JPH0187269U - - Google Patents

Info

Publication number
JPH0187269U
JPH0187269U JP18313887U JP18313887U JPH0187269U JP H0187269 U JPH0187269 U JP H0187269U JP 18313887 U JP18313887 U JP 18313887U JP 18313887 U JP18313887 U JP 18313887U JP H0187269 U JPH0187269 U JP H0187269U
Authority
JP
Japan
Prior art keywords
circuit board
movable plate
base
pin
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18313887U
Other languages
Japanese (ja)
Other versions
JPH0642222Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18313887U priority Critical patent/JPH0642222Y2/en
Publication of JPH0187269U publication Critical patent/JPH0187269U/ja
Application granted granted Critical
Publication of JPH0642222Y2 publication Critical patent/JPH0642222Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示した断面図、
第2図は検査対象である回路基板の平面図、第3
図は従来例を示した断面図である。 図中、1は被検査回路基板、2はフラツト・パ
ツク形パツケージIC、2aはリード、3は基台
、4は可動板、5はテストプローブ、10はピン
ボード、11はボルト、11aはテストプローブ
、12はバカ孔、13はガイドピン、14はガイ
ド孔である。
FIG. 1 is a sectional view showing an embodiment of this invention.
Figure 2 is a plan view of the circuit board to be inspected;
The figure is a sectional view showing a conventional example. In the figure, 1 is the circuit board to be tested, 2 is a flat pack type package IC, 2a is a lead, 3 is a base, 4 is a movable plate, 5 is a test probe, 10 is a pin board, 11 is a bolt, 11a is a test The probe, 12 is a hole, 13 is a guide pin, and 14 is a guide hole.

Claims (1)

【実用新案登録請求の範囲】 (1) 被検査回路基板が載置される基台と、該基
台に対して進退する可動板とを備え、上記基台も
しくは可動板に上記被検査回路基板の所定部位に
接触するテストプローブを取付けてなる回路基板
検査装置において、 上記可動板もしくは上記基台の少なくとも一方
に対し所定のクリアランスをもつて支持されるピ
ンボードを備え、該ピンボードに上記テストプロ
ーブと、上記被検査回路基板に対する位置決め用
のガイドピンとを設けてなることを特徴とする回
路基板検査装置。 (2) 上記被検査回路基板には上記ガイドピンと
嵌合するガイド孔が穿設されている実用新案登録
請求の範囲第1項記載の回路基板検査装置。 (3) 上記可動板には円筒状保持部を有するボル
トが植設されており、上記ピンボードには上記円
筒状保持部に対して所定のクリアランスをもつて
嵌合するバカ孔が穿設されている実用新案登録請
求の範囲第1項記載の回路基板検査装置。
[Claims for Utility Model Registration] (1) A base on which the circuit board to be inspected is placed, and a movable plate that moves forward and backward with respect to the base, and the circuit board to be inspected is mounted on the base or the movable plate. A circuit board inspection device is equipped with a test probe that comes into contact with a predetermined portion of the circuit board, and a pin board is supported with a predetermined clearance relative to at least one of the movable plate or the base, and the test probe is mounted on the pin board. A circuit board testing device comprising: a probe; and a guide pin for positioning the circuit board to be tested. (2) The circuit board inspection apparatus according to claim 1, wherein the circuit board to be inspected is provided with a guide hole that fits with the guide pin. (3) A bolt having a cylindrical holding part is installed in the movable plate, and a hole is bored in the pin board to fit with the cylindrical holding part with a predetermined clearance. A circuit board inspection device according to claim 1, which has been registered as a utility model.
JP18313887U 1987-11-30 1987-11-30 Circuit board inspection device Expired - Lifetime JPH0642222Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18313887U JPH0642222Y2 (en) 1987-11-30 1987-11-30 Circuit board inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18313887U JPH0642222Y2 (en) 1987-11-30 1987-11-30 Circuit board inspection device

Publications (2)

Publication Number Publication Date
JPH0187269U true JPH0187269U (en) 1989-06-08
JPH0642222Y2 JPH0642222Y2 (en) 1994-11-02

Family

ID=31474570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18313887U Expired - Lifetime JPH0642222Y2 (en) 1987-11-30 1987-11-30 Circuit board inspection device

Country Status (1)

Country Link
JP (1) JPH0642222Y2 (en)

Also Published As

Publication number Publication date
JPH0642222Y2 (en) 1994-11-02

Similar Documents

Publication Publication Date Title
JPH0187269U (en)
JP2971491B2 (en) Inspection device
JPH0255102U (en)
JPS62108874U (en)
JPS63185572U (en)
JPS6474470A (en) Probe pin for printed wiring board inspecting machine
JPS6143239Y2 (en)
JPH0361587U (en)
JPH0514211Y2 (en)
JPH0191261U (en)
JPS6053067U (en) Circuit board inspection equipment
JPH0263479U (en)
JPH0237683A (en) Socket for measuring semiconductor device
JPS6180469U (en)
JPH0310273U (en)
JPH0191268U (en)
JPS6220385U (en)
JPS608882U (en) Fixture for insert kit tester
JPS60109004U (en) Hole pitch inspection device
JPS6482540A (en) Prober
JPH0310274U (en)
JPS6117671U (en) Printed board testing equipment
JPS63155078U (en)
JPS61163989U (en)
JPS6251279U (en)