JPH0656779U - Inspection equipment for printed circuit boards, etc. - Google Patents

Abstract

(57) [Abstract] [Purpose] By eliminating the sleeve on the probe pin, it is possible to perform extremely small pitch inspection with a pitch interval of the connection terminals of 0.2 mm or less. The probe pin 10 includes a pair of vertically symmetrical contact pins 11 and a coil spring 12 electrically connecting the contact pins 11. The probe pin 10 is formed in an insulating plate 20 and has a through hole. The contact pin upper portion is projected into the through hole 31 of the guide plate 30 superposed on the upper and lower surfaces of the extremely small through hole 21 and the insulating plate 20 which have been subjected to the plating 22, and the through hole 31 and the extremely small insulating plate through hole 21. The contact pin 11 is loosely inserted in the step portion 32 with the upper contact pin 11 so as not to come out.
The substrate 100 makes electrical contact with the lower contact pin 11
Is electrically contacted with the board pattern 42 which is electrically connected to the measuring means, and the circuit operation of the board 100 or the like is inspected.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a circuit operation inspection device for a printed circuit board or the like, and more particularly to a device optimal for a very small pitch inspection of a printed circuit board or IC, LCD or the like.

[0002]

[Prior art and its problems]

 As is well known, a semiconductor integrated circuit (IC) is initially provided as a so-called dual in-line package having a 2.54 mm pitch as its connection terminal, and is usually mounted in order to obtain a higher-order electronic circuit function body. On the printed circuit wiring board, circuit components such as ICs are mounted and connected to form a printed circuit board, which constitutes a control circuit in high-performance electronic equipment. Therefore, probe pins for making various tests and inspections by making electrical contact with the connection terminal members such as these wiring boards are also referred to in 2. Most of them corresponded to a 54 mm pitch grating.

However, along with the recent development of semiconductors and various technologies in the fields of use thereof, ICs have been progressively increased in speed and integration, and their connection terminals have been miniaturized to increase the density of printed circuit boards. As demands for mounting and high reliability have increased more and more, as an example of increasing the density of mounted components, the pitch of the connection terminals by surface mounting components is narrowed from 2.54 mm → 1.27 mm → 0.635 mm, and miniaturization, As the number of chips has progressed, the conductor pattern width and pattern interval on the printed circuit board have also been minimized.With the minimization of the pitch interval of the connection terminals, the minimization of probe pins is also required. Has been.

By the way, there is a conventional probe pin using a sleeve, but the outer diameter of the sleeve is limited, and the outer diameter of the sleep is 2.54 mm → 1.27 mm → 0.635 mm. Correspondingly, for example, 0.8 mm → 0.4 mm → 0.2 mm is expected, and when it is attempted to cope with a very small pitch, there is a problem that the manufacturing is extremely difficult and the cost becomes high.

There is also an extremely small-pitch inspection fixture that uses the elasticity of the probe card and steel wire, but this has a very small stroke (0.2 to 0.3 mm), so inspection is extremely difficult depending on the product. There was a problem that it was difficult.

The present invention has been made in view of the problems of the conventional technique, and an object of the present invention is to sufficiently cope with an extremely small pitch inspection in which the pitch of the connection terminals is 0.2 mm or less. It is to provide an inspection device for a printed circuit board or the like.

[0007]

[Means for solving problems]

 To this end, the present invention provides an apparatus for inspecting the circuit operation of a printed circuit board or the like by electrically contacting a probe pin implanted in an insulating plate with the printed circuit board or the like. A pair of contact pins 11 having a small-diameter column portion 14 having a circular cross-section, a large-diameter column portion 16 having a circular cross-section coaxial with the small-diameter column portion 14, and a small-diameter fitting column portion 18 are vertically symmetrical and The probe pin 10 is electrically connected by press-fitting both ends of the coil spring 12 into the small-diameter fitting column parts 18, 18, and the probe pin 10 is formed in the insulating plate 20 and processed by through-hole plating 22. The small-diameter column portions 14 above and below are inserted into the formed minimal through-holes 21 in a loosened state, and the small-diameter column portions 14 are inserted into the upper and lower surfaces of the insulating plate 20 through the through-holes 31. The portion 14 is projected, and the step portion 15 of the small-diameter column portion 14 and the large-diameter column portion 16 is locked by the step portion 32 of the through hole 31 and the minimum through hole 21 of the insulating plate 20 and is pulled out. A guide plate 30 that is not removed is removably superposed and attached, and the tip contact portion 13 of either one of the probe pins 10 is brought into electrical contact with the circuit operation measuring means and the electrical connection substrate 40. It is characterized by a certain configuration.

[0008]

【Example】

 An embodiment of the present invention will be described together with its operation based on the drawings. FIG. 1 is an enlarged partial view showing a part of an example of the device of the present invention in section, and FIG. 2 is a front view showing a part of a probe pin omitted. In these figures, the probe pin 10 has a structure in which a pair of vertically symmetrical contact pins 11 are electrically connected via a coil spring 12, and a sleeve which is indispensable in a conventional probe pin is unnecessary. ing. More specifically, as shown in FIGS. 3 and 4, the pair of contact pins 11 includes a small diameter column portion 14 having a circular cross section having a tip contact portion 13 and a small diameter column portion via a step portion 15. A large-diameter column portion 16 having a circular cross-section which is integrally provided coaxially with the portion 14 and a small-diameter fitting column portion 18 having a circular cross-section which is integrally provided with the large-diameter column portion 16 via a step portion 17. The pair of contact pins 11 are made of beryllium-copper alloy, and their surfaces are plated with gold. Although the tip contact portion 13 has a sharpened shape in this embodiment, the shape is not limited to this and the shape is arbitrary such as a flat shape. The pair of contact pins 11 are vertically symmetrical and are electrically connected by press-fitting the small-diameter insertion pillar portions 18 at both ends of the coil spring 12 made of piano wire.

As shown in FIG. 1, the probe pin 10 has a small diameter (0.13 to 0.16 mm) in the through hole 21 formed in the insulating plate 20 and a small diameter in the upper and lower contact pins 11. The column portion 14 is projected so that it is loosely inserted in a water state. The minimum through hole 21 is plated with a through hole 22 to reduce the electric resistance value, and the hole 21 functions as a sleeve in a conventional probe pin by the through hole plating 22. It should be noted that, although not particularly shown, the minimum through-holes 21 are formed in large numbers in a grid pattern and are provided with through-hole marks 22, and the probe pins 10 are loosely inserted in each of them.

On the upper and lower surfaces of the insulating plate 20, the small-diameter column portion 14 of the probe pin 10 is projected through the respective through holes 31, and the step portion between the through hole 31 and the extremely small through hole 21 of the insulating plate 20. At 32, the guide plate 30 in which the dredging portion 15 of the small diameter column portion 14 and the large diameter column portion 16 of each contact pin 11 of the probe pin 10 is locked so as not to come out is secured by screws and knock pins (not shown). The guide plate 30 is detachably mounted so that the probe pin 10 can be prevented from coming off and the guide plate 30 can be removed to replace the probe pin 10 or the contact pin 11 as described above. There is.

Below the contact pin 11 on one side (the lower side in this embodiment) of the probe pin, there is a minimal through hole 41 into which the tip contact portion 13 slightly enters and a pattern 42 extending from the through hole 41 to the lower surface thereof. Further provided is a substrate 40 which is electrically connected to a circuit measuring means (not shown) through the pattern 42 and a lead wire (not shown), and the tip contact portion 13 of the contact pin 11 is formed as a through hole pattern 42. By making electrical contact, the circuit operation measuring means is electrically connected.

The device of the present invention has the above-described configuration. To use the device, as shown in FIG. 1, the substrate 100 or the like on which the electronic element is mounted is dropped horizontally from above and the electronic device such as the substrate 100 or the like is dropped. The lead terminal 101 of the element is electrically contacted with the tip contact portion 13 of the upper contact pin 11 of the probe pin 10, and the tip contact portion 13 of the lower contact pin 11 is electrically contacted with the hole pattern 42 of the substrate 40. Then, the electronic element and the measuring means are electrically connected to each other to inspect the circuit operation of the electronic element.

[0013]

[Effect of device]

 Thus, according to the present invention, the probe pin does not need the sleeve which has been indispensable in the past, and the stroke can be up to about 1.0 to 2.0 mm by the coil spring that connects the upper and lower contact pins. Thus, it is possible to sufficiently cope with a very small pitch inspection in which the pitch interval of the connection terminals is 0.2 mm or less, which cannot be inspected by the conventional probe pin.

[Brief description of drawings]

FIG. 1 is an enlarged partial view showing a partial cross section of an example of an inspection apparatus according to the present invention.

FIG. 2 is a front view showing a probe pin with a part thereof omitted.

FIG. 3 is a front view of a contact pin.

FIG. 4 is an enlarged plan view of a contact pin.

[Explanation of symbols]

 10 probe pin 11 pair of contact pins 12 coil spring 13 tip contact part 14 small diameter column part 15 step part 16 large diameter column part 18 small diameter fitting column part 20 insulating plate 21 extremely small through hole 22 through hole plating 30 guide plate 31 through hole 32 Step 40 board

Claims (1)

[Scope of utility model registration request] 1. An apparatus for inspecting circuit operation of a printed circuit board or the like by electrically contacting probe pins embedded in an insulating plate with the printed circuit board or the like, wherein the probe pin (10) has a tip contact portion (13). Small-diameter column portion (14) having a circular cross section and the small-diameter column portion (14)
A pair of contact pins (11) having a large-diameter column portion (16) and a small-diameter fitting column portion (18) coaxial with and having a circular cross section,
Vertical symmetry and each small diameter fitting pillar portion (18),
The coil spring (12) is press-fitted into both ends of the coil spring (12) and electrically connected to the coil spring (12), and the probe pin (10) is formed in the insulating plate (20).
In addition, the small-diameter column portions (14) above and below are projected into the extremely small through-holes (21) that have been subjected to the through-hole plating (22), and are loosely inserted to the upper and lower surfaces of the insulating plate (20). Through the through holes (31) thereof, the small-diameter column portion (1
4) is projected, and the small diameter column portion (14) and the large diameter column portion (16) are formed by the step portion (32) between the through hole (31) and the extremely small through hole (21) of the insulating plate (20). Step with (15)
The guide plate (3
0) is detachably attached to the probe pin, and the tip contact portion (13) of any one of the probe pins (10) is further attached.
An apparatus for inspecting a printed circuit board or the like, characterized in that is in electrical contact with a circuit operation measuring means and an electrically connected board (40).