JPH01124567U - - Google Patents

Info

Publication number
JPH01124567U
JPH01124567U JP16297087U JP16297087U JPH01124567U JP H01124567 U JPH01124567 U JP H01124567U JP 16297087 U JP16297087 U JP 16297087U JP 16297087 U JP16297087 U JP 16297087U JP H01124567 U JPH01124567 U JP H01124567U
Authority
JP
Japan
Prior art keywords
contact
board
printed circuit
contact portion
test pins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16297087U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16297087U priority Critical patent/JPH01124567U/ja
Publication of JPH01124567U publication Critical patent/JPH01124567U/ja
Pending legal-status Critical Current

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Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案のプリント基板の検査用のテス
トピンの斜視図であり、第2図は本考案の断面図
であり、第3図は本考案の使用状態の断面図であ
る。 1……テストピンの接点部、2……らせん状の
溝、3……テストピンの受け部、4……突起、5
……ばね、6……プリント基板、7……外部から
の力。
FIG. 1 is a perspective view of a test pin for inspecting a printed circuit board according to the present invention, FIG. 2 is a cross-sectional view of the present invention, and FIG. 3 is a cross-sectional view of the present invention in use. DESCRIPTION OF SYMBOLS 1...Test pin contact part, 2...Spiral groove, 3...Test pin receiving part, 4...Protrusion, 5
...Spring, 6...Printed circuit board, 7...External force.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 部品実装されたプリント基板の検査に使用する
テストピンに関し、先端の尖つたミサイル型をし
た接点部と、それを挿入させて上下運動をさせる
円筒形の受け部と受け部と、接点部と受け部の間
にばねを入れた構造をしているものにおいて、接
点部の側面にらせん状の溝を刻み、かつ受け部の
内側に突起を設け、接点部が基板に押さえられて
下降すると同時に回転するようにして、基板と接
点部の不接触による導通不良を妨げることを特徴
とするプリント基板の検査用のテストピン。
Regarding test pins used to inspect printed circuit boards with components mounted on them, there are two types of test pins: a missile-shaped contact portion with a pointed tip, a cylindrical receiving portion into which it is inserted to move it up and down, and a contact portion and a receiving portion. A device with a structure in which a spring is inserted between the contact parts has a spiral groove cut into the side surface of the contact part, and a protrusion is provided inside the receiving part, so that the contact part is pressed down by the board and rotates at the same time. A test pin for inspecting a printed circuit board, characterized in that it prevents conduction defects due to non-contact between the board and the contact portion.
JP16297087U 1987-10-23 1987-10-23 Pending JPH01124567U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16297087U JPH01124567U (en) 1987-10-23 1987-10-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16297087U JPH01124567U (en) 1987-10-23 1987-10-23

Publications (1)

Publication Number Publication Date
JPH01124567U true JPH01124567U (en) 1989-08-24

Family

ID=31447276

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16297087U Pending JPH01124567U (en) 1987-10-23 1987-10-23

Country Status (1)

Country Link
JP (1) JPH01124567U (en)

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