JPH02257075A - Test head of inspection device for wiring board - Google Patents

Abstract

PURPOSE:To make the manufacture of a contact probe easy and to improve the yield by regulating a deflection with the 2nd top board or fitting into through-holes on the top board which is another one of the contact probe. CONSTITUTION:Lead wires 26 are connected to the back end parts of receptacles 8 for the contact probes 3 and inserted into inserting holes 25 on a main board 20. Next, the 1st top board 22 is fixed on a spacer 21 at one side surface 20a of the board 20 by screws. Flanges 7 of the receptacles 8 are thereby pressed-in at the edge parts of barrel housing holes 29 and the probes 3 are fixed on the board 20. Then, the 2nd top board 23 is fixed on the board 22 by screws, and the deflection of plungers 12 for the probes 3 is regulated with the through- holes 30 on the board 23. The manufacture of the contact probe is thereby made easy and the yield is improved, then the cost can be reduced.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to the structure of a test head of an inspection device for inspecting wiring boards.

[Prior art] In recent years, the electronic industry has been increasingly miniaturizing semiconductors and wiring boards (resin boards such as glass epoxy, glass-treated, ceramic boards, etc. with wiring). Manufacturers and inspection equipment manufacturers are having difficulty in developing horizontal pipe jigs that can handle increasingly finer objects to be inspected, especially test heads that have contact portions with test points of the objects to be inspected.

In particular, in the wiring board industry, the test heads of inspection equipment that use contact probes, which are most commonly used, are also becoming smaller in terms of the pitch of each test point and the pads 141 that are test points. Although some measures have been taken with probes that have a finer shape, there are various problems.

FIG. 4 shows a test head of a conventional wiring board inspection device. In Figure 4, 1 is an insulating board (main board) through which receptacle insertion holes 2 are drilled corresponding to the test point positions of the wiring board to be inspected, and 3 is glued into the receptacle insertion holes 2. 4 is a lead wire that is connected to the rear end of the receptacle of the contact probe 3; 5 is an insulating tube that is attached to the connecting end of the receptacle and the lead wire 4;

The contact probe 3, as shown in FIG. A plunger 12 is slidably disposed inside the barrel 10, and a spring 11 is loaded at the rear end of the plunger 12 inside the barrel 10 and at the bottom of the barrel 10 to bias the tip of the plunger 12. . 13 is a stopper projection that determines the sliding stroke of the plunger 12, and 7 is a flange of the receptacle 8 that is engaged with the edge of the receptacle insertion hole 2 of the insulating board l.

In the test head of a conventional wiring board inspection device, a receptacle insertion hole 2 is drilled in an insulating board 1, and the coating is peeled off at the end of a lead wire 4 and the end of a receptacle 8 is caulked or soldered. Connecting. The receptacle 8 thus constructed is inserted into the receptacle insertion hole 2 of the insulating photovoltaic 1 and fixed using an adhesive. Furthermore, the assembly of the plunger 12 and the barrel 10 is mounted inside the receptacle 8, and the receptacle 8 and the lead wire An insulating tube 5 is attached to the connecting end of the tube 4. .

The contact probe 3 used in this test head includes a receptacle 8, a barrel 10, and a plunger 1.
The receptacle 8 is detachable from the second assembly, and when the spring properties of the spring 11 deteriorate over time due to use, or when the plunger 12 is worn or broken, the receptacle 8 can be removed from the insulating ball 1. ~I leave it on the l side so that only the assembly can be taken out and replaced with a new one.

In addition to these separate types, contact probes also include tertiary type contact probes.
There is also an integrated structure in which the functions of the receptacle 8 and the barrel lO shown in the figure are combined into one receptacle.

[Problems to be Solved by the Invention] However, the test head of the conventional wiring board inspection apparatus described above has the following problem.

In other words, 0) Contact probes are composed of a plunger, barrel, receptacle, etc., but when the shape is downsized to accommodate miniaturized test points, dimensional accuracy of each part is required, which reduces yield. It gets worse and costs go up. On the other hand, if the tolerances of each part are too loose, the tip of the plunger will swing out so much that it will be difficult to hit the test point. .

In this regard, at present, although fairly tight tolerances are set, there is a problem of runout at the tip of the plunger, and there is a problem that the performance is not good even though the cost 1- is high.

■The receptacle is fixed to the probe insertion hole of the insulation board using adhesive. However, when a failure such as a disconnection occurs, the receptacle must be pulled out from the insulating board, which becomes a rather difficult repair work, and in some cases, the test head itself becomes unusable.

In addition, the receptacle is assembled into the probe insertion hole of the insulating board one piece at a time using adhesive.
There is a problem that the workability is not good.

■After installing the receptacle on the insulating board, an insulating tube is attached to the connection part of the lead wire to the rear end of the receptacle.Is this one tube at a time? -1, which requires a considerable number of man-hours, and particularly when the pitch of the receptacles becomes fine, there is a problem that work efficiency becomes extremely poor.

The present invention has been made in view of the above-mentioned conventional problems, and it is possible to suppress the deflection of the tip of the plunger without making the legal tolerances of each component that constitutes the contact probe too strict, thereby achieving miniaturization. The purpose of the present invention is to provide a test head for a circuit board inspection device that can correspond to test points and improve assembly work efficiency by improving the process of inserting receptacles into insulating photodiodes (main boards). shall be.

Another object of the present invention is to provide a test head for a wiring board inspection device that can cope with malfunctions such as replacement of contact probes and breakage of lead wires.

Furthermore, another object of the present invention is to provide a test head for a wiring board inspection device that can improve assembly work efficiency by improving the insulation treatment of the connection between the receptacle and the tow wire. The purpose is O. .

[Means for Solving the Problems] In order to achieve the purpose stated in -, the test head of the wiring board inspection device of the present invention has a probe insertion hole L'1 inserted through the probe insertion hole corresponding to the test point of the wiring board. It has an open main board, a receptacle with a lead wire connected to the rear end and a flange at the tip, and a barrel attached to the receptacle with the protruding tip protruding from the flange, and the tip protruding from the barrel. The receptacle is inserted into the probe insertion hole when the flange comes into contact with the edge of the probe insertion hole on one side of the main board. a contact probe having a thickness approximately corresponding to the height of the flange, a spacer having a flange receiving hole, the flange being accommodated in the flange receiving hole and disposed on one side of the main board, and a barrel receptacle. It has a barrel receiving hole having a hole diameter smaller than the outer diameter of the flange, and the barrel receiving hole has a diameter of P7 smaller than the tip protrusion of the flange, and the tip protrusion of the barrel is accommodated in the barrel receiving hole.
and a first top board removably disposed on the spacer by locking a flange at the edge of the barrel receiving hole, and a hole having a hole diameter at least partially comparable to the outer diameter of the tip of the plunger. It has a through hole capable of accommodating the protruding tip of the barrel, and is removably disposed on the first top board by accommodating the protruding tip of the barrel in the through hole and inserting the tip of the flange. and a second top board.

In addition, a spacer is provided integrally on the first top board,
This may be removably disposed on one side of the main board, or the spacer may be provided integrally with the main board.

Further, the test head of the wiring board inspection apparatus of the present invention has a receptacle housing hole on the other side of the main board, and the rear end of the receptacle and the connecting end of the lead wire to the receptacle are connected to the receptacle housing hole. A protective board may be provided that passes through the section. The protection board may be provided integrally with the main board.

Furthermore, the test head of the other wiring board inspection device of the present invention has a main board with probe insertion holes drilled through the probe insertion holes corresponding to the test points of the wiring board, and a lead wire connected to the rear end and the tip end. It has a receptacle with a flange formed on it, a plunger whose tip protrudes from the receptacle and is slidably disposed inside the receptacle with a spring bias, and the flange is inserted into the probe insertion hole on one side of the main board. A contact probe whose receptacle is inserted into the probe insertion hole by contacting the edge of the main board has a thickness corresponding to approximately the height of the flange and has a flange accommodation hole, and the flange is accommodated in the flange accommodation hole. a spacer disposed on one side, and at least a through hole having a hole diameter approximately the same as the outer diameter of the tip of the plunger and smaller than the outer diameter of the flange; At the same time, insert the flange at the edge of the through hole.
The top board is removably disposed on the second spacer.

In this case as well, the spacer may be provided integrally with the top board or the main board; It is also possible to provide a protection board through which the rear end of the receptacle and the connection end of the lead wire to the receptacle are inserted. This protection board can also be provided integrally with the main board.

[Example] Hereinafter, the present invention will be explained with reference to the drawings and examples.

FIG. 1 shows a cross section of a test head according to an embodiment of the present invention. In the figure, 20 is the main board 1~:
3 is a contact probe, 2j is a smoother, 22 is a first top board, and 23 is a first top board 1.

The main board 20 is made of an insulating board such as a glass epoxy board, a baked board, or an acrylic board, and a number of probe insertion holes are drilled through the board in correspondence with the test points of the wiring board.

As shown in FIG. 3, the contact probe 3 has a receptacle 8 with a lead wire 26 connected to its rear end and a flange 7 formed at its tip. The plunger 12 has a plunger 12 whose tip protrudes from the barrel 10 and is slidably disposed within the barrel 10 with the force of a spring 11. This contact probe 3 is connected to the main photo 20 with the lead wire 26 connected to the receptacle 8.
, and the flange 7 is brought into contact with the edge of the probe insertion hole 25 on the negative side 20a of the main board 20. This contact probe 3
The relationship between the outer diameter of the receptacle 8 and the diameter of the probe insertion hole 25 of the main board 20 is such that the receptacle 8 can be inserted into and removed from the probe insertion hole with fingers.

The structure of the contact probe 3 used in the present invention is conventionally known.

The spacer 21 is made of an insulating plate, and has a flange receiving hole 28 formed at a predetermined position for accommodating the flange 7 formed at the tip of the receptacle 8 of the contact probe 3, and has a thickness approximately equal to the height of the flange 7. The height of the flange 7 should correspond to the height of the flange 7. This spacer 21 is arranged on one side 20a of the main board 20 so that the flange accommodating hole 28 is aligned with the corresponding probe insertion hole 25 of the main board 20, and the flange 7 of the contact probe 3 is inserted into the flange accommodating hole 28. accommodate.

The first top board 22 is made of an insulating plate, and a barrel receiving hole 29 having a diameter smaller than the outer diameter of the flange 7 of the contact probe 3 is bored at a predetermined position. The first top board 22 is also a contact probe; the barrel 10 of 3
The thickness is smaller than that of the tip protrusion 9 from the receptacle 8. This first top board 22 aligns the barrel accommodation hole 29 with the flange accommodation hole 28 of the spacer 21, partially accommodates the tip protrusion 9 of the barrel 10 in the barrel accommodation hole 29, and The flange 7 is locked at the edge of the spacer 29, and the spacer 21 is removably disposed using screws or the like.

Note that the above-mentioned spacer 21 may be provided on the body on one side 2 Oa side of the main board 20 without making it independent, or
Alternatively, it may be provided integrally with the first top board 22. Even when the first top board 22 and the spacer 21 are integrated, they can be removed from the main board 20 and disposed thereon. .

Further, the second top board 23 is also made of an insulating plate, and is provided with through holes 30 at predetermined positions. This through hole 30 is
The hole diameter is at least partially the same as the outer diameter of the tip of the plunger 12 of the contact probe 3, and the tip protrusion 9 of the barrel 10 of the contact probe 3 can be accommodated therein. Therefore, the deflection of the tip of the plunger 12 of the contact probe 3 is restricted by the through hole 30. Note that a tapered portion 30 a is formed at one end of the rI through hole 30 to facilitate insertion of the plunger 12 into the through hole 30 . This second top board 23 aligns the through hole 30 with the barrel housing hole 29 of the first top board 22, and inserts the brassiere 1 into the through hole 30.
The top board 22 is inserted into the top board 22 to accommodate the top protrusion 9 of the barrel, and is installed in the top board 22 so that it can be removed using screws or the like.

Note that an insulating tube may be attached to the end of the lead wire 26 connected to the rear end of the receptacle 8 as in the conventional case, but it is also possible to further provide a protection board 24 as shown in FIG. good. This protection board 24 is made of an insulating board similar to that of the main board 20 and has a receptacle housing hole 31 provided at a predetermined position. The thickness is set to be enough to accommodate the rear end portion of the rear end portion and the connection end portion of the lead wire 26 connected thereto.

Furthermore, the protection board 24 and the main board 20 may be integrated. In the illustrated embodiment, the two are separate, because the accuracy of drilling decreases as the plate thickness increases. However, even if the two are integrated, it is not impossible to manufacture it; in fact, it is preferable because it reduces the number of parts.

Next, the assembly of the disks 1 to 1'' in the embodiment described above will be explained.

1. Connecting the lead wire 26 to the rear end of the receptacle 8 of the contact probe 3, and inserting it into the probe insertion hole 25 of the main board 20, which is pre-drilled in this state;
In this case, the receptacle 8 of the contact probe 3,
Since the structure is such that the assembly can be detached from the barrel 10, plunger 12, etc. that are installed inside it, the entire contact probe 3 may be inserted when it is assembled into the main board 20. , the receptacle 8 may be inserted first, and then the assembly may be installed into the receptacle 8.

Note that simply inserting the receptacle 8 into the probe insertion hole 25 of the main board 20 does not fix the receptacle 8 to the main board 20 in any way, and it can be picked out with fingers or a simple tool.

After the contacts 1 to probes 3 have been assembled into the main board 20, the first top bows 1 and 22 are attached to the spacer 21-1- on one side 20a of the main board 20 with screws or the like. From now on, the first board 22
The flange 7 of the receptacle 8 is pressed down by the edge of the barrel housing hole 29, and the contact probe 3 is fixed to the main board 20. 7 and the first top board 220.

The second top board 23 is attached with screws etc., and the contact probe 3 is inserted into the through hole 30 of the second top board 23.
The deflection of the plunger 12 will be regulated.

Note that the spacer 21 may be provided on the main board 20 in advance, and when the protection board 24 is used, it may be provided on the main board 20 in advance.

In this test, if the spring 11 of the contact probe 3 has deteriorated over time due to use and needs to be completely replaced, first replace the second top board 23 with the first one. ”Remove from the second. Then, since the tip protrusion 9 of the barrel 10 partially protrudes from the barrel accommodation hole 29 of the first top board 22+, the barrel 1 is inserted using the tip protrusion 9 as a clue.
By pulling 0, only the internal phase body of the contact probe 3 can be extracted, and since the receptacle 8 is held down by the top board 22 and remains on the main board 20, a new internal phase 1"l1 is inserted there. All you have to do is attach it to your body.

In addition, if a disconnection occurs at the connection between the lead wire 26 and the receptacle 8, the first and second top boards 22
．． 23 from the main board 20'-, take out only the corresponding contact probe 3 from the probe insertion hole 25, perform repairs such as connection, and then put it back together.

Next, other embodiments of the present invention will be described. The embodiment described above uses a contact probe with a so-called separate structure, but the embodiment in FIG. 2 uses a contact probe with a so-called integrated structure.

The body structure contact probe 3 used here is
In contrast to the separate type probe shown in FIG. 3, the receptacle can be said to also serve as a barrel, which has been commonly used in the past. Therefore, a detailed explanation of the internal structure of the contact probe 5' will be omitted, but unlike the separate structure in the case of an integrated structure, the receptacle 8' can be used as is without being replaced, and only the internal assembly is brand new. It cannot be replaced, and the entire probe 3 would have to be replaced.

In the test head shown in FIG. 2, the first top board 22 and the second top board 23 are combined into one top board 22', compared to the above-mentioned embodiment, due to the difference in the structure of the probe. The only difference is that a through hole 30' is provided therein, and the rest of the structure is the same as that of the previous embodiment.

Although not shown, the lead wire 26 of the test head is
Gather them together, bundle them, and provide connectors at the ends. This connector will be connected to the analyzer. Further, the test head is installed in an inspection jig that is equipped with a support mechanism for the printed circuit board and a pressure means, facing the wiring board.

[Sakukawa] In the first head of the wiring board inspection apparatus of the present invention, the first head is installed in the main hole 1.-1- which accommodates the contact probe.
The outer diameter of the tip of the plunger is about the same as the hole diameter of the through hole drilled in the second top board or top photo, and the tip of the plunger is inserted into this L'1 through hole, so these top boards 1. This restricts the deflection of the tip of the plunger, making it possible to bring the plunger into contact with even minute test points.

Also, contact!・To assemble the probe into the main board 1, insert the entire contact probe 1 or the receptacle part into the probe insertion hole of the main board 1. In particular, use adhesive to fix the contact probe to the main board. This is accomplished by locking the flange of the receptacle at the edge of the first top board or the barrel receiving hole or through hole of the top board.

2;3 The second and second bottom boards or top boards are each removable at a predetermined mounting position, and the receptacle can be inserted or removed without being fixed to the main board.
By removing each top board appropriately, only the main part or the entire contact probe can be easily removed from the main board.

Furthermore, the connection end of the lead wire to the receptacle is accommodated in a receptacle housing hole formed in a protection board provided on the other side of the main board, providing electrical insulation from the phase gap and protecting it from external forces. be done.

[Effects of the Invention] According to the test head of the wiring board inspection device of the present invention, the deflection occurring at the tip of the plunger of the contact probe can be counteracted by tightening the dimensional tolerance of each mechanical component that constitutes the contact probe. Instead, runout is controlled by fitting the contact probe with a second top board separate from the contact probe or with a through hole drilled in the top board, so there is no need to strictly control the tolerances of each part of the contact probe. Manufacture of contact probes is comparatively easier and yields are improved 1. In particular, a large number of contact probes are used in the test head, and the top board is made by drilling holes at predetermined positions on the insulating plate. Since it can be easily manufactured using machine oil, the entire precision test head corresponding to minute test points can be manufactured at a lower cost than in the past.

In addition, the structure for fixing the contact probes to the main board is such that all the contact probes are fixed together at the edge of the first top board or a predetermined hole provided in the top board without using adhesive. Therefore, compared to the conventional structure in which contact probes are fixed to the main board one by one using adhesive, the working efficiency of the set 1γ is dramatically improved.

The second and second top boards or top boards are removably arranged, and by removing either of them as appropriate, contact 1 to probe can be replaced or repaired, greatly improving the efficiency of these operations. That will happen.

Furthermore, by providing a protection board, the connecting ends of the lead wires of multiple receptacles can be protected electrically and mechanically at the same time, and the assembly work is greatly improved compared to the conventional structure in which a protective duplex is applied to each color. This effect is achieved.

[Brief explanation of drawings]

FIG. 1 is a sectional view of a test head according to an embodiment of the present invention;
FIG. 2 is a sectional view of a test head according to another embodiment of the present invention, FIG. 3 is a sectional view of a contact probe, and FIG. 4 is a sectional view of a conventional test head. 3 ~ Contact probe 7 ~ Flange 8.8' ~ Receptacle 9 ~ Tip projection 10 ~ Barrel 11 ~ Spring 12 ~ Plunger 20 ~ Main board 20a ~ One side of main board 20b ~ Other side of main board 21 ~ Spacer 22 ~ First top board 23 ~ Second top board 22' ~ Top board 25 ~ Probe insertion hole 26 ~ Lead wire 28 ~ Flange housing hole 29 ~ Barrel housing hole 39.30' ~ Through hole 31 ~ Receptacle housing hole

Claims (1)

[Claims] 1) Probe insertion holes (25) corresponding to test points on the wiring board
It has a main board (20) drilled through it, and a receptacle (8) with a lead wire (26) connected to the rear end and a flange (7) formed at the tip, with the tip protruding from the flange (7). It has a barrel (10) attached to the receptacle (8) with the portion (9) protruding, and the tip thereof protruding from the barrel (10) and sliding into the barrel (10) with the bias of the spring (11). It has a plunger (12) that is movably arranged, and the flange (7) is attached to one side (20) of the main board (20).
The contact probe (3) in which the receptacle (8) is inserted into the probe insertion hole (25) by contacting the edge of the probe insertion hole (25) in 20a) and the thickness approximately correspond to the height of the flange (7). a spacer (21) having a flange accommodating hole (28), accommodating the flange (7) in the flange accommodating hole (28), and disposed on one side (20a) of the main board (20); The barrel housing hole (29) has a thickness smaller than the tip protrusion (9) of the barrel (10) from the receptacle (8) and has a diameter smaller than the outer diameter of the flange (7). barrel (1
0), and is removably disposed on the spacer (21) by locking the flange (7) at the edge of the barrel housing hole (29). a top board (22) and at least partially a plunger (12);
It has a through hole (30) that can accommodate the tip protrusion (9) of the barrel (10) with a hole diameter comparable to the outer diameter of the tip of the barrel (10). (9) and a second top board (23) that is removably disposed on the first top board (22) by inserting the tip of the flange (7). Test head for wiring board inspection equipment. 2) It has a receptacle housing hole (31), and the rear end of the receptacle (8) and the connecting end of the lead wire (26) to the receptacle (8) are inserted into the receptacle housing hole (31) to connect the main board. The test head for a wiring board inspection apparatus according to claim 1, further comprising a protection board (24) disposed on the other side (20b) of (20). 3) Place the spacer (21) on the first top board (22)
This is installed on one side of the main board (20) (
3. The test head of the wiring board inspection apparatus according to claim 1, wherein the test head is removably disposed in the test head of the wiring board inspection apparatus according to claim 1 or 2. 4) A test head for a wiring board inspection apparatus according to claim 1 or 2, wherein the spacer (21) is provided integrally with the main board (20). 5) A test head for a wiring board inspection apparatus according to any one of claims 2 to 4, wherein the protection board (24) is integrally provided with the main board (20). 6) Probe insertion hole (25) corresponding to the test point on the wiring board
It has a main board (20) that is drilled through the main board (20), and a receptacle (8') with a lead wire (26) connected to the rear end and a flange (7) formed at the tip. ), the plunger (12) is slidably disposed in the receptacle (8') with the bias of a spring (11), and the flange (7) is attached to one side of the main board (20). (20a) Probe insertion hole (25)
a contact probe (3) in which the receptacle (8') is inserted into the probe insertion hole (25) while abutting the edge of the contact probe (3);
It has a thickness that corresponds approximately to the height of the flange (7), and has a flange accommodation hole (28), and the flange (7) is accommodated in the flange accommodation hole (28). ) and a through hole (30') having a hole diameter that is at least partially the same as the outer diameter of the tip of the plunger (12) and smaller than the outer diameter of the flange (7). The tip of the plunger (12) is inserted into the through hole (30'), and the through hole (30') is inserted through the through hole (30').
’) and lock the flange (7) at the edge of the spacer (2).
1) Top board (22'
) A test head for a circuit board inspection device, characterized in that it consists of: 7) It has a receptacle housing hole (31), and the rear end of the receptacle (8') and the connecting end of the lead wire (26) to the receptacle (8') are inserted into the receptacle housing hole (31). The test head for a wiring board inspection apparatus according to claim 6, further comprising a protection board (24) disposed on the other side (20b) of the main board (20). 8) A test head for a wiring board inspection apparatus according to claim 6 or 7, wherein the spacer (21) is provided integrally with the top board (22'). 9) A test head for a wiring board inspection apparatus according to claim 6, wherein the spacer (21) is provided integrally with the main board (20). 10) A test head for a wiring board inspection apparatus according to any one of claims 7 to 9, wherein the protection board (24) is integrally provided with the main board (20).