JPS63185572U - - Google Patents

Info

Publication number
JPS63185572U
JPS63185572U JP7696887U JP7696887U JPS63185572U JP S63185572 U JPS63185572 U JP S63185572U JP 7696887 U JP7696887 U JP 7696887U JP 7696887 U JP7696887 U JP 7696887U JP S63185572 U JPS63185572 U JP S63185572U
Authority
JP
Japan
Prior art keywords
pin
circuit board
auxiliary plate
spacer
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7696887U
Other languages
Japanese (ja)
Other versions
JPH052866Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987076968U priority Critical patent/JPH052866Y2/ja
Publication of JPS63185572U publication Critical patent/JPS63185572U/ja
Application granted granted Critical
Publication of JPH052866Y2 publication Critical patent/JPH052866Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は、本考案の回路基板検査装置に要部の
みを示す断面図、第２図は、既に提案されている
回路基板検査装置の要部のみを示す断面図である
。 １，２……ピンボード、３，４……プローブピ
ン、５……補助板、６ａ，６ｂ……スペーサ、７
，８……押し部材。 FIG. 1 is a sectional view showing only the essential parts of the circuit board inspection apparatus of the present invention, and FIG. 2 is a sectional view showing only the essential parts of the circuit board inspection apparatus that has already been proposed. 1, 2...Pin board, 3, 4...Probe pin, 5...Auxiliary plate, 6a, 6b...Spacer, 7
, 8...Pushing member.

Claims (1)

【実用新案登録請求の範囲】 １ 上下一対をなすピンボードに多数のプローブ
ピンを進退自在に挿着し、この各プローブピンで
被検査体としての回路基板を電気的な特性検査す
る回路基板検査装置において、少なくとも一方の
ピンボードの外側にスペーサを介して補助板を並
設し、この補助板に押え部材を上記一方のピンボ
ードを貫通して上記被検査体に当接するようにし
て設けたことを特徴とする回路基板検査装置。 ２ 各ピンボードの外側に各スペーサを介して各
補助板を並設し、この両補助板に各押し部材を上
記各ピンボードを貫通して被検査体を上下から当
接するようにして設けたことを特徴とする実用新
案登録請求の範囲第１項記載の回路基板検査装置
。[Claims for Utility Model Registration] 1. Circuit board testing in which a large number of probe pins are inserted into a pair of upper and lower pin boards so that they can move forward and backward, and each probe pin tests the electrical characteristics of a circuit board as an object to be tested. In the apparatus, an auxiliary plate is arranged in parallel on the outside of at least one pin board via a spacer, and a holding member is provided on the auxiliary plate so as to penetrate through the one pin board and come into contact with the object to be inspected. A circuit board inspection device characterized by: 2 Each auxiliary plate was arranged in parallel on the outside of each pin board via each spacer, and each pushing member was provided on both of these auxiliary plates so that it penetrated each of the above pin boards and came into contact with the object to be inspected from above and below. A circuit board inspection device according to claim 1, which is characterized in that:
JP1987076968U 1987-05-22 1987-05-22 Expired - Lifetime JPH052866Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987076968U JPH052866Y2 (en) 1987-05-22 1987-05-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987076968U JPH052866Y2 (en) 1987-05-22 1987-05-22

Publications (2)

Publication Number Publication Date
JPS63185572U true JPS63185572U (en) 1988-11-29
JPH052866Y2 JPH052866Y2 (en) 1993-01-25

Family

ID=30924537

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987076968U Expired - Lifetime JPH052866Y2 (en) 1987-05-22 1987-05-22

Country Status (1)

Country Link
JP (1) JPH052866Y2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002296327A (en) * 2001-03-30 2002-10-09 Nec Corp Inspection jig and method of inspecting circuit board, and manufacturing method
JP2012088065A (en) * 2010-10-15 2012-05-10 Hioki Ee Corp Pin board unit and substrate inspection apparatus
WO2015060188A1 (en) * 2013-10-22 2015-04-30 富士フイルム株式会社 Image pickup module manufacturing method and image pickup module manufacturing apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5095778A (en) * 1973-12-25 1975-07-30
JPS5567675A (en) * 1978-11-17 1980-05-21 Hitachi Ltd Detector for presence of small sized electronic component
JPS5666765A (en) * 1979-11-02 1981-06-05 Nec Corp Inspection method of printed board

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5095778A (en) * 1973-12-25 1975-07-30
JPS5567675A (en) * 1978-11-17 1980-05-21 Hitachi Ltd Detector for presence of small sized electronic component
JPS5666765A (en) * 1979-11-02 1981-06-05 Nec Corp Inspection method of printed board

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002296327A (en) * 2001-03-30 2002-10-09 Nec Corp Inspection jig and method of inspecting circuit board, and manufacturing method
JP2012088065A (en) * 2010-10-15 2012-05-10 Hioki Ee Corp Pin board unit and substrate inspection apparatus
WO2015060188A1 (en) * 2013-10-22 2015-04-30 富士フイルム株式会社 Image pickup module manufacturing method and image pickup module manufacturing apparatus

Also Published As

Publication number Publication date
JPH052866Y2 (en) 1993-01-25

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