10-23 | 1987-10-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01124567U (en) |
-
1987
- 1987-10-23 JP JP16297087U patent/JPH01124567U/ja active Pending
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