JPH0217672U - - Google Patents

Info

Publication number
JPH0217672U
JPH0217672U JP9707088U JP9707088U JPH0217672U JP H0217672 U JPH0217672 U JP H0217672U JP 9707088 U JP9707088 U JP 9707088U JP 9707088 U JP9707088 U JP 9707088U JP H0217672 U JPH0217672 U JP H0217672U
Authority
JP
Japan
Prior art keywords
probe
tip
conductive rubber
probe pin
showing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9707088U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9707088U priority Critical patent/JPH0217672U/ja
Publication of JPH0217672U publication Critical patent/JPH0217672U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例1を示す縦断面図、第
2図は本考案の実施例2を示す縦断面図、第3図
a,bは従来のプローブを示す縦断面図、第4図
は従来のプローブのプローブピンがソルダー・レ
ジストに接触した状態を示す図、第5図は本考案
のプローブの導電ゴムが微小幅パツドに接触した
状態を示す図である。 1……導電ゴムからなるチツプ、2……プロー
ブピン、3……スプリング、4……ハウジング、
5……鋭角のプローブピン、6……プリント配線
板、7……微小幅パツド、8……ソルダー・レジ
スト。
FIG. 1 is a vertical sectional view showing a first embodiment of the present invention, FIG. 2 is a vertical sectional view showing a second embodiment of the present invention, FIGS. 3 a and b are longitudinal sectional views showing a conventional probe, and FIG. The figure shows a state in which the probe pin of a conventional probe is in contact with the solder resist, and FIG. 5 is a view showing a state in which the conductive rubber of the probe of the present invention is in contact with a minute width pad. 1... Chip made of conductive rubber, 2... Probe pin, 3... Spring, 4... Housing,
5...Sharp probe pin, 6...Printed wiring board, 7...Minute width pad, 8...Solder resist.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被接触物に接続させるプローブピンの先端に導
電性ゴムからなるチツプを取付けたことを特徴と
するプローブ。
A probe characterized in that a tip made of conductive rubber is attached to the tip of a probe pin that is connected to an object to be contacted.
JP9707088U 1988-07-22 1988-07-22 Pending JPH0217672U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9707088U JPH0217672U (en) 1988-07-22 1988-07-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9707088U JPH0217672U (en) 1988-07-22 1988-07-22

Publications (1)

Publication Number Publication Date
JPH0217672U true JPH0217672U (en) 1990-02-05

Family

ID=31322284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9707088U Pending JPH0217672U (en) 1988-07-22 1988-07-22

Country Status (1)

Country Link
JP (1) JPH0217672U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017227476A (en) * 2016-06-21 2017-12-28 株式会社デンソーウェーブ Electrode, electrostatic testing device, and electrostatic testing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017227476A (en) * 2016-06-21 2017-12-28 株式会社デンソーウェーブ Electrode, electrostatic testing device, and electrostatic testing method

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