JPH02729U - - Google Patents

Info

Publication number
JPH02729U
JPH02729U JP7742488U JP7742488U JPH02729U JP H02729 U JPH02729 U JP H02729U JP 7742488 U JP7742488 U JP 7742488U JP 7742488 U JP7742488 U JP 7742488U JP H02729 U JPH02729 U JP H02729U
Authority
JP
Japan
Prior art keywords
needle
pellet
terminal pin
measured
probe card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7742488U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7742488U priority Critical patent/JPH02729U/ja
Publication of JPH02729U publication Critical patent/JPH02729U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図はそれぞれ本考案の一実施例
及び他の実施例を示す全体図、第3図は従来のプ
ローブカードの全体図である。 1,4……円形プリント基板、2,5……ニー
ドル、3,6……ターミナルピン、7……円形プ
リント基板、8……ニードル、9……ターミナル
ピン。
FIGS. 1 and 2 are overall views showing one embodiment and another embodiment of the present invention, respectively, and FIG. 3 is an overall view of a conventional probe card. 1, 4... Circular printed circuit board, 2, 5... Needle, 3, 6... Terminal pin, 7... Circular printed circuit board, 8... Needle, 9... Terminal pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 円形のプリント基板に被測定ペレツトのボンデ
イングパツトに接触するニードルと、被測定ペレ
ツトを試験する半導体テスター側と電気的に接触
するターミナルピンとを備えたプローブカードに
於いて、前記ターミナルピンがニードルと同一方
向にある事を特徴とするプローブカード。
In a probe card equipped with a circular printed circuit board, a needle that contacts the bonding pad of the pellet to be measured, and a terminal pin that electrically contacts the semiconductor tester side that tests the pellet to be measured, the terminal pin is the same as the needle. A probe card that is characterized by its orientation.
JP7742488U 1988-06-10 1988-06-10 Pending JPH02729U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7742488U JPH02729U (en) 1988-06-10 1988-06-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7742488U JPH02729U (en) 1988-06-10 1988-06-10

Publications (1)

Publication Number Publication Date
JPH02729U true JPH02729U (en) 1990-01-05

Family

ID=31302409

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7742488U Pending JPH02729U (en) 1988-06-10 1988-06-10

Country Status (1)

Country Link
JP (1) JPH02729U (en)

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