JPH08122005A - Method and jig for inspection of pin height of electronic component comprising plurality of pins - Google Patents

Abstract

PURPOSE: To provide a method and a jig for inspecting the height of pin of an electronic component, in which the inspection can be executed simply and at a low cost and in which the maintenance of the jig can be made easy in the inspection method for the pin height in an electronic component comprising a plurality of pins, and in the jig for inspection, which is used for it. CONSTITUTION: The jig 1 for inspection constituted of a block 3 in which holes 2 have been opened and made into a lattice shape, and of a plurality of pins 4 which have a springy property in the radial direction in parts coming into contact with the holes 2 and in which flanges 42 having a diameter larger than the diameter of every hole have been formed at both ends is used. Every flange 42 on one side 31 is pressed to one face of the block 3 so as to come into close contact with it, every flange 42 on the other side is brought into contact with the tip of every pin for an electronic component as an inspection object, the block 3 is pressed to the side of the electronic component, the height of every flange 42 on the other side, i.e., every flange 42 on the side not coming into contact with every pin for the electronic component, is inspected, and the height of every pin is measured.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of inspecting a pin height in an electronic component having a plurality of pins and an inspection jig used for the method.

[0002]

2. Description of the Related Art Generally, in an electronic component having a plurality of pins, a method for inspecting a plurality of pin heights includes a non-contact type inspection method such as a shadow method by a projection method and a reflected wave measurement by laser irradiation, There are two types of contact-type inspection methods in which the needle (terminal) of the measuring instrument is applied to the pin and the pin height is measured from the moving distance of the measuring instrument when the pin contacts the terminal of the measuring instrument.

[0003]

Of the above inspection methods,
Other than the projection method, since the tip shape of the pin is semicircular or sharp, the height differs depending on the measurement point, and it is difficult to measure the height of the top most at once.

Further, in the inspection method by the projection method,
Since the height is inspected by shading, it is necessary to scan the measurement location, and a utility such as electricity or air is required, which complicates the measurement device.

The present invention has been made in view of the above circumstances, and a simple and inexpensive inspection jig is used to measure the pin height of an electronic component having a plurality of pins. Another object of the present invention is to provide a pin height inspection method and an inspection jig for an electronic component capable of inspecting the pin height.

[0006]

In order to achieve the above object, a method of inspecting a pin height in an electronic component according to the present invention is a block in which a plurality of holes are provided at lattice points, and is longer than the thickness of the block. Use a test jig that inserts multiple pins with flat plates at both ends into the holes that contact the holes in a radial direction. Align the flanges so that they are in close contact with the surface of the electronic component, and use the end of the pin of the electronic component that is not in close contact with the block of the inspection jig as the connecting terminal for multiple connection terminals, and attach the block to the electronic component. It is characterized in that the pin height of the electronic component is inspected by pressing it toward the other side, stopping it when the pin does not come into contact with the other surface of the block, and measuring the height of the plurality of flanges in that state.

Further, the inspection jig used in the method of the present invention has a block having a plurality of holes at lattice points and a dimension longer than the thickness of the block. It is characterized by being composed of a plurality of pins having spring properties in the radial direction and having flat flanges at both ends.

Further, the pin is characterized in that it comprises a male pin and a female pin each having a flange formed on one end side thereof, and a spring member interposed in the female pin and joining the both pins.

[0009]

As apparent from the above construction, since the flanges having a diameter larger than the hole diameter of the block are attached to both ends of the pin, the pin does not fall out of the block.

Further, by regularly disposing the pins on the block in a grid pattern, it becomes possible to inspect the height of various convex bodies.

Further, since the pin is shortened, blurring at the time of sliding is reduced, and life shortening factors such as wear and bite can be eliminated, and the pin weight is reduced, so that the pin is relatively soft and the pressing force is weak. Therefore, it is possible to perform an accurate inspection and prevent the convex body from being damaged.

Further, the split construction of the pin facilitates the replacement work, and the use of a spring material for joining the male pin and the female pin prevents the pin from coming off.

[0013]

EXAMPLES Examples of a method for inspecting a pin height and an inspection jig for an electronic component according to the present invention will be described in detail below.

FIG. 1 is an external view of an inspection jig used in the method of the present invention, FIG. 2 is a sectional view showing the structure of the inspection jig, and FIG.
Is an external view of the split pin.

As shown in FIGS. 1 and 2, a pin height inspection jig 1 used in the method of the present invention is inserted into a block 3 having a plurality of holes 2 at lattice points and holes 2 of the block 3. The pin 4 is set to be longer than the thickness of the block 3, and the portion 41 in contact with the hole 2 has a spring property in the radial direction. A flange 42 having a diameter larger than the diameter is formed.

Further, as shown in FIG. 3, the pin 4 is composed of a male pin 43, a female pin 44, and a spring member 45 for joining the two pins 43, 44 to each other. The flange 42 is formed and has a stepped pin shape, the female pin 44 is holed so that the tip of the male pin 43 can be inserted, and the spring member 45 is
The claws 46 are formed so as to face the radially opposite sides.

Next, a specific structure of the inspection jig 1 according to the present invention will be described with reference to FIG.

In this jig 1, an outer dimension of 55 W × 55 D (inner dimension of 25.4 W × 25.4 D with a window) × 5 (mm) with a 1.6 (mm) -shaped hole of 2.54 ( mm) with a block 3 made of a metal plate provided in a grid pattern with a diameter of 1.5
× 111 (mm) (diameter 2.0 × 0.5 (mm) on both ends
The metal pin 4 (with the lid processed) was inserted.

For the block 3, brass is used in consideration of rust prevention and ease of processing.

For the pins 4, both male pins 43 and female pins 44 are made of brass / nickel base tin plating.

The male pin 43 has a diameter of 2.4 × 0.5 at one end.
(Mm) flange processing, the other end has a diameter of 0.5 x 3.0 (m
m) with a finer diameter of 1.5 (mm), total length of 5.5 (m
m) The stepped pin.

The female pin 44 has a diameter of 2.0 × at one end.
7. 0.5 (mm) lid processing, the other end was a hole drilling of 1.0 x 3.5 depth (mm) inner diameter 1.5 (mm), total length 8.
The pin was 0 (mm).

The spring material 45 is made of beryllium copper / nickel base gold plating, and has a spring property in terms of shape by being subjected to claw processing.

Next, in order to inspect the pin height of the electronic component by using the inspection jig 1 having the above-mentioned structure, all the pins 4 are so arranged that the flanges 42 are in close contact with the one surface 31 of the block 3. The pin 4 is offset to form a plurality of connecting terminals, and the tip of the pin in an electronic component having a pin having a fixed length is provided with a flange 42 on the opposite side of the pin 3 which is not in close contact with the block 3 of the jig 1. When the block 3 is pressed against the electronic component, the operation is stopped when the pin 4 does not come into contact with the other surface 32 of the block 3, and the heights of the flanges 42 of the plurality of pins 4 are measured in that state. The pin height of electronic parts can be inspected.

[0025]

As described above, according to the pin height inspection method and the inspection jig of the present invention, the PGA pin height, the BGA ball height, the connector pin height, etc. When inspecting the height of the body, the height of the top of each appears as the pin height in the jig, so if you measure this pin height with a measuring machine (such as a three-dimensional measuring machine), The height can be checked at once, and the structure is simple and inexpensive.

Furthermore, since no utilities such as electricity and air are required, the measuring device does not become complicated, the location can be selected, and the pins can be easily replaced even if a failure occurs.
Maintenance is also easy, and by arranging the pins in a grid pattern, the pins can be used for various kinds of measuring objects, and so on, which have various effects.

[Brief description of drawings]

FIG. 1 is a partial external view showing a pin height inspection jig according to the present invention.

FIG. 2 is a partial cross-sectional view showing the configuration of the inspection jig shown in FIG.

FIG. 3 is an external view showing a split pin used in the inspection jig according to the present invention.

FIG. 4 is an external view showing the configuration of an embodiment of an inspection jig according to the present invention.

[Explanation of symbols]

 1 Inspection jig 2 Hole 3 Block 4 pin 42 Flange 43 Male pin 44 Female pin 45 Spring material

Claims (3)

[Claims] 1. A block (3) having a plurality of holes (2) at lattice points, and a portion (41) having a dimension longer than the thickness of the block (3) and contacting the hole (2) in the radial direction. Using an inspection jig (1) having a plurality of pins (4) having a spring property and flanges (42) having a diameter larger than the hole diameter at both ends, are inserted into the holes (2). , All the pins (4) are biased so that the flange (42) is in close contact with the one surface (31) of the block (3), and a plurality of connection terminals are provided at the tip of the pins of the electronic component for the above inspection. Apply the flange (42) that is not in close contact with the block (3) of the jig (1),
The block (3) is pressed against the electronic component and stopped when the pin (4) does not come into contact with the other surface (32) of the block (3), and in that state the plurality of flanges (42)
A method for inspecting the pin height of an electronic component by measuring the height of the pin. 2. A block (3) having a plurality of holes (2) at lattice points, and a block (3) having a dimension longer than the thickness of the block (3) and being inserted into the hole (2). The inspection jig, characterized in that the contacting portion (41) is composed of a plurality of pins (4) having a radial elasticity in the radial direction and having flanges (42) with a diameter larger than the hole diameter at both ends. Ingredient 3. The pin (4) has a male pin (43) and a female pin (44) each having a flange (42) formed on one end side.
And the two pins (43, 4)
The inspection jig according to claim 2, which is composed of a spring member (45) for joining 4).