JPS5095778A - - Google Patents
Info
- Publication number
- JPS5095778A JPS5095778A JP151274A JP151274A JPS5095778A JP S5095778 A JPS5095778 A JP S5095778A JP 151274 A JP151274 A JP 151274A JP 151274 A JP151274 A JP 151274A JP S5095778 A JPS5095778 A JP S5095778A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP151274A JPS5095778A (en) | 1973-12-25 | 1973-12-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP151274A JPS5095778A (en) | 1973-12-25 | 1973-12-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5095778A true JPS5095778A (en) | 1975-07-30 |
Family
ID=11503522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP151274A Pending JPS5095778A (en) | 1973-12-25 | 1973-12-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5095778A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5298153U (en) * | 1976-01-21 | 1977-07-23 | ||
| JPS58137772A (en) * | 1982-02-10 | 1983-08-16 | M I Technical Service Kk | Fixture used for circuit substrate test system |
| JPS63185572U (en) * | 1987-05-22 | 1988-11-29 | ||
| JP2006220627A (en) * | 2005-02-14 | 2006-08-24 | Sony Corp | Probe pin, probe pin unit, and inspection method of inspection object using unit |
-
1973
- 1973-12-25 JP JP151274A patent/JPS5095778A/ja active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5298153U (en) * | 1976-01-21 | 1977-07-23 | ||
| JPS58137772A (en) * | 1982-02-10 | 1983-08-16 | M I Technical Service Kk | Fixture used for circuit substrate test system |
| JPH0345347B2 (en) * | 1982-02-10 | 1991-07-10 | Marubeni Haitetsuku Koohoreeshon Kk | |
| JPS63185572U (en) * | 1987-05-22 | 1988-11-29 | ||
| JPH052866Y2 (en) * | 1987-05-22 | 1993-01-25 | ||
| JP2006220627A (en) * | 2005-02-14 | 2006-08-24 | Sony Corp | Probe pin, probe pin unit, and inspection method of inspection object using unit |
| JP4556698B2 (en) * | 2005-02-14 | 2010-10-06 | ソニー株式会社 | Probe pin unit |