JPH0217672U - - Google Patents
Info
- Publication number
- JPH0217672U JPH0217672U JP9707088U JP9707088U JPH0217672U JP H0217672 U JPH0217672 U JP H0217672U JP 9707088 U JP9707088 U JP 9707088U JP 9707088 U JP9707088 U JP 9707088U JP H0217672 U JPH0217672 U JP H0217672U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- tip
- conductive rubber
- probe pin
- showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 229910000679 solder Inorganic materials 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案の実施例１を示す縦断面図、第
２図は本考案の実施例２を示す縦断面図、第３図
ａ，ｂは従来のプローブを示す縦断面図、第４図
は従来のプローブのプローブピンがソルダー・レ
ジストに接触した状態を示す図、第５図は本考案
のプローブの導電ゴムが微小幅パツドに接触した
状態を示す図である。
１……導電ゴムからなるチツプ、２……プロー
ブピン、３……スプリング、４……ハウジング、
５……鋭角のプローブピン、６……プリント配線
板、７……微小幅パツド、８……ソルダー・レジ
スト。
FIG. 1 is a vertical sectional view showing a first embodiment of the present invention, FIG. 2 is a vertical sectional view showing a second embodiment of the present invention, FIGS. 3 a and b are longitudinal sectional views showing a conventional probe, and FIG. The figure shows a state in which the probe pin of a conventional probe is in contact with the solder resist, and FIG. 5 is a view showing a state in which the conductive rubber of the probe of the present invention is in contact with a minute width pad. 1... Chip made of conductive rubber, 2... Probe pin, 3... Spring, 4... Housing,
5...Sharp probe pin, 6...Printed wiring board, 7...Minute width pad, 8...Solder resist.
Claims (1)
電性ゴムからなるチツプを取付けたことを特徴と
するプローブ。 A probe characterized in that a tip made of conductive rubber is attached to the tip of a probe pin that is connected to an object to be contacted.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9707088U JPH0217672U (en) | 1988-07-22 | 1988-07-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9707088U JPH0217672U (en) | 1988-07-22 | 1988-07-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0217672U true JPH0217672U (en) | 1990-02-05 |
Family
ID=31322284
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9707088U Pending JPH0217672U (en) | 1988-07-22 | 1988-07-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0217672U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017227476A (en) * | 2016-06-21 | 2017-12-28 | 株式会社デンソーウェーブ | Electrode, electrostatic testing device, and electrostatic testing method |
-
1988
- 1988-07-22 JP JP9707088U patent/JPH0217672U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017227476A (en) * | 2016-06-21 | 2017-12-28 | 株式会社デンソーウェーブ | Electrode, electrostatic testing device, and electrostatic testing method |