JPH01136463U - - Google Patents

Info

Publication number
JPH01136463U
JPH01136463U JP3212688U JP3212688U JPH01136463U JP H01136463 U JPH01136463 U JP H01136463U JP 3212688 U JP3212688 U JP 3212688U JP 3212688 U JP3212688 U JP 3212688U JP H01136463 U JPH01136463 U JP H01136463U
Authority
JP
Japan
Prior art keywords
recess
contact probe
sleeve
probe
solder layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3212688U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3212688U priority Critical patent/JPH01136463U/ja
Publication of JPH01136463U publication Critical patent/JPH01136463U/ja
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aは、本考案の実施例におけるコンタク
トプローブの側面図、第1図bは第1図aの使用
例を示す図。第2図aは、従来例におけるコンタ
クトプローブの側面図、第2図bは第2図aの使
用例を示す図。第3図は、本考案の別の実施例に
おけるコンタクトプローブの側面図。 1……プローブ本体、2……スリーブ、3……
スリーブ支持体、4……ハンダ、5……導線、6
……測定機、7……ハンダ層、8……加熱部材。
FIG. 1a is a side view of a contact probe according to an embodiment of the present invention, and FIG. 1b is a diagram showing an example of the use of FIG. 1a. FIG. 2a is a side view of a conventional contact probe, and FIG. 2b is a diagram showing an example of use of FIG. 2a. FIG. 3 is a side view of a contact probe in another embodiment of the present invention. 1...Probe body, 2...Sleeve, 3...
Sleeve support, 4...Solder, 5...Conductor, 6
... Measuring device, 7 ... Solder layer, 8 ... Heating member.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 回路基板等の検査に用いるプローブ本体とスリ
ーブよりなるコンタクトプローブにおいて、前記
コンタクトプローブのスリーブの頭部に凹部を形
成し、該凹部にハンダ層が形成されていることを
特徴とするコンタクトプローブ。
1. A contact probe comprising a probe body and a sleeve used for inspecting circuit boards, etc., characterized in that a recess is formed in the head of the sleeve of the contact probe, and a solder layer is formed in the recess.
JP3212688U 1988-03-10 1988-03-10 Pending JPH01136463U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3212688U JPH01136463U (en) 1988-03-10 1988-03-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3212688U JPH01136463U (en) 1988-03-10 1988-03-10

Publications (1)

Publication Number Publication Date
JPH01136463U true JPH01136463U (en) 1989-09-19

Family

ID=31258444

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3212688U Pending JPH01136463U (en) 1988-03-10 1988-03-10

Country Status (1)

Country Link
JP (1) JPH01136463U (en)

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