JPS5666768A - Tool for in-circuit tester - Google Patents

Tool for in-circuit tester

Info

Publication number
JPS5666768A
JPS5666768A JP14130179A JP14130179A JPS5666768A JP S5666768 A JPS5666768 A JP S5666768A JP 14130179 A JP14130179 A JP 14130179A JP 14130179 A JP14130179 A JP 14130179A JP S5666768 A JPS5666768 A JP S5666768A
Authority
JP
Japan
Prior art keywords
probe
bed plate
post
package
node point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14130179A
Other languages
Japanese (ja)
Inventor
Mitsuzo Nakahata
Shingo Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14130179A priority Critical patent/JPS5666768A/en
Publication of JPS5666768A publication Critical patent/JPS5666768A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE: To make easy the introduction of in-circuit tester and to automize the board check, by providing slide probes to the bed plate and contacting this probe with the node points of tested package through the use of a post.
CONSTITUTION: A bed plate 25 is fitted to a tool main body 24, and a number of slide probes 26 are arranged on the bed plate 25 in a given interval, and the probe 26 is made slidable through the bed plate 25. Further, the probe 26 is normally energized to one side with a compression coil spring 27, a post stand 39 is located by opposing to the bed plate 25 toward energized direction, the post 40 is implanted on the post stand 39 at the location corresponding to the node point of the tested package 21 after component assembly, the post 40 is changed according to the change in the pattern of the package 21, the probe 26 is projected to another end of the bed plate 25 against the spring 27, and the probe 26 projected is contacted to the node point of the package 21. Further, a signal is sequentially fed to each node point via the probe 26 for the test.
COPYRIGHT: (C)1981,JPO&Japio
JP14130179A 1979-11-02 1979-11-02 Tool for in-circuit tester Pending JPS5666768A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14130179A JPS5666768A (en) 1979-11-02 1979-11-02 Tool for in-circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14130179A JPS5666768A (en) 1979-11-02 1979-11-02 Tool for in-circuit tester

Publications (1)

Publication Number Publication Date
JPS5666768A true JPS5666768A (en) 1981-06-05

Family

ID=15288694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14130179A Pending JPS5666768A (en) 1979-11-02 1979-11-02 Tool for in-circuit tester

Country Status (1)

Country Link
JP (1) JPS5666768A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59116872U (en) * 1983-01-28 1984-08-07 富士通株式会社 Universal fixture for insert test
JPS59122567U (en) * 1983-02-08 1984-08-17 日本電気株式会社 Electronic circuit inspection equipment
JPS6020158A (en) * 1983-07-15 1985-02-01 Hitachi Denshi Ltd General fixture for testing printed board
JPS6053070U (en) * 1983-09-20 1985-04-13 株式会社八郷技研 In-circuit tester jig
JPS60114964U (en) * 1984-01-12 1985-08-03 株式会社ヨコオ contact probe
JPS6197773U (en) * 1984-11-30 1986-06-23
JPS63304180A (en) * 1987-04-16 1988-12-12 テラダイン・インコーポレーテッド Printed circuit board tester
JPS642180U (en) * 1987-06-22 1989-01-09
JPH0656779U (en) * 1991-10-25 1994-08-05 株式会社モリモト Inspection equipment for printed circuit boards, etc.
JP2009245889A (en) * 2008-03-31 2009-10-22 Yamaha Corp Ic socket, and ic inspecting method

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59116872U (en) * 1983-01-28 1984-08-07 富士通株式会社 Universal fixture for insert test
JPS59122567U (en) * 1983-02-08 1984-08-17 日本電気株式会社 Electronic circuit inspection equipment
JPS6020158A (en) * 1983-07-15 1985-02-01 Hitachi Denshi Ltd General fixture for testing printed board
JPS6053070U (en) * 1983-09-20 1985-04-13 株式会社八郷技研 In-circuit tester jig
JPH0435823Y2 (en) * 1983-09-20 1992-08-25
JPS60114964U (en) * 1984-01-12 1985-08-03 株式会社ヨコオ contact probe
JPS6197773U (en) * 1984-11-30 1986-06-23
JPS63304180A (en) * 1987-04-16 1988-12-12 テラダイン・インコーポレーテッド Printed circuit board tester
JPS642180U (en) * 1987-06-22 1989-01-09
JPH0656779U (en) * 1991-10-25 1994-08-05 株式会社モリモト Inspection equipment for printed circuit boards, etc.
JP2009245889A (en) * 2008-03-31 2009-10-22 Yamaha Corp Ic socket, and ic inspecting method

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