JPH0623976Y2 - Pinboard structure for in-circuit tester - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial application] The present invention relates to a pinboard structure for an in-circuit tester, and more specifically, an in-circuit tester designed to prevent damage when inspecting a board under test. For pinboard structure for automobiles.

[Prior Art] Recently, an in-circuit tester is often used as an inspection machine for finding a manufacturing defect due to a solder bridge or an erroneous insertion of a component on a substrate to be measured after mounting a component such as a semiconductor element. Used on the production line. by the way,
When inspecting a board to be measured using such an in-circuit tester, a large number of contact probes implanted in the pin board forming the in-circuit tester are forced to a predetermined point on the board to be measured. A fixture is required to make contact with. Regarding this fixture, there are a press type one in which the substrate to be measured is brought into contact with the contact probe by pushing it down from above with a push rod, and a bakium type one in which the substrate to be measured is brought into contact with the contact probe by atmospheric pressure caused by vacuuming. There is.

FIG. 2 shows a conventional structure in the case where the fixture of the in-circuit tester is of the press type. The pin board 31 is provided in the measured substrate 41 on which the component 42 is mounted. A plurality of guide rods 32 that are accurately positioned in relation to the guide holes 43 are implanted. The substrate 41 to be measured has a guide rod 32 through the guide hole 43.
Is inserted and is horizontally supported by a flat pin 33 which is planted so as to be able to move forward and backward, and is pushed down by a push rod 45 to come into contact with the contact probe 34, and the substrate to be measured 41 You can get information from.

[Problems to be solved by the invention] By the way, in the case of the fixture having the structure shown in FIG.
If flux adheres to the guide hole 43 pre-drilled in the substrate 41 to be measured, or if the substrate 41 to be measured itself warps due to some reason, the positional relationship will shift when the push rod 45 pushes down the guide. Guide the rod 32
There was a risk that the board to be measured 41, the guide rod 32, and the like could not be smoothly inserted into the board 43 and might be damaged. In particular, if such a situation occurs when the manufacturing line is an in-line type, the damage accidents may occur one after another.

[Means for Solving Problems] The present invention has been made in view of the above problems found in press-type fixtures, and the structural feature thereof is that the measurement position of a substrate to be measured is contacted. In the pin board used for abutting the probe, a plurality of guide rods inserted for guiding and supporting the guide hole provided in the substrate to be measured are implanted so as to be movable back and forth. At the end of these guide rods, a pressing member is provided that can press-contact the detection switch disposed below the guide rod when the amount of lowering of the guide rod is abnormally large. is there.

[Embodiment] An embodiment of the present invention will be described below with reference to the drawings.

The guide rod 2 for accurately positioning and guiding the substrate to be measured 21 on which the appropriate component 23 is mounted enables a large number of contact probes 3 to advance and retract so as to come into contact with the measurement position of the substrate to be measured 21. A plurality of pinboards 1 are planted at appropriate positions so as to be planted.

In this case, a specific mounting structure of the guide rod 2 to the pin board 1 is as follows. First, the outer diameter of the through hole 4 of the pin board 1 which is previously drilled is slightly larger than the outer diameter of the through hole 4. A coil-shaped spring 6 is attached to the lower end of the formed socket 5 so that it cannot be easily removed, and then the socket 5 is press-fitted and fixed. The socket 5 fixed to the pin board 1 in this way has a guide rod 2 having a small diameter portion 7 at the lower end.
Is inserted, the end portion of the small diameter portion 7 is fixed to the pressing member 8 together with the end portion of the spring 6, and the guide rod 2 is supported by the socket 5 so as to be able to move forward and backward. Further, a stopper piece for horizontally supporting the substrate to be measured 21 guided through a guide hole 22 provided in advance at a predetermined position at an appropriate position of the tip of the guide rod 2 at a fixed position. 9 is attached.

On the other hand, below the pin board 1, a supporting arm portion 10 fixed to the pin board 1 is interposed so that a positional relationship capable of being brought into contact with the pressing member 8 fixed to the guide rod 2 if necessary. Therefore, the detection switch 11 is provided.
Regarding the specific positional relationship between the pressing member 8 and the detection switch 11 in this case, the substrate to be measured 21 is correctly set on the guide rod 2 via the stopper piece 9,
Moreover, when the push rod 25 is pushed down to the point where it comes into contact with the contact probe 3, the pushing member 8 is arranged at a distance so that it does not come into pushing contact with the detection switch 11. In addition, foreign matter such as flux adheres to the inside of the guide hole 22 of the measured substrate 21, or the measured substrate 21
When the guide rod 2 that should have been inserted smoothly cannot be properly inserted into the guide hole 22 due to the warping of itself, etc., the substrate to be measured when the push rod 25 pushes it down.
Before the contact member 21 and the contact probe 3 come into contact with each other, the pressing member 8 comes into press contact with the detection switch 11 to turn off the switch.
They are arranged in a positional relationship that can be F or ON.

Since the present invention is configured in this way, when the board to be measured 21 is to be inspected, the plurality of guide rods 2 that are planted on the pin board 1 so as to be able to move back and forth are installed on the board to be measured. It is set by inserting it into a guide hole 22 formed in 21. At this time, since a stopper piece 9 for horizontally supporting the substrate 21 to be measured is attached to the tip portion of the guide rod 2, the stopper piece 9 can be supported and set correctly. In this way, the measured substrate 21
After setting to the guide rod 2, the push rod 25 is lowered to press the substrate 21 to be measured, and until it comes into contact with the predetermined contact probe 3, the predetermined information is taken in and then the push rod 25 is used. The inspection work can be completed by releasing the pressing force.

On the other hand, if the flux adheres to the guide hole 22 of the substrate to be measured 21 or if the substrate to be measured 21 itself warps due to some reason, the guide rod 2 cannot be correctly inserted into the guide hole 22. For example, there is a case where a portion other than the guide hole 22 of the substrate to be measured 21 rides on the guide rod 2, or the guide rod 2 is caught in the guide hole 22 and cannot be smoothly inserted.
When the substrate to be measured 21 is pushed down by the push rod 25 while being improperly set, the substrate to be measured 21 is added to the guide rod 2 by an amount equal to the length of the guide rod 2 not properly inserted. As a result, the pressing member 8 fixed to the terminal end of the pressing member 2 comes into pressing contact with the detection switch 11. Therefore, when the setting of the substrate to be measured 21 is inappropriate, the power switch can be automatically turned off or on, and the substrate to be measured 21 or the guide rod 2 is damaged by being forcedly pressed. Can be prevented in advance. Therefore, it can be suitably used as a pinboard structure of an in-line type in-circuit tester.

[Advantage of the Invention] As described above, according to the present invention, the suitability of the set of the substrate to be measured can be determined by the pressing member fixed to the terminal end of the guide rod and the detection switch arranged so as to be in contact with the pressing member. Since it can be automatically known, it is possible to effectively prevent the risk of damaging the board to be measured or the guide rod.
It can be suitably used as a pinboard structure of an in-line type in-circuit tester.

[Brief description of drawings]

FIG. 1 is a schematic side view showing an example of a pinboard structure according to the present invention, and FIG. 2 is a schematic side view showing a pinboard structure as a conventional example. 1 ... pin board, 2 ... guide rod, 3 ... contact probe, 4 ... through hole, 5 ... socket, 6 ... spring, 7 ... small diameter part, 8 ... pressing member, 9 ... stopper One, 10 ... Support arm, 11 ... Detection switch, 21 ... Substrate to be measured, 22 ... Guide hole, 23 ... Parts, 25 ... Push rod

Claims (1)

[Scope of utility model registration request] 1. A pin board used to bring a contact probe into contact with a measurement position of a substrate to be measured is inserted to guide and support a guide hole provided in the substrate to be measured. A plurality of guide rods are planted so that they can move forward and backward, and the end portions of these guide rods are pressed against the detection switch located below them when the guide rod descends abnormally. A pinboard structure for an in-circuit tester, characterized in that a pressing member capable of contacting is arranged.