JPH0187270U - - Google Patents
Info
- Publication number
- JPH0187270U JPH0187270U JP18260587U JP18260587U JPH0187270U JP H0187270 U JPH0187270 U JP H0187270U JP 18260587 U JP18260587 U JP 18260587U JP 18260587 U JP18260587 U JP 18260587U JP H0187270 U JPH0187270 U JP H0187270U
- Authority
- JP
- Japan
- Prior art keywords
- guide
- contact
- board
- guide rods
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は、この考案に係るピンボード構造の一
例を示す概略側面図、第２図は、従来例としての
ピンボード構造を示す概略側面図である。
１……ピンボード、２……ガイド棒、３……コ
ンタクトプローブ、４……通孔、５……ソケツト
、６……スプリング、７……小径部、８……押圧
部材、９……ストツパー片、１０……支腕部、１
１……検出用スイツチ、２１……被測定基板、２
２……ガイド孔、２３……部品、２５……押し棒
。
FIG. 1 is a schematic side view showing an example of a pinboard structure according to this invention, and FIG. 2 is a schematic side view showing a conventional pinboard structure. 1...Pin board, 2...Guide rod, 3...Contact probe, 4...Through hole, 5...Socket, 6...Spring, 7...Small diameter part, 8...Press member, 9...Stopper Piece, 10... Support arm, 1
1... Detection switch, 21... Board to be measured, 2
2...Guide hole, 23...Parts, 25...Push rod.
Claims (1)
当接するために用いられるピンボードには、前記
被測定基板に設けられたガイド孔に対しこれを案
内して支持するために挿入される複数本のガイド
棒を進退可能に植設するとともに、これらのガイ
ド棒の終端部には、その下方に配設されている検
出用スイツチに対し、ガイド棒の下降量が異常に
大きいときに押圧接触することができる押圧部材
を配設したことを特徴とするインサーキツトテス
タ用ピンボード構造。 The pin board used to bring the contact probe into contact with the measurement position of the board to be measured includes a plurality of guide rods inserted to guide and support guide holes provided in the board to be measured. The guide rods are installed so that they can move forward and backward, and the terminal ends of these guide rods can be pressed into contact with a detection switch installed below when the amount of descent of the guide rod is abnormally large. A pinboard structure for an in-circuit tester characterized by having a pressing member arranged therein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260587U JPH0623976Y2 (en) | 1987-11-30 | 1987-11-30 | Pinboard structure for in-circuit tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260587U JPH0623976Y2 (en) | 1987-11-30 | 1987-11-30 | Pinboard structure for in-circuit tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0187270U true JPH0187270U (en) | 1989-06-08 |
| JPH0623976Y2 JPH0623976Y2 (en) | 1994-06-22 |
Family
ID=31474052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18260587U Expired - Lifetime JPH0623976Y2 (en) | 1987-11-30 | 1987-11-30 | Pinboard structure for in-circuit tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0623976Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021867A (en) * | 2013-07-19 | 2015-02-02 | 三菱電機株式会社 | Semiconductor device test tool |
-
1987
- 1987-11-30 JP JP18260587U patent/JPH0623976Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021867A (en) * | 2013-07-19 | 2015-02-02 | 三菱電機株式会社 | Semiconductor device test tool |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0623976Y2 (en) | 1994-06-22 |