JPH0478579U - - Google Patents
Info
- Publication number
- JPH0478579U JPH0478579U JP12110190U JP12110190U JPH0478579U JP H0478579 U JPH0478579 U JP H0478579U JP 12110190 U JP12110190 U JP 12110190U JP 12110190 U JP12110190 U JP 12110190U JP H0478579 U JPH0478579 U JP H0478579U
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- measurement point
- groove
- circuit
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 6
Description
第１図〜第６図は本考案のそれぞれ実施例を示
す説明図で、第１図は回路試験装置のＸＹテーブ
ルを主とした全体的な構成図、第２図は第１図に
示す部分の側面図、第３図は検査基板支持部材の
溝と検査基板との関係を示す説明図、第４図は検
査基板を固定するためのピンの一例を示す説明図
、第５図は検査基板と中継基板との関係を表す斜
視図、第６図は中継基板の支持方法を説明する模
式図である。図において、１１はＸＹテーブル、
１２，１３は基板支持部材、１４，１５はガイド
、１６は中継基板、１７は検査基板、１８は検査
基板支持部材、１９は中継基板支持部材、２０は
プローブ、２１は位置合わせピンである。
Figures 1 to 6 are explanatory diagrams showing respective embodiments of the present invention. Figure 1 is an overall configuration diagram mainly showing the XY table of the circuit test equipment, and Figure 2 is the part shown in Figure 1. 3 is an explanatory diagram showing the relationship between the groove of the test board support member and the test board, FIG. 4 is an explanatory diagram showing an example of a pin for fixing the test board, and FIG. 5 is an explanatory diagram showing the relationship between the test board support member and the test board. FIG. 6 is a perspective view showing the relationship between the relay board and the relay board, and FIG. 6 is a schematic diagram illustrating a method of supporting the relay board. In the figure, 11 is an XY table;
12 and 13 are board support members, 14 and 15 are guides, 16 is a relay board, 17 is a test board, 18 is a test board support member, 19 is a relay board support member, 20 is a probe, and 21 is an alignment pin.
Claims (1)
ＹテーブルとこのＸＹテーブルに支持された回路
基板の所定の測定点に向けて移動可能であること
ともに上記測定点に接触して上記回路基板の所定
の測定点における信号を取り出すプローブを有し
、このプローブにより取得された信号を処理し、
上記回路基板の良否を判定するよう構成された回
路試験装置において、 上記回路基板の少なくとも２個の縁辺を挟んで
保持する溝を有する回路基板支持部材と、この回
路基板支持部材の一側から上記溝内に向けて進退
可能な複数のピンと、このピンの先端にスプリン
グにより付勢され上記溝体に挿入された回路基板
を押さえつける保持部材とを有する回路基板固定
装置を設けたことを特徴とする回路試験装置の回
路基板固定装置。[Claims for Utility Model Registration]
A Y table and a probe that is movable toward a predetermined measurement point of a circuit board supported by the XY table and that contacts the measurement point to extract a signal at the predetermined measurement point of the circuit board, Process the signal acquired by this probe,
A circuit testing device configured to determine the acceptability of the circuit board, further comprising: a circuit board support member having a groove for holding at least two edges of the circuit board between them; A circuit board fixing device is provided which has a plurality of pins that can move forward and backward into the groove, and a holding member that is biased by a spring at the tip of the pin and holds down the circuit board inserted into the groove body. Circuit board fixing device for circuit testing equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12110190U JPH0478579U (en) | 1990-11-19 | 1990-11-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12110190U JPH0478579U (en) | 1990-11-19 | 1990-11-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0478579U true JPH0478579U (en) | 1992-07-08 |
Family
ID=31868977
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12110190U Pending JPH0478579U (en) | 1990-11-19 | 1990-11-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0478579U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11937786B2 (en) | 2015-08-31 | 2024-03-26 | Gentuity, Llc | Imaging system includes imaging probe and delivery devices |
-
1990
- 1990-11-19 JP JP12110190U patent/JPH0478579U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11937786B2 (en) | 2015-08-31 | 2024-03-26 | Gentuity, Llc | Imaging system includes imaging probe and delivery devices |
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